White Beam Microdiffraction Experiments for the Determination of the Local Plastic Behaviour of Polycrystals

2006 ◽  
Vol 524-525 ◽  
pp. 103-108 ◽  
Author(s):  
Olivier Castelnau ◽  
Philippe Goudeau ◽  
G. Geandier ◽  
Nobumichi Tamura ◽  
Jean Luc Béchade ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Elastic Strain ◽  
Mean Field ◽  
Polycrystalline Materials ◽  
Plastic Behavior ◽  
Full Field ◽  
White Beam ◽  
First Results ◽  
Individual Grains

The overall plastic behavior of polycrystalline materials strongly depends on the microstructure and on the local rheology of individual grains. The characterization of the strain and stress heterogeneities within the specimen, which result from the intergranular mechanical interactions, is of particular interest since they largely control the microstructure evolutions such as texture development, work-hardening, damage, recrystallization, etc. The influence of microstructure on the effective behavior can be addressed by physical-based predictive models (homogenization schemes) based either on full-field or on mean-field approaches. But these models require the knowledge of the grain behavior, which in turn must be determined on the real specimen under investigation. The microextensometry technique allows the determination of the surface total (i.e. plastic + elastic) strain field with a micrometric spatial resolution. On the other hand, the white beam X-ray microdiffraction technique developed recently at the Advanced Light Source enables the determination of the elastic strain with the same spatial resolution. For polycrystalline materials with grain size of about 10 micrometers, a complete intragranular mechanical characterization can thus be performed by coupling these two techniques. The very first results obtained on plastically deformed copper and zirconium specimens are presented.

Submicrometre-resolution polychromatic three-dimensional X-ray microscopy

2012 ◽  
Vol 46 (1) ◽  
pp. 153-164 ◽  
Author(s):  
B. C. Larson ◽  
L. E. Levine
Keyword(s):  
Spatial Resolution ◽  
Elastic Strain ◽  
Strain Tensor ◽  
Three Dimensional ◽  
Direct Determination ◽  
Phase Identification ◽  
Sn Whisker ◽  
X Ray ◽  
Elastic Strain Tensor

The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three-dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal–insulator transition in nanoplatelet VO2, interface strengths in metal–matrix composites, high-pressure science, Sn whisker growth, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.

First Results of the DITO-Experiment at the HARWI II Beamline at GKSS/DESY

2008 ◽  
Vol 571-572 ◽  
pp. 201-206 ◽  
Author(s):  
Bernd Hasse ◽  
Helene Rahn ◽  
Stefan Odenbach ◽  
Felix Beckmann ◽  
Walter Reimers
Keyword(s):  
Phase Composition ◽  
Spatial Resolution ◽  
High Speed ◽  
High Energy ◽  
First Results ◽  
Sensitive Determination ◽  
Phase Sensitive ◽  
Position Sensitive ◽  
Speed Mode

At the HARWI II beamline at the GKSS outstation at DESY a new experiment for position sensitive diffractometry and tomography called DITO was built and commissioned this year. Due to the available high energy synchrotron radiation with photon energies up to 100 keV it is possible to investigate the bulk of metallic samples of a few mm thickness with both methods. The diffractometry detector allows the investigation of the phase composition as well as phase sensitive determination of residual stresses with a spatial resolution of 6 μm while the tomography detector can either measure a whole tomogram in high resolution mode with a spatial resolution of 2 μm within 3 to 4 hours or in high speed mode recording a whole tomogram within 15 seconds with a spatial resolution of 40 μm.

scholarly journals First results with the ANET Compact Thermal Neutron Collimator

2021 ◽  
Vol 16 (11) ◽  
pp. P11025
Author(s):  
O. Sans-Planell ◽  
M. Costa ◽  
E. Durisi ◽  
E. Mafucci ◽  
L. Menzio ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Potential Application ◽  
Neutron Imaging ◽  
Field Of View ◽  
Medium Size ◽  
Neutron Sources ◽  
First Results ◽  
Limited Length ◽  
Measuring Campaign

Abstract This paper presents the first determination of the spatial resolution of the ANET Compact Neutron Collimator, obtained with a measuring campaign at the LENA Mark-II TRIGA reactor in Pavia. This novel collimator consists of a sequence of collimating and absorbing channels organised in a chessboard-like geometry. It has a scalable structure both in length and in the field of view. It is characterized by an elevated collimation power within a limited length. Its scalability and compactness are added values with respect to traditional collimating system. The prototype tested in this article is composed of 4 concatenated stages, each 100 mm long, with a channel width of 2.5 mm, delivering a nominal L/D factor of 160. This measuring campaign illustrates the use of the ANET collimator and its potential application in neutron imaging for facilities with small or medium size neutron sources.

