Analysis of the Recrystallization of Cold-Rolled Copper after Isothermal Annealing Using Electron Backscattered Diffraction Patterns

2010 ◽  
Vol 297-301 ◽  
pp. 359-364 ◽  
Author(s):  
M. Matsushita ◽  
H. Ohfuji
Keyword(s):  
Pattern Analysis ◽  
Isothermal Annealing ◽  
Fiber Texture ◽  
Recrystallization Process ◽  
Random Orientation ◽  
Electron Backscattered Diffraction ◽  
Round Shape ◽  
Resolution Electron ◽  
Cold Rolled ◽  
Diffraction Patterns

Recrystallization processing of cold-rolled copper after isothermal annealing was investigated using high-resolution electron backscattered diffraction pattern analysis. The fiber texture is obtained by cold rolling with the rolled direction oriented along {111}, and the transverse and nominal directions have a random orientation. An isothermal recrystallization process at 150°C was investigated. Initially, rotations of the orientations occur from {111} to {100} and then small misfit angle boundaries decreased. Accompanying this change, the fiber-shaped grains change to a round shape grain and their sizes decrease. Considering these tendencies, we determined that rotation at subgrain boundaries is activated by isothermal annealing and subboundaries grow the boundary misfit angle >15 º. With further annealing, those grains surrounded by grain boundaries greater than 15º expanded. The rolling, transverse, and nominal orientations rotate {100}. Subsequently, a twin boundary appeared, and the fraction of twin boundaries increased.

Microstructure and Texture Evolution of a Cold Rolled Ni-Cr-W Alloy after Annealing

2011 ◽  
Vol 702-703 ◽  
pp. 352-355
Author(s):  
Wei Wang ◽  
I. Drouelle ◽  
F. Brisset ◽  
M.H. Mathon ◽  
T. Auger ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Cold Rolling ◽  
Texture Evolution ◽  
Orientation Distribution ◽  
Hydrogen Atmosphere ◽  
Fiber Texture ◽  
Distribution Functions ◽  
Stored Energy ◽  
Electron Backscattered Diffraction ◽  
Cold Rolled

A Ni-5.7%Cr-25.2%W (wt%) alloy was deformed by cold rolling in different reduction conditions (50%, 70%, and 90%) and then annealed under hydrogen atmosphere. Microstructure and texture evolutions were analyzed using Electron BackScattered Diffraction (EBSD). Orientation Distribution Functions (ODFs) and stored energy were calculated from neutron diffraction measurements. A strengthening of the α-fiber texture was observed after 90% cold rolling and a homogenous microstructure was obtained after annealing at 900°C.

scholarly journals Texture Evolution during Recrystallization and Grain Growth in Non-Oriented Electrical Steel Produced by Compact Strip Production Process

Materials ◽  
2021 ◽  
Vol 15 (1) ◽  
pp. 197
Author(s):  
Jun-Qiang Cong ◽  
Fei-Hu Guo ◽  
Jia-Long Qiao ◽  
Sheng-Tao Qiu ◽  
Hai-Jun Wang
Keyword(s):  
Grain Growth ◽  
Electrical Steel ◽  
Texture Evolution ◽  
Fiber Texture ◽  
Rolled Sheet ◽  
Recrystallization Process ◽  
Columnar Crystal ◽  
Compact Strip Production ◽  
Cold Rolled ◽  
Strip Production

Evolution of texture and α*-fiber texture formation mechanism of Fe-0.65%Si non-oriented electrical steel produced by Compact Strip Production (CSP) process during all the thermo-mechanical processing steps were investigated using electron backscatter diffraction (EBSD) and X-ray diffraction (XRD) techniques. Columnar crystal structure of cast slab is fine and well-developed. Textures of the hot-rolled band are quite different in the thickness direction. During annealing of cold-rolled sheet, γ-fiber texture grains would nucleate and grow preferentially, and α*-fiber texture grains mainly nucleate and grow in the shear zone of α-fiber texture of cold-rolled sheet. During the recrystallization process, γ-fiber texture gradually concentrated to {111}<112>, and γ and α*-fiber texture increased significantly. {111}<112> texture priority nucleation at the initial stage of recrystallization. Due to the advantages of nucleation position and quantity, the content of α*-fiber texture is greater than {111}<112> texture in the mid-recrystallization. During grain growth process, {111}<112> oriented grains would grow selectively by virtue of higher mobility, sizes and quantity advantages than that of {411}<148 > and {100}<120>, resulting in the gradual increase of γ-fiber texture and the decline of α *-fiber texture.

Light Optical Diffraction Studies of Macromolecular Ultrastructure

1970 ◽  
Vol 28 ◽  
pp. 258-259
Author(s):  
Glen B. Haydon
Keyword(s):  
High Resolution ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Electron Micrographs ◽  
Optical Diffraction ◽  
Electron Micrograph ◽  
Its Analysis ◽  
Resolution Electron ◽  
Diffraction Patterns

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

Electron microscopy and diffraction studies of polyimides

1983 ◽  
Vol 41 ◽  
pp. 28-29
Author(s):  
O.C. de Hodgins ◽  
K. R. Lawless ◽  
R. Anderson
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Structural Features ◽  
Inert Atmosphere ◽  
Polyimide Films ◽  
Resolution Electron ◽  
The Matrix ◽  
High Resolution Electron Microscope ◽  
Diffraction Patterns ◽  
Polymeric Samples

