scholarly journals Rolic® LCMO Photo Alignment Technology: Mechanism and Application to Large LCD Panels

2011 ◽  
Vol 181-182 ◽  
pp. 3-13 ◽  
Author(s):  
Mohammed Ibn-Elhaj ◽  
Sabrina Chappellet ◽  
Frédéric Lincker
Keyword(s):  
High Resolution ◽  
Mass Production ◽  
State Of The Art ◽  
Production Costs ◽  
Advanced Materials ◽  
Large Area ◽  
Wide Range ◽  
Fast Processing ◽  
Homeotropic Orientation ◽  
Photo Alignment

Rolic® Light Controlled Molecular Orientation (LCMO) technology is the basis for todays advanced mass production technologies for large LCD-TV panel, high-resolution 3D patterned-retarders and high-resolution optical security devices. This fundamental technology allows an easy achievement of high resolution azimuthal LC-director patterns with defined bias angles, from homogeneous planar to homeotropic orientation, depending on the target application [1-7]. In addition to the control of bias angles, LCD panel manufacturers require alignment layers with a wide range of optimized properties. Thin alignment films must be easily coatable and should have high photosensitivity in order to achieve fast processing. The photoalignment film should also have high stability and good electrical properties such as Voltage Holding Ratio (VHR), Residual DC (RDC) and image sticking. Because of in-situ photo crosslinking during processing [1, 2], our proprietary LCMO photoalignment technology is shown to be thermally and optically stable. Last years, enormous progress has been made in the development of advanced materials that meet all requirements for mass production of large-area flat panel displays. LCMO-VA technology, for vertical alignment LCDs, is the basis for the state of the art UV2A production technology recently used in the manufacturing of advanced new generation LCD-TV panel displays with reduced production costs and low energy consumption [8, 9]. LCMO-VA mechanism and performances of state of the art materials will be discussed.

scholarly journals GEOBIA at the Terapixel Scale: Toward Efficient Mapping of Small Woody Features from Heterogeneous VHR Scenes

2019 ◽  
Vol 8 (1) ◽  
pp. 46 ◽  
Author(s):  
François Merciol ◽  
Loïc Faucqueur ◽  
Bharath Damodaran ◽  
Pierre-Yves Rémy ◽  
Baudouin Desclée ◽  
...  
Keyword(s):  
High Resolution ◽  
Semantic Content ◽  
Scalable Algorithms ◽  
Large Area ◽  
Object Based Image Analysis ◽  
Object Based ◽  
Wide Range ◽  
Geographic Object ◽  
Monitoring Service ◽  
Hierarchical Representations

Land cover mapping has benefited a lot from the introduction of the Geographic Object-Based Image Analysis (GEOBIA) paradigm, that allowed to move from a pixelwise analysis to a processing of elements with richer semantic content, namely objects or regions. However, this paradigm requires to define an appropriate scale, that can be challenging in a large-area study where a wide range of landscapes can be observed. We propose here to conduct the multiscale analysis based on hierarchical representations, from which features known as differential attribute profiles are derived over each single pixel. Efficient and scalable algorithms for construction and analysis of such representations, together with an optimized usage of the random forest classifier, provide us with a semi-supervised framework in which a user can drive mapping of elements such as Small Woody Features at a very large area. Indeed, the proposed open-source methodology has been successfully used to derive a part of the High Resolution Layers (HRL) product of the Copernicus Land Monitoring service, thus showing how the GEOBIA framework can be used in a big data scenario made of more than 38,000 Very High Resolution (VHR) satellite images representing more than 120 TB of data.

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

2014 ◽  
Vol 20 (2) ◽  
pp. 602-612 ◽  
Author(s):  
Vasile-Dan Hodoroaba ◽  
Charles Motzkus ◽  
Tatiana Macé ◽  
Sophie Vaslin-Reimann
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Size Distribution ◽  
Colloidal Suspension ◽  
Accurate Determination ◽  
Energy Dispersive ◽  
Transmission Mode ◽  
Advanced Materials ◽  
Large Area ◽  
X Ray

AbstractThe analytical performance of high-resolution scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) for accurate determination of the size, size distribution, qualitative elemental analysis of nanoparticles (NPs) was systematically investigated. It is demonstrated how powerful high-resolution SEM is by using both mono- and bi-modal distributions of SiO2 airborne NPs collected on appropriate substrates after their generation from colloidal suspension. The transmission mode of the SEM (TSEM) is systematically employed for NPs prepared on thin film substrates such as transmission electron microscopy grids. Measurements in the transmission mode were performed by using a “single-unit” TSEM transmission setup as manufactured and patented by Zeiss. This alternative to the “conventional” STEM detector consists of a special sample holder that is used in conjunction with the in-place Everhart–Thornley detector. In addition, the EDX capabilities for imaging NPs, highlighting the promising potential with respect to exploitation of the sensitivity of the new large area silicon drift detector energy dispersive X-ray spectrometers were also investigated. The work was carried out in the frame of a large prenormative VAMAS (Versailles Project on Advanced Materials and Standards) project, dedicated to finding appropriate methods and procedures for traceable characterization of NP size and size distribution.

