Simulation Techniques for Improving Fabrication Yield of RF-CMOS ICs
One of the industry sectors with the largest revenue in the telecommunication field is the wireless communications field. Wireless operators compete for being the first to place their products in the market to obtain the highest revenues. Moreover, they try to offer products that fulfill the user demands in terms of price, battery life, and product quality. All these requirements must be also fulfilled by the designer of the MMIC (Microwave Monolithic Integrated Circuits) circuits that will be used in those wireless terminals, achieving a reliable design, with high performance, low cost, and if possible, in one or two foundry iterations so as to bring the product out to the market as soon as possible. Silicon based technologies are the lowest cost. The demand to use them is simply based on that fact, but their usage in these applications is limited by the ease of use for the designer, in particular, by the lack of adequate simulation models. These technologies don’t include some essential components for the design of RF circuits, which leads to measurement results quite different from those simulated. On the other hand, GaAs based technologies, more mature in the RF and microwave field, provide very accurate models, as well as additional tools to verify the design reliability (yield and sensitivity analysis), allowing good results often with only one foundry iteration. The deep study of the problems presented when designing Si-based RF circuits will convince the reader of the need to use special tools as electromagnetic simulation or coo simulation to prevent it. The chapter provides different simulation techniques that help the designer to obtain better designs with a lower cost, as foundry iterations are reduced.