Box-Scan: A Novel 3DXRD Method for Studies of Recrystallization and Grain Growth

2012 ◽  
Vol 715-716 ◽  
pp. 518-520 ◽  
Author(s):  
Allan Lyckegaard ◽  
Henning Friis Poulsen ◽  
Wolfgang Ludwig ◽  
Richard W. Fonda ◽  
Erik M. Lauridsen
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Polycrystalline Materials ◽  
High Temporal Resolution ◽  
Far Field ◽  
X Ray Diffraction ◽  
The Individual ◽  
Individual Grains ◽  
Non Destructive

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)

Determination of the Recent Tectonic Movements Using GPS and Insar Methods; The First Results From the Eastern Part of the Gediz Graben

2015 ◽  
Author(s):  
Fatih POYRAZ ◽  
Orhan TATAR ◽  
Kemal Özgür HASTAOĞLU ◽  
İbrahim TİRYAKİOĞLU ◽  
Önder GÜRSOY ◽  
...  
Keyword(s):  
First Results ◽  
Tectonic Movements

scholarly journals Graph neural networks for an accurate and interpretable prediction of the properties of polycrystalline materials

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Minyi Dai ◽  
Mehmet F. Demirel ◽  
Yingyu Liang ◽  
Jia-Mian Hu
Keyword(s):  
Neural Network ◽  
Network Architecture ◽  
Polycrystalline Materials ◽  
Feed Forward Neural Network ◽  
Microscopic Interactions ◽  
Physical Interactions ◽  
Graph Neural Networks ◽  
Individual Grains ◽  
Physical Features ◽  
Machine Learning Models

AbstractVarious machine learning models have been used to predict the properties of polycrystalline materials, but none of them directly consider the physical interactions among neighboring grains despite such microscopic interactions critically determining macroscopic material properties. Here, we develop a graph neural network (GNN) model for obtaining an embedding of polycrystalline microstructure which incorporates not only the physical features of individual grains but also their interactions. The embedding is then linked to the target property using a feed-forward neural network. Using the magnetostriction of polycrystalline Tb0.3Dy0.7Fe2 alloys as an example, we show that a single GNN model with fixed network architecture and hyperparameters allows for a low prediction error of ~10% over a group of remarkably different microstructures as well as quantifying the importance of each feature in each grain of a microstructure to its magnetostriction. Such a microstructure-graph-based GNN model, therefore, enables an accurate and interpretable prediction of the properties of polycrystalline materials.

scholarly journals Observing UT1-UTC with VGOS

2021 ◽  
Vol 73 (1) ◽  
Author(s):  
Rüdiger Haas ◽  
Eskil Varenius ◽  
Saho Matsumoto ◽  
Matthias Schartner
Keyword(s):  
Standard Deviation ◽  
Reference Frame ◽  
Earth Rotation ◽  
Space Observatory ◽  
International Earth Rotation ◽  
Onsala Space Observatory ◽  
X Band ◽  
First Results

AbstractWe present first results for the determination of UT1-UTC using the VLBI Global Observing System (VGOS). During December 2019 through February 2020, a series of 1 h long observing sessions were performed using the VGOS stations at Ishioka in Japan and the Onsala twin telescopes in Sweden. These VGOS-B sessions were observed simultaneously to standard legacy S/X-band Intensive sessions. The VGOS-B data were correlated, post-correlation processed, and analysed at the Onsala Space Observatory. The derived UT1-UTC results were compared to corresponding results from standard legacy S/X-band Intensive sessions (INT1/INT2), as well as to the final values of the International Earth Rotation and Reference Frame Service (IERS), provided in IERS Bulletin B. The VGOS-B series achieves 3–4 times lower formal uncertainties for the UT1-UTC results than standard legacy S/X-band INT series. The RMS agreement w.r.t. to IERS Bulletin B is slightly better for the VGOS-B results than for the simultaneously observed legacy S/X-band INT1 results, and the VGOS-B results have a small bias only with the smallest remaining standard deviation.

Characterization and Control of Copper CMP with Optoacoustic Metrology

2001 ◽  
Vol 671 ◽  
Author(s):  
Michael Gostein ◽  
Paul Lefevre ◽  
Alex A. Maznev ◽  
Michael Joffe
Keyword(s):  
Film Thickness ◽  
Spatial Resolution ◽  
Chemical Mechanical Polishing ◽  
High Spatial Resolution ◽  
Mechanical Polishing ◽  
Length Measurement ◽  
And Control ◽  
Non Destructive

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.

scholarly journals Raman and Infrared Thermometry for Microsystems

2013 ◽  
Vol 5 (3) ◽  
Author(s):  
Leslie M. Phinney ◽  
Wei-Yang Lu ◽  
Justin R. Serrano
Keyword(s):  
Data Collection ◽  
Spatial Resolution ◽  
Infrared Imaging ◽  
Silicon On Insulator ◽  
Pixel Size ◽  
Full Field ◽  
Infrared Thermometry ◽  
Full Field Measurement ◽  
Typical Data ◽  
Field Temperature

This paper reports and compares Raman and infrared thermometry measurements along the legs and on the shuttle of a SOI (silicon on insulator) bent-beam thermal microactuator. Raman thermometry offers micron spatial resolution and measurement uncertainties of ±10 K. Typical data collection times are a minute per location leading to measurement times on the order of hours for a complete temperature profile. Infrared thermometry obtains a full-field measurement so the data collection time is on the order of a minute. The spatial resolution is determined by the pixel size, 25 μm by 25 μm for the system used, and infrared thermometry also has uncertainties of ±10 K after calibration with a nonpackaged sample. The Raman and infrared measured temperatures agreed both qualitatively and quantitatively. For example, when the thermal microactuator was operated at 7 V, the peak temperature on an interior leg is 437 K ± 10 K and 433 K ± 10 K from Raman and infrared thermometry, respectively. The two techniques are complementary for microsystems characterization when infrared imaging obtains a full-field temperature measurement and Raman thermometry interrogates regions for which higher spatial resolution is required.

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