The Dielectric Property of Y2NiMnO6 Ceramics Sintered at High Temperature
2015 ◽
Vol 804
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pp. 108-112
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Keyword(s):
X Ray
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The high dielectric permittivity of Y2NiMnO6 ceramics were measured by Agilent E4294A (Impedance Measurement) range of frequency 100 to 10 MHz in this research. In this sample ceramics, passing by a sintering temperature of 1400°C at 6 hours to 24 hours. The phase and microstructure of the deposited materials were investigated as a function of sintering temperature, using X-ray diffraction (XRD) and scanning electron microscopy (SEM). We found that the dielectric properties are very sensitive to the several sintered follow by time, and high temperature can be related to the change ordering of Ni2+ and Mn4+ ions.