Deposition of Superconducting Thin Films of Magnesium Di-Boride on Various Substrates by Electroless Plating Process

2010 ◽  
Vol 654-656 ◽  
pp. 1840-1843
Author(s):  
Susil K. Putatunda ◽  
Khurpa S. Vijayaragavan ◽  
Gavin Lawes
Keyword(s):  
Thin Films ◽  
Electroless Plating ◽  
Magnesium Diboride ◽  
Superconducting Thin Films ◽  
Superconducting Transition ◽  
Superconducting Properties ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray ◽  
Gold Silver

Superconducting thin films of magnesium diboride (MgB2) has been synthesized on various substrates such as gold, silver, copper and silicon using a novel electroless plating technique. The microstructures and the superconducting properties of these films have been characterized using X-ray diffraction, scanning electron microscopy and temperature dependent magnetometry. X-ray diffraction measurements confirm that the films are crystalline magnesium diboride with some impurity phases. Clear evidence for a superconducting transition in the magnetization measurements was observed.

ANNEALING EFFECTS OF TlCaBaCuO THIN FILMS ON YSZ SUBSTRATES

1990 ◽  
Vol 04 (07) ◽  
pp. 479-483 ◽  
Author(s):  
S. L. YAN ◽  
H. L. CAO ◽  
Q. X. SONG ◽  
X. M. YANG ◽  
J. YAN ◽  
...  
Keyword(s):  
Thin Films ◽  
Film Surface ◽  
Superconducting Thin Films ◽  
Superconducting Transition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Conditions ◽  
Post Annealing ◽  
Annealing Effects ◽  
Zero Resistance

Superconducting thin films of Tl 2 Ca 2 Ba 2 Cu 3 O x have been prepared by dc magnetron sputtering from a pair of stoichiometric Tl-based targets onto YSZ substrates. The superconducting transition properties and the morphology of the films depend strongly on the post-annealing conditions. The zero resistance temperature for the best films we got is 117 K. X-ray diffraction analysis indicates that the annealed films with needle-like structure and terraced configuration are both highly c-axis oriented normal to the film surface.

PRODUCTION AND CHARACTERIZATION OF Ba2NdSbO6 COMPLEX PEROVSKITE AS A SUBSTRATE FOR YBa2Cu3O7-δ SUPERCONDUCTING FILMS

2006 ◽  
Vol 20 (08) ◽  
pp. 427-437 ◽  
Author(s):  
Q. MADUEÑO ◽  
D. A. LANDÍNEZ TÉLLEZ ◽  
J. ROA-ROJAS
Keyword(s):  
Thin Films ◽  
Chemical Elements ◽  
Compositional Analysis ◽  
Morphological Characterization ◽  
Superconducting Thin Films ◽  
Superconducting Transition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Excellent Candidate

We report systematic studies of Ba 2 NdSbO 6 as substrates for the production of YBa 2 Cu 3 O 7-δ superconducting thin films. Chemical stability and crystallographic coupling between Ba 2 NdSbO 6 and YBCO were examined by characterizing Ba 2 NdSbO 6- YBa 2 Cu 3 O 7-δ (0 to 100 vol.%) polycrystalline composites. X-ray diffraction experiments showed that Ba 2 NdSbO 6 belongs to the complex cubic perovskite family. Moreover, we determine that these materials are chemically stables, e.g. there is no chemical reaction at the interface, and the lattice parameters evidenced a matching ~ 2%. Morphological characterization of our samples was performed through scanning electron microscopy, which revealed the existence of separated grains of Ba 2 NdSbO 6 and YBa 2 Cu 3 O 7-δ. Compositional analysis of samples was performed by energy dispersive X-ray experiments, which showed the inexistence of impurities or undesired chemical elements. DC susceptibility measurements permitted us to determine that the presence of Ba 2 NdSbO 6 does not affect the critical temperature of the superconducting transition of YBa 2 Cu 3 O 7-δ. Our results evidenced that Ba 2 NdSbO 6 is an excellent candidate as a substrate for the fabrication of YBa 2 Cu 3 O 7-δ superconducting thin films.

