Enlarge the Field of View of Nano CT in Synchrotron Radiation

2013 ◽  
Vol 380-384 ◽  
pp. 1808-1811
Author(s):  
Ren Bo Tan ◽  
Jian Fu ◽  
Li Yuan Chen
Keyword(s):  
Synchrotron Radiation ◽  
High Spatial Resolution ◽  
Processing Method ◽  
Field Of View ◽  
Filter Back Projection ◽  
Back Projection ◽  
Parallel Beam ◽  
X Ray ◽  
Radiation Imaging ◽  
Data Processing Method

nanoCT with synchrotron radiation has a high spatial resolution up to nanoscale which provides an approach to the 3D inter-structure of sample of tiny size in the research of biology, materials and so on. However, due to the high resolution it provide, the field of view is limited to only about 15~60μm. In order to improve the scale of field of view, we discussed a new scan mode called half-scan which is using the symmetry of parallel-beam x-ray and newly applied in the synchrotron radiation imaging field. In this paper, we deduced the data processing method which is consisted of data preprocessing and filter back projection (FBP) algorithm. Numerical simulation and analysis demonstrate that the field of view can be enlarged up to 100% with this method.

scholarly journals Microstructure Evolution of Ag/TiO2 Thin Film

2021 ◽  
Vol 7 (1) ◽  
pp. 14
Author(s):  
Dewi Suriyani Che Halin ◽  
Kamrosni Abdul Razak ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Mohd Izrul Izwan Ramli ◽  
Mohd Mustafa Al Bakri Abdullah ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Growth Rate ◽  
Synchrotron Radiation ◽  
Tio2 Thin Film ◽  
Sol Gel ◽  
Tio2 Thin Films ◽  
Contact Mode ◽  
X Ray ◽  
Radiation Imaging

Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO2 thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO2 thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO2 thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO2 also increased in terms of area and the number of junctions. The growth rate of Ag/TiO2 at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.

scholarly journals Shadow monochromatic backlighting: Large-field high resolution X-ray shadowgraphy with improved spectral tunability

2001 ◽  
Vol 19 (2) ◽  
pp. 285-293 ◽  
Author(s):  
T.A. PIKUZ ◽  
A. YA. FAENOV ◽  
M. FRAENKEL ◽  
A. ZIGLER ◽  
F. FLORA ◽  
...  
Keyword(s):  
High Resolution ◽  
High Spatial Resolution ◽  
Field Of View ◽  
Large Field ◽  
X Ray ◽  
Traditional Scheme ◽  
Wide Range ◽  
Wide Wavelength Range ◽  
Bent Crystals ◽  
First Time

The shadow monochromatic backlighting (SMB) scheme, a modification of the well-known soft X-ray monochromatic backlighting scheme, is proposed. It is based on a spherical crystal as the dispersive element and extends the traditional scheme by allowing one to work with a wide range of Bragg angles and thus in a wide spectral range. The advantages of the new scheme are demonstrated experimentally and supported numerically by ray-tracing simulations. In the experiments, the X-ray backlighter source is a laser-produced plasma, created by the interaction of an ultrashort pulse, Ti:Sapphire laser (120 fs, 3–5 mJ, 1016 W/cm2 on target) or a short wavelength XeCl laser (10 ns, 1–2 J, 1013 W/cm2 on target) with various solid targets (Dy, Ni + Cr, BaF2). In both experiments, the X-ray sources are well localized spatially (∼20 μm) and are spectrally tunable in a relatively wide wavelength range (λ = 8–15 Å). High quality monochromatic (δλ/λ ∼ 10−5–10−3) images with high spatial resolution (up to ∼4 μm) over a large field of view (a few square millimeters) were obtained. Utilization of spherically bent crystals to obtain high-resolution, large field, monochromatic images in a wide range of Bragg angles (35° < Θ < 90°) is demonstrated for the first time.

Experimental verification of the need for either jj or intermediate coupling in the 5f states of plutonium

2003 ◽  
Vol 802 ◽  
Author(s):  
K. T. Moore ◽  
M. A. Wall ◽  
A. J. Schwartz ◽  
B. W. Chung ◽  
J. G. Tobin ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Electron Microscope ◽  
Synchrotron Radiation ◽  
Single Phase ◽  
High Spatial Resolution ◽  
Intermediate Coupling ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Energy Loss ◽  
X Ray Absorption

ABSTRACTHere, we demonstrate the power of electron energy-loss spectroscopy (EELS) in a transmission electron microscope (TEM) to investigate the electronic structure plutonium. Using EELS, TEM, and synchrotron-radiation-based X-ray absorption spectroscopy (XAS), we provide the first experimental evidence that Russell-Saunders (LS) coupling fails for the 5f states of Pu. These results support the assumption that only the use of jj or intermediate coupling is appropriate for the 5f states of Pu. EELS experiments were performed in a TEM and are coupled with image and diffraction data, therefore, the measurements are completely phase specific. It is shown that EELS in a TEM may be used to circumvent the difficulty of producing single-phase or single-crystal samples due to its high spatial resolution.

Instrumentation for Synchrotron X-Ray Powder Diffractometry

1985 ◽  
Vol 29 ◽  
pp. 243-250 ◽  
Author(s):  
W. Parrish ◽  
M. Hart ◽  
C. G. Erickson ◽  
N. Masciocchi ◽  
T. C. Huang
Keyword(s):  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
Storage Ring ◽  
Scintillation Counter ◽  
Diffraction Method ◽  
Energy Dispersive ◽  
Parallel Beam ◽  
X Ray ◽  
Radiation Laboratory ◽  
Energy Dispersive Diffraction

AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.

