Self-Affine Quasi-Static Fracture of Soda-Lime Glass

2007 ◽  
Vol 560 ◽  
pp. 41-46 ◽  
Author(s):  
Claus Guerra-Amaro ◽  
M. Hinojosa ◽  
E. Reyes-Melo ◽  
V. González
Keyword(s):  
Soda Lime ◽  
The Self ◽  
Soda Lime Glass ◽  
Force Microscopy ◽  
Fracture Surfaces ◽  
Atomic Force ◽  
A Value ◽  
Roughness Exponent ◽  
Static Fracture ◽  
Static Conditions

In the present work we discuss the self-affine properties of the fracture surfaces of sodalime glass obtained under quasi-static conditions. The fracture surfaces are generated using a threepoint bending system in normal room conditions and under high humidity conditions. The surfaces were recorded both by Scanning Electron Microscopy and Atomic Force Microscopy, and their selfaffine properties are characterized using the Variable Bandwidth method. For both conditions it is observed that the major part of the fracture surface is occupied by the mirror zone. On the other hand, the self-affine analysis reveals that for both conditions the roughness exponent has values centred at around 0.58 with moderate dispersion, in agreement with previous results. Our findings support the hypothesis of the existence of a characteristic roughness exponent for quasi-static fracture with a value that is significantly lower than the value of 0.8 reported for rapid fracture conditions.

Self-affine Fracture Surface Parameters and Their Relationship with Microstructure in a Cast Aluminum Alloy

2002 ◽  
Vol 17 (6) ◽  
pp. 1276-1282 ◽  
Author(s):  
M. Hinojosa ◽  
J. Aldaco
Keyword(s):  
Aluminum Alloy ◽  
Fracture Surface ◽  
The Self ◽  
Cast Aluminum Alloy ◽  
Cast Aluminum ◽  
Force Microscopy ◽  
Fracture Surfaces ◽  
Atomic Force ◽  
Roughness Exponent

The possible role of microstructural features in determining the self-affinity of the fracture surface of a cast aluminum alloy is explored in this work. Fracture surfaces generated both in tension and impact tests were topometrically analyzed by atomic force microscopy, scanning electron microscopy, and stylus profilometry. The roughness exponent exhibited the “universal” value ζ ≈ 0.78, and the correlation length ζ was of the order of the grain size. The brittle intermetallic compounds known to be important in crack initiation did not show any correlation with the self-affine parameters of the resulting fracture surfaces in this particular case.

Microstructure and Self-Affine Fracture Surface Parameters in Steel

2006 ◽  
Vol 509 ◽  
pp. 43-48 ◽  
Author(s):  
J. Niño ◽  
M. Hinojosa ◽  
V. González
Keyword(s):  
Fracture Surface ◽  
Impact Test ◽  
Surface Parameters ◽  
Force Microscopy ◽  
Fracture Surfaces ◽  
Grain Sizes ◽  
Atomic Force ◽  
A Value ◽  
Roughness Exponent ◽  
Microstructural Condition

The fracture surfaces of SAE-1018 steel tension and impact test specimens with different grain sizes are analyzed in order to explore the possible relations between the microstructure and the self-affine fracture surface parameters such as the roughness exponent, ζ, and the correlation length, ξ. The topography of the fracture surfaces was observed and quantified by means of scanning electron microscopy, atomic force microscopy, optical microscopy and optical digitizer. It is confirmed that the fracture surfaces exhibit a self-affine behavior extending over six decades of length scale, from nanometers up to a few millimeters. The roughness exponent exhibits a value of ζ∼0.82 for all the cases regardless of the microstructural condition.

Preparation of Cu(In,Ga)Se2 thin films at low substrate temperatures

2001 ◽  
Vol 16 (2) ◽  
pp. 394-399 ◽  
Author(s):  
S. Nishiwaki ◽  
T. Satoh ◽  
Y. Hashimoto ◽  
T. Negami ◽  
T. Wada
Keyword(s):  
Thin Films ◽  
Surface Composition ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
X Ray Diffraction ◽  
Monitoring Method ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Substrate Temperatures

Cu(In,Ga)Se2(CIGS) thin films were prepared at substrate temperatures of 350 to 500 °C. The (In,Ga)2Se2 precursor layers were deposited on Mo coated soda-lime glass and then exposed to Cu and Se fluxes to form CIGS films. The surface composition was probed by a real-time composition monitoring method. The CIGS films were characterized by x-ray diffraction, energy dispersive x-ray spectroscopy, secondary ion mass spectroscopy, and atomic force microscopy. The transient formation of a Cu–Se phase with a high thermal emissivity was observed during the deposition of Cu and Se at a substrate temperature of 350 °C. Faster diffusion of In than Ga from the (In,Ga)2Se3 precursor to the newly formed CIGS layer was observed. A growth model for CIGS films during the deposition of Cu and Se onto (In,Ga)2Se3 precursor is proposed. A solar cell using a CIGS film prepared at about 350 °C showed an efficiency of 12.4%.