Commercial polyimide films have shown to be homogeneous on a scale of 5 to 200 nm. The observation of Skybond (SKB) 705 and PI5878 was carried out by using a Philips 400, 120 KeV STEM. The objective was to elucidate the structural features of the polymeric samples. The specimens were spun and cured at stepped temperatures in an inert atmosphere and cooled slowly for eight hours. TEM micrographs showed heterogeneities (or nodular structures) generally on a scale of 100 nm for PI5878 and approximately 40 nm for SKB 705, present in large volume fractions of both specimens. See Figures 1 and 2. It is possible that the nodulus observed may be associated with surface effects and the structure of the polymers be regarded as random amorphous arrays. Diffraction patterns of the matrix and the nodular areas showed different amorphous ring patterns in both materials. The specimens were viewed in both bright and dark fields using a high resolution electron microscope which provided magnifications of 100,000X or more on the photographic plates if desired.

An Interactive Minicomputer Program for the Indexing and Simulation of Electron Diffraction Patterns

1976 ◽  
Vol 34 ◽  
pp. 542-543
Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao
Keyword(s):  
Electron Diffraction ◽  
Real Time ◽  
Pattern Analysis ◽  
Flow Diagram ◽  
Hard Copy ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Transmission Electron ◽  
One Step ◽  
Diffraction Patterns

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.

Anisotropic radiation damage of potassium tetracyano platinate (KCP)

1978 ◽  
Vol 36 (1) ◽  
pp. 392-393
Author(s):  
N. Uyeda ◽  
E. J. Kirkland ◽  
B. M. Siegel
Keyword(s):  
Electron Diffraction ◽  
Radiation Damage ◽  
Structural Changes ◽  
High Resolution Electron Microscopy ◽  
Radiation Sensitivity ◽  
Resolution Electron ◽  
Damage Process ◽  
Diffraction Patterns ◽  
Fading Rate

The direct observation of structural change by high resolution electron microscopy will be essential for the better understanding of the damage process and its mechanism. However, this approach still involves some difficulty in quantitative interpretation mostly being due to the quality of obtained images. Electron diffraction, using crystalline specimens, has been the method most frequently applied to obtain a comparison of radiation sensitivity of various materials on the quantitative base. If a series of single crystal patterns are obtained the fading rate of reflections during the damage process give good comparative measures. The electron diffraction patterns also render useful information concerning the structural changes in the crystal. In the present work, the radiation damage of potassium tetracyano-platinate was dealt with on the basis two dimensional observation of fading rates of diffraction spots. KCP is known as an ionic crystal which possesses “one dimensional” electronic properties and it would be of great interest to know if radiation damage proceeds in a strongly asymmetric manner.

Quantitative Electron Microscope with imaging plate

1994 ◽  
Vol 52 ◽  
pp. 408-409
Author(s):  
D. Shindo
Keyword(s):  
Electron Microscope ◽  
Dynamic Range ◽  
Processing System ◽  
Digital Data ◽  
Imaging Plate ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
Resolution Electron ◽  
Electron Intensity ◽  
Diffraction Patterns

Imaging plate has good properties, i.e., a wide dynamic range and good linearity for the electron intensity. Thus the digital data (2048x1536 pixels, 4096 gray levels in log scale) obtained with the imaging plate can be used for quantification in electron microscopy. By using the image processing system (PIXsysTEM) combined with a main frame (ACOS3900), quantitative analysis of electron diffraction patterns and high-resolution electron microscope (HREM) images has been successfully carried out.In the analysis of HREM images observed with the imaging plate, quantitative comparison between observed intensity and calculated intensity can be carried out by taking into account the experimental parameters such as crystal thickness and defocus value. An example of HREM images of quenched Tl2Ba2Cu1Oy (Tc = 70K) observed with the imaging plate is shown in Figs. 1(b) - (d) comparing with a structure model proposed by x-ray diffraction study of Fig. 1 (a). The image was observed with a JEM-4000EX electron microscope (Cs =1.0 mm).

An EBSD Study on Orientation Effects during Recrystallization of Coarse-Grained Niobium

2004 ◽  
Vol 467-470 ◽  
pp. 519-524 ◽  
Author(s):  
Hugo Ricardo Zschommler Sandim ◽  
Dierk Raabe
Keyword(s):  
Longitudinal Section ◽  
Primary Recrystallization ◽  
Coarse Grained ◽  
Subgrain Structure ◽  
Electron Backscattered Diffraction ◽  
Subgrain Growth ◽  
Metallographic Inspection ◽  
Cold Rolled ◽  
Cold Worked ◽  
Viable Mechanism

The recrystallization behavior of coarse-grained niobium depends on the nature of its deformation microstructure. In this regard, a longitudinal section of a high-purity coarse-grained niobium ingot was cold rolled to a thickness reduction of 96% followed by annealing in vacuum at 800°C for 1 h. Metallographic inspection in cold-rolled and annealed specimens was carried out in a field emission gun scanning electron microscope (FEG-SEM). Microtexture was determined by electron-backscattered diffraction (EBSD) coupled to the FEG-SEM. The use this technique has evidenced details of the boundary character and subgrain structure found in partially recrystallized regions. The early stages of primary recrystallization are associated to the presence of high-angle lamellar boundaries found in the cold-worked state. Abnormal subgrain growth has been evidenced as a viable mechanism for nucleation of recrystallization.

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