X-Ray Diffraction Analysis of High Tc Superconducting Thin Films

1989 ◽  
pp. 269-278
Author(s):  
T. C. Huang ◽  
A. Segmüller ◽  
W. Lee ◽  
V. Lee ◽  
D. Bullock ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Analysis ◽  
Superconducting Thin Films ◽  
X Ray Diffraction ◽  
High Tc ◽  
X Ray

X-ray diffraction studies elucidating high temperature superconducting properties of YBa2Cu3O7−x thin films

1994 ◽  
Vol 209 (4) ◽  
Author(s):  
M. Schieber ◽  
Y. Ariel ◽  
A. Raizman ◽  
S. Rotter
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Quantitative Evaluation ◽  
Superconducting Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Temperature Superconducting

AbstractA quantitative evaluation of the influence of the amount of the crystallographically unoriented grains of YBa

X-ray Line Broadening Analysis of Tl-Superconducting Films

1989 ◽  
Vol 33 ◽  
pp. 145-151
Author(s):  
M. O. Eatough ◽  
D. S. Ginley ◽  
B. Morosin
Keyword(s):  
Thin Films ◽  
Superconducting Films ◽  
Electron Beam Evaporation ◽  
Superconducting Thin Films ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Current Densities ◽  
Diffraction Peaks ◽  
Sequential Electron

AbstractSuperconducting thin films (0.3-0.7μm) in the TI-Ca-Ba-Cu-0 system have been prepared on various single crystal substrates by sequential electron beam evaporation followed by appropriate sintering and annealing. Oxygen-annealed films show Tc as high as 110K and critical current densities to 600,000 A/cm2. X-ray diffraction analyses of these films show predominantly the Tl2Ca2Ba2Cu2O10 phase (c-parameter near 36Å), but some also contain up to 50 at% of the Tl2CaBa2Cu2O8 phase (c-parameter near 30Å). The complete absence of hkl reflections other than 00I demonstrates the highly oriented nature of the films as well as the absence of other Tl phases. The diffraction peaks are noticeably broader for the 36Å phase than for the 30Å phase. For a 0.7μm film such broadening is consistent with coherent sizes along the c-axis of 1200 - 1400Å and 500Å, respectively, for the 30Å and 36Å phases, and of strain values near 1.4-1.8 x 10-3 for both phases.

HIGH-QUALITY Tl2Ba2Ca2Cu3O10 THIN FILMS FABRICATED VIA LASER ABLATION

1993 ◽  
Vol 07 (01) ◽  
pp. 19-23 ◽  
Author(s):  
W. A. LUO ◽  
Y. Q. TANG ◽  
Y. Z. CHEN ◽  
I. N. CHAN ◽  
K. Y. CHEN ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Critical Current Density ◽  
Current Density ◽  
Superconducting Thin Films ◽  
X Ray Diffraction ◽  
High Quality ◽  
Step Process ◽  
X Ray ◽  
Zero Resistance

In this letter, we describe results obtained via laser ablation to fabricate Tl 2 Ba 2 Ca 2 Cu 3- O 10 superconducting thin films using a two-step process. We found that the zero-resistance temperatures are up to 121 K, while the onset temperatures are up to 125 K. The T c and J c are mainly determined by a non-contact new technique for high-T c films. The typical critical current density, J c , is about 106 A/cm 2 at 77 K. X-ray diffraction showed that the superconducting thin films are nearly single 2223 phase and are highly oriented.