Role of Pre-Layer Mo Films in Microstructural and Morphological Properties of Over-Layer CIGS Films

MRS Advances ◽  
2017 ◽  
Vol 2 (53) ◽  
pp. 3215-3224 ◽  
Author(s):  
Hamda A. Al-Thani ◽  
Falah S. Hasoon
Keyword(s):  
Physical Vapor Deposition ◽  
Least Square Method ◽  
Soda Lime ◽  
Least Square ◽  
Morphological Properties ◽  
Soda Lime Glass ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sputtering Power

ABSTRACTThis study focuses on establishing a microstructural and morphological correlation between CIGS films and its precursor layer of Molybdenum (Mo) coated soda-lime glass (SLG). Therefore, variations in the morphology and microstructural properties of Mo thin films, using DC planar magnetron sputtering, were induced systematically by varying the sputtering pressure from 0.6 to 16 mT with a sputtering power density of 1.2 W/cm2. Subsequently, under fixed deposition conditions (deposition rate and substrate temperature), a growth of Cu(In,Ga)Se2 (CIGS) films was carried out on the Mo-coated SLG substrates, using the 3-stage growth process of the physical vapor deposition (PVD) technique.High-Resolution Scanning Electron Microscopy (HRSEM) was used to examine the Mo and CIGS films morphology. X-Ray Diffraction (XRD) was applied to study in detail the microstructure of Mo and CIGS films. Where, the films’ crystal structure including the preferred orientation and the lattice parameters were determined by the θ/2θ XRD technique and by applying Cohen’s least-square method. Furthermore, Atomic Force Microscopy (AFM) was used to determine the root-mean-square (RMS) surface roughness of the CIGS films.

Characterizing Interfacial Fracture Toughness Using AFM

2000 ◽  
Vol 6 (S2) ◽  
pp. 722-723
Author(s):  
M. Li ◽  
C.B. Carter ◽  
M.A. Hillmyer ◽  
W.W. Gerberich
Keyword(s):  
Glass Substrate ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Thin Polymer Films ◽  
Residual Solvent ◽  
Force Microscopy ◽  
Interfacial Toughness ◽  
Polymer Adhesion ◽  
Atomic Force ◽  
Thin Polymer

Reliability of thin polymer films is strongly dependent on interfacial adhesion. This paper concerns the application of indentation combined with atomic force microscopy (AFM) for the evaluation of polymer-non-polymer adhesion. Interfacial toughness calculations have been made using AFM measurement of geometry of delaminations induced by indentation. Fracture surfaces characterized with AFM are also presented here.The interface chosen for study is that between polystyrene (PS) and a glass substrate. Spin coating has been used to prepare PS films. PS, dissolved in toluene, was spun onto the soda-lime glass and then dried at 60°C for 3h to remove residual solvent. The thickness of the PS film was approximately 660nm. To enhance the driving force for delamination, poly(methyl methacrylate) (PMMA) overlayers were applied on top of the PS films. The PMMA overlayer, of thickness approximately 1.5 μm, was first solvent cast onto a second glass slide, floated off the glass onto deionized water, and then laid on top of a first glass substrate which had been coated with PS.

Fractography Of Glass At The Nanometer Scale

1995 ◽  
Vol 409 ◽  
Author(s):  
E. Guilloteau ◽  
H. Arribart ◽  
F. Creuzet
Keyword(s):  
Atomic Force Microscopy ◽  
Fracture Surface ◽  
Soda Lime ◽  
Nanometer Scale ◽  
Soda Lime Glass ◽  
Self Similarity ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mirror Zone

AbstractWe present a nanometer scale description of the fracture surface of soda-lime glass. This is achieved by the use of Atomic Force Microscopy. The mirror zone is shown to be built with elementary entities, the density of which increases continuously while the mist and hackle zones are approached. Moreover, the overall picture leads to some kind of self-similarity, in the sense that small regions of the hackle zone exhibit the full set of mirror, mist and hackle areas.

scholarly journals Synthesis and Characterization of System In(O,OH)S/i-ZnO/n+-ZnO

2017 ◽  
Vol 2017 ◽  
pp. 1-7
Author(s):  
William Vallejo ◽  
Carlos Diaz-Uribe ◽  
G. Gordillo
Keyword(s):  
Thin Films ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
X Ray Diffraction ◽  
Visible Radiation ◽  
Soda Lime Glass Substrate ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Cbd Method

In this work, we fabricated system In(O,OH)S/i-ZnO/n+-ZnO to be used as potential optical window in thin films solar cells. i-ZnO/n+-ZnO thin films were synthesized by reactive evaporation (RE) method and In(O,OH)S thin films were synthesized by chemical bath deposition (CBD) method; all thin films were deposited on soda lime glass substrates. Thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM), and spectral transmittance measurements. Structural results indicated that both thin films were polycrystalline; furthermore, morphological results indicated that both thin films coated uniformly soda lime glass substrate; besides, optical characterization indicated that system had more than 80% of visible radiation transmittance.