Realization of Mass Production of Microlens Array by Hot Embossing on Silicon Substrate

2010 ◽  
Vol 139-141 ◽  
pp. 1562-1565
Author(s):  
Xi Qiu Fan
Keyword(s):  
High Resolution ◽  
High Throughput ◽  
Silicon Substrate ◽  
Mass Production ◽  
Low Cost ◽  
Microlens Array ◽  
Hot Embossing ◽  
High Fidelity ◽  
Optical Performance ◽  
Large Area

Tradition lithographic techniques to produce micrlens array are complicated and time consuming. Due to the capability to replicate nanostructures repeatedly in a large area with high resolution and uniformity, hot embossing has been recognized as one of the promising approaches to fabricate microlens array with high throughput and low cost. This paper introduces processes to realize fabricating microlens array in mass production by direct hot embossing on silicon substrate. The mold is fabricated by multi-photolithography and etching steps and polymethyl methacrylate (PMMA) is chosen as the resist. Processes include coating, heating, pressing, etc. Fidelity and optical performance of the embossed microlens array were measured. High fidelity and fine optical performance of the embossed microlens array demonstrate the possibility of hot embossing to fabricate microlens array in mass production.

scholarly journals An Enhanced Double-Filter Deep Residual Neural Network for Generating Super Resolution DEMs

2021 ◽  
Vol 13 (16) ◽  
pp. 3089
Author(s):  
Annan Zhou ◽  
Yumin Chen ◽  
John P. Wilson ◽  
Heng Su ◽  
Zhexin Xiong ◽  
...  
Keyword(s):  
Neural Network ◽  
High Resolution ◽  
Spatial Data ◽  
Super Resolution ◽  
Low Resolution ◽  
Large Area ◽  
Wide Range ◽  
Terrain Parameters ◽  
Feature Preserving ◽  
Sr Method

High-resolution DEMs are important spatial data, and are used in a wide range of analyses and applications. However, the high cost to obtain high-resolution DEM data over a large area through sensors with higher precision poses a challenge for many geographic analysis applications. Inspired by the convolution neural network (CNN) excellent performance in super-resolution (SR) image analysis, this paper investigates the use of deep residual neural networks and low-resolution DEMs to generate high-resolution DEMs. An enhanced double-filter deep residual neural network (EDEM-SR) method is proposed, which uses filters with different receptive field sizes to fuse and extract features and reconstruct a more realistic high-resolution DEM. The results were compared with those generated with the bicubic, bilinear, and EDSR methods. The numerical accuracy and terrain feature preserving effects of the EDEM-SR method can generate reconstructed DEMs that better match the original DEMs, show lower MAE and RMSE, and improve the accuracy of the terrain parameters. MAE is reduced by about 30 to 50% compared with traditional interpolation methods. The results show how the EDEM-SR method can generate high-resolution DEMs using low-resolution DEMs.

Development of a conical anode Fe-gun for low voltage SEM

1988 ◽  
Vol 46 ◽  
pp. 978-979
Author(s):  
T. Miyokawa ◽  
S. Norioka ◽  
S. Goto
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Low Voltage ◽  
Irradiation Damage ◽  
Cold Cathode ◽  
Virtual Source ◽  
Source Position ◽  
Electrostatic Lens ◽  
Electrostatic Lenses ◽  
Wide Range

Field emission SEMs (FE-SEMs) are becoming popular due to their high resolution needs. In the field of semiconductor product, it is demanded to use the low accelerating voltage FE-SEM to avoid the electron irradiation damage and the electron charging up on samples. However the accelerating voltage of usual SEM with FE-gun is limited until 1 kV, which is not enough small for the present demands, because the virtual source goes far from the tip in lower accelerating voltages. This virtual source position depends on the shape of the electrostatic lens. So, we investigated several types of electrostatic lenses to be applicable to the lower accelerating voltage. In the result, it is found a field emission gun with a conical anode is effectively applied for a wide range of low accelerating voltages.A field emission gun usually consists of a field emission tip (cold cathode) and the Butler type