Crystal Growth of CdTe by Gradient Freeze in Universal Multizone Crystallizator (UMC)

2006 ◽  
Vol 508 ◽  
pp. 117-124 ◽  
Author(s):  
Ching Hua Su ◽  
Sandor L. Lehoczky ◽  
Chao Li ◽  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Thermal History ◽  
Grown Crystal ◽  
X Ray ◽  
Hall Measurements ◽  
Force Microscopy ◽  
Atomic Force

In this study, crystals of CdTe were grown from melts, which have undergone different thermal history, by the unseeded gradient freeze method using the Universal Multizone Crystallizator (UMC). The effects of melt conditions on the quality of grown crystal were studied by various characterization techniques, including Synchrotron White Beam X-ray Topography (SWBXT), atomic force microscopy (AFM), electrical conductivity and Hall measurements.

Annealing effects on the electrical conductivity of polymerized liquid crystalline 3,4-ethylenedioxythiophene derivatives

e-Polymers ◽  
2006 ◽  
Vol 6 (1) ◽  
Author(s):  
Noelle Wrubbel ◽  
Helmut Ritter ◽  
Knud Reuter ◽  
Alexander Karbach ◽  
Doris Drechsler
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Liquid Crystal ◽  
Liquid Crystalline ◽  
Electrically Conductive ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Annealing Effects

Abstract3,4-Ethylenedioxythiophene derivatives with aromatic, in most cases mesogenic, side groups were synthesized and their liquid crystal behaviour was characterized. These monomers were polymerized oxidatively to charged, electrically conductive polythiophenes. X-ray and atomic force microscopy studies were performed. Films of theses polythiophenes achieved via in situ polymerization were prone to a significant increase of the conductivity by annealing.

scholarly journals Modification of FA0.85MA0.15Pb(I0.85Br0.15)3 Films by NH2-POSS

Crystals ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 1544
Author(s):  
Yangyang Zhang ◽  
Na Liu ◽  
Haipeng Xie ◽  
Jia Liu ◽  
Pan Yuan ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
Spin Coating ◽  
Surface Composition ◽  
Morphological Changes ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coating Method

The surface composition and morphology of FA0.85MA0.15Pb(I0.85Br0.15)3 films fabricated by the spin-coating method with different concentrations of NH2-POSS were investigated with atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and Fourier transform infrared spectroscopy (FTIR). It was found that the surface composition of the FA0.85MA0.15Pb(I0.85Br0.15)3 films was changed regularly through the interaction between NH2-POSS and the perovskite film. The corresponding surface morphological changes were also observed. When the concentration of NH2-POSS exceeded 10 mg/mL, a lot of cracks on the surface of the perovskite film were observed and the surface morphology was damaged. The surface composition and its distribution can be adjusted by changing the concentration of NH2-POSS and the proper concentration of NH2-POSS can substantially improve the quality of perovskite film.

Novel Protein Crystal Growth Electrochemical Cell For Applications In X-ray Diffraction and Atomic Force Microscopy

2011 ◽  
Vol 11 (9) ◽  
pp. 3917-3922 ◽  
Author(s):  
Gabriela Gil-Alvaradejo ◽  
Rayana R. Ruiz-Arellano ◽  
Christopher Owen ◽  
Adela Rodríguez-Romero ◽  
Enrique Rudiño-Piñera ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Electrochemical Cell ◽  
Protein Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Protein Crystal Growth ◽  
Novel Protein

scholarly journals Crystal growth of the core and rotated epitaxial shell of a heterometallic metal-organic framework revealed with atomic force microscopy

2021 ◽  
Author(s):  
Fajar Inggit Pambudi ◽  
Michael William Anderson ◽  
Martin Attfield
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Metal Organic Framework ◽  
Metal Organic Frameworks ◽  
Force Microscopy ◽  
The Core ◽  
Atomic Force ◽  
Metal Organic ◽  
Surface Crystal ◽  
Organic Framework

Atomic force microscopy has been used to determine the surface crystal growth of two isostructural metal-organic frameworks, [Zn2(ndc)2(dabco)] (ndc = 1,4-naphthalene dicarboxylate, dabco = 4-diazabicyclo[2.2.2]octane) (1) and [Cu2(ndc)2(dabco)] (2) from...

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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