HIGH QUALITY SmBa2Cu3O7-X THIN FILMS FOR MICROWAVE APPLICATIONS

2003 ◽  
Vol 17 (04n06) ◽  
pp. 768-772 ◽  
Author(s):  
M. A. BOFFA ◽  
F. BOBBA ◽  
A. M. CUCOLO ◽  
R. MONACO
Keyword(s):  
Thin Films ◽  
Microwave Measurements ◽  
Superconducting Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Oxygen Pressure ◽  
Afm Analysis ◽  
Microstrip Resonators ◽  
Microwave Applications ◽  
Critical Current Density Jc

In this paper we report on the analysis of the surface properties of c-axis oriented, highly epitaxial SmBa 2 Cu 3 O 7-X thin films grown by high oxygen pressure d.c. sputtering technique on (100)k LaAlO 3 substrates. Structural and morphological characterizations of the samples were carried out by means of X-Ray diffraction and AFM analysis. The AFM images show a surface morphology with characteristic screw dislocations with roughness of 2-3 nm on 1 μ m 2 area. The superconducting properties indicate a critical temperature Tc(R=0)>90K and a critical current density Jc>1*106A/cm 2 at T=77K. Preliminary microwave measurements on meanderline microstrip resonators show surface residual resistances Rs<13μΩ a 1 GHz at T=4.2K .

SYNTHESIS AND CHARACTERIZATION OF HG-BASED SUPERCONDUCTING THIN FILMS PRODUCED STARTING FROM LASER-DEPOSITED PRECURSORS

2000 ◽  
Vol 14 (25n27) ◽  
pp. 2731-2736 ◽  
Author(s):  
M. BINDI ◽  
F. FUSO ◽  
N. PUCCINI ◽  
E. ARIMONDO ◽  
A. TAMPIERI ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Deposition ◽  
Precursor Film ◽  
Superconducting Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Microscopy Analysis ◽  
Zero Resistance ◽  
Microscopy Analysis

Correctly c-axis oriented HgBa 2 CaCu 2 O 6+δ thin films have been produced on (100) MgO single crystal substrates and characterized. Pulsed laser deposition has been exploited to deposit Hg-free Re-doped precursor which then underwent synthesis in evacuated and sealed quartz tubes. X-ray diffraction pattern of the precursor target shows the expected composition of oxides. Scanning electron microscopy analysis have been performed on the surface of the precursor film. Hg-1212 films have been analyzed by θ-2θ Bragg-Brentano X-ray diffractometry. The patterns show little contributions in composition of Hg-1223 phase. The films exhibit a transition temperature >120 K with zero-resistance at around 115 K.

scholarly journals X-Ray Powder Diffraction Study on the MgB2 Superconductor Reacted with Nano-SiC: The Effects of Sintering Temperature

2010 ◽  
Vol 173 ◽  
pp. 78-83
Author(s):  
Kwee Yong Tan ◽  
Tan Kim Lee ◽  
Lim Kean Pah ◽  
Shaari Abdul Halim ◽  
Tan Kar Ban ◽  
...  
Keyword(s):  
Phase Formation ◽  
Sintering Temperature ◽  
Lattice Parameter ◽  
Primary Phase ◽  
Superconducting Transition ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray ◽  
Higher Temperature ◽  
Addition Level

SiC added MgB2 polycrystalline samples were synthesized at low (650°C) and high (850°C) temperatures in order to study the sintering effect on the phase formation and superconducting properties. The MgB2 bulks with additions of 0wt%, 1wt%, 3wt% and 5wt% SiC were studied with powder X-ray diffraction technique. We observed that MgB2 remained as the primary phase for both sintering temperatures in all samples with the presence of MgO and Mg2Si as the main impurities. Some diffraction peaks associated with unreacted SiC is also noticeable. The relative intensity of the Mg2Si peaks was found to decrease in samples sintered at higher temperature. Temperature dependent magnetic moment measurements showed that the superconducting transition temperature, Tc decreases as the SiC addition level increases while lower sintering temperature degrades Tc to a greater extent. The changes in the physical properties is discussed based on the results of phase formation, full width half maximum (FWHM), lattice parameter and crystallite size.

Sign in / Sign up

Export Citation Format

Share Document