Focusing Optics for High-Energy X-ray Diffraction

1998 ◽  
Vol 5 (3) ◽  
pp. 226-231 ◽  
Author(s):  
U. Lienert ◽  
C. Schulze ◽  
V. Honkimäki ◽  
Th. Tschentscher ◽  
S. Garbe ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Spatial Resolution ◽  
Dispersion Compensation ◽  
High Energy ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Momentum Resolution ◽  
Potential Applications ◽  
Band Pass

Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40–100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 µm-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techniques based on conventional X-ray sources, neutron scattering or electron microscopy.

An Innovative Data Processing Method for Studying Nanoparticle Formation in Droplet Microfluidics using X-rays Scattering

Lab on a Chip ◽  
2021 ◽  
Author(s):  
Dimitri Radajewski ◽  
Liam Hunter ◽  
Xuefeng He ◽  
Ouassef Nahi ◽  
Johanna M Galloway ◽  
...  
Keyword(s):  
Data Processing ◽  
Microfluidic Devices ◽  
Processing Method ◽  
Droplet Microfluidics ◽  
X Rays ◽  
Segmented Flow ◽  
X Ray ◽  
X Ray Scattering ◽  
Data Processing Method ◽  
Powerful Means

X-ray scattering techniques provide a powerful means of characterizing the formation of nanoparticles in solution. Coupling these techniques to segmented-flow microfluidic devices that offer well-defined environments gives access to in...

Attenuation- and Phase-Contrast Microtomography Using Synchrotron Radiation for the 3-D Investigation of Specimens Consisting of Elements With Low and Medium Absorption

1999 ◽  
Vol 590 ◽  
Author(s):  
F. Beckmann ◽  
U. Bonse
Keyword(s):  
Synchrotron Radiation ◽  
Spatial Resolution ◽  
Phase Contrast ◽  
High Spatial Resolution ◽  
X Ray ◽  
Contrast Mechanism

ABSTRACTAttenuation- and phase-contrast microtomography using synchrotron radiation is applied to different samples demonstrating the advantages and limits of the two different contrast mechanism. Photon energies in the range of 8-25 keV and 60-100 keV are used. Scanning techniques employing a 2-dim. x-ray detector allow for investigation of larger specimens at high spatial resolution.

X-Ray Detection Using A Ccd Device And Its Application To Synchrotron Radiation Imaging And Stress Measurement

1987 ◽  
Author(s):  
K. Simomaa ◽  
V. Kelha ◽  
T. Tuomi ◽  
M. A. Korhonen ◽  
L. Suominen
Keyword(s):  
Synchrotron Radiation ◽  
Stress Measurement ◽  
X Ray ◽  
Radiation Imaging

Effect of Coating with Hydroxyapatite on the Bonding of Bone to Implant

2012 ◽  
Vol 706-709 ◽  
pp. 1661-1666
Author(s):  
Abdelilah Benmarouane ◽  
Pierre Millet ◽  
Thomas Buslaps ◽  
Alain Lodini ◽  
Veijo Honkimäki
Keyword(s):  
Synchrotron Radiation ◽  
Spatial Resolution ◽  
Orthopaedic Surgery ◽  
High Spatial Resolution ◽  
High Energy ◽  
Direct Connection ◽  
X Ray Diffraction ◽  
X Ray ◽  
Natural Bone ◽  
Non Destructive

The aim of the present study was to study the interface implant-bone by synchrotron radiation, the implant has two faces the first one coated with hydroxyapatite and the second uncoated. In orthopaedic surgery, Titanium (Ti-Al-4V) implants are currently coated with hydroxyapatite (HAp), Ca10(PO4)6(OH)2, in order to obtain a stable and functional direct connection between the bone and the implant. At the implant-bone interface, the new bone reconstituted after two months of implantation must have the same properties like the natural bone in order to accept the implant. Therefore we studied the texture of the reconstituted bone crystals at the interface applying non destructive x-ray diffraction. The required high spatial resolution was achieved utilizing high-energy synchrotron radiation on ID15 at ESRF in Grenoble, France.

EXELFS revisited: An improved data analysis technique

1993 ◽  
Vol 51 ◽  
pp. 584-585
Author(s):  
Maoxu Qian ◽  
Mehmet Sarikaya ◽  
Edward A. Stern
Keyword(s):  
Fine Structure ◽  
Data Analysis ◽  
Synchrotron Radiation ◽  
High Spatial Resolution ◽  
Detection System ◽  
X Ray ◽  
Statistical Fluctuations ◽  
Analysis Technique ◽  
Radiation Sources ◽  
Acquisition Technique

EXELFS (extended energy loss fine structure) spectroscopy contains unique information of local atomic structure, same as XAFS (X-ray fine structure), but has several advantages overXAFS, such as having high spatial resolution (nanoscale versus bulk), better low Z element sensitivity, parallel detectability, and no dependability on synchrotron-radiation-sources. Due to poor statistical total counts, however, EELS data quality is inferior and, therefore, EXELFS technique has not been well developed to its full advantages. The main limitations in EELS acquisition are channel-to-channel gain variations (CCGV) in the parallel detection system and low S/N ratio due to the instability of instrument that prevents long acquisition times. Techniques that circumvent CCGV, such as first or second difference, do not allow the retrieval of EXELFS signal from the spectra. Recently we have improved the EELS data acquisition technique so that CCGV could effectively be corrected and statistical fluctuations could reach a level much lower man that in the fine structure.

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