Study of the Electrical Properties of Cu2ZnSnS4 (CZTS) Thin Film Using Atomic Force Microscopy (AFM) Techniques

2020 ◽  
Vol 20 (6) ◽  
pp. 3925-3928 ◽  
Author(s):  
Muhunthan Nadarajah ◽  
Om Pal Singh ◽  
Kuldeep Singh Gour ◽  
Vidya Nand Singh
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Soda Lime ◽  
Czts Thin Film ◽  
Soda Lime Glass ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

CZTS is a compound semiconductor made from elements which are plainly available and nonpoisonous having favorable optoelectronic properties for thin film solar cell (TFSC) applications. In this study, Cu-poor CZTS thin film was fabricated on soda lime glass (SLG)/Mo-deposited substrate using cosputtering followed by post sulfurization in H2S atmosphere. Local electrical transport study was carried out by using conductive atomic force microscopy (C-AFM) for small bias voltage (100 mV). Here we observed that most of the dark current (Idark) flow through grain boundaries (GBs) than grain interiors. The positive high current about 3.4 nA and sharp C-AFM signal at the GBs, dips to the zero (0) value at the grain interior. Local surface potential (Vsurface) study was carried out using kelvin probe force microscopy (KPFM), which showed that the positive Vsurface potential about 175 mV in the vicinity of GBs in a Cu-poor CZTS sample. On the basis of these results we inferred a potential landscape (VL) around the GBs. All result shows that due to variation in elemental composition which creates Cu-deficit or CuZn anti site defects at GBs, leads reduced effective band gap (Eeff) than the bulk towards grain inner to GBs.[-2pt]

Structural, morphological, and optoelectrical characterization of Bi2S3 thin films grown by co-evaporation

2016 ◽  
Vol 30 (06) ◽  
pp. 1650066 ◽  
Author(s):  
F. Mesa ◽  
C. A. Arredondo ◽  
W. Vallejo
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Experimental Conditions ◽  
Soda Lime Glass Substrate ◽  
Text Type ◽  
Force Microscopy ◽  
Atomic Force

This work presents the results of synthesis and characterization of polycrystalline [Formula: see text]-type Bi2S3 thin films. The films were grown through a chemical reaction from co-evaporation of their precursor elements in a soda-lime glass substrate. The effect of the experimental conditions on the optical, morphological structural properties, the growth rate, and the electrical conductivity [Formula: see text] was studied through spectral transmittance, X-ray diffraction (XRD), atomic force microscopy (AFM) and [Formula: see text] versus [Formula: see text] measurements, respectively. The results showed that the films grow only in the orthorhombic Bi2S3 bismuthinite phase. It was also found that the Bi2S3 films present an energy band gap [Formula: see text] of about 1.38 eV. In addition to these results, the electrical conductivity of the Bi2S3 films was affected by both the transport of free carriers in extended states of the conduction band and for variable range hopping transport mechanisms, each one predominating in a different temperature range.

Single Asperity Chemical Mechanical Wear Studied by Atomic Force Microscopy

2003 ◽  
Vol 767 ◽  
Author(s):  
Forrest Stevens ◽  
Steve Langford ◽  
J. Thomas Dickinson
Keyword(s):  
Activation Energy ◽  
Atomic Force Microscopy ◽  
Silicon Nitride ◽  
Soda Lime ◽  
Fused Silica ◽  
Nanometer Scale ◽  
Soda Lime Glass ◽  
Force Microscopy ◽  
Single Asperity ◽  
Atomic Force

AbstractNanometer scale wear caused by a single asperity of silicon nitride was examined by measuring the wear caused by atomic force microscope tips translated against sodium trisilicate glass, soda-lime glass, or fused silica in aqueous solutions. As a function of contact force, FN, and scan duration, t, the wear to both tip and substrate scales approximately as (FNt)0.5. Substrate wear was independent of temperature from 5°C to 60°C, whereas tip wear showed a temperature dependence on soda-lime glass corresponding to an activation energy of 60 kJ/mol on soda-lime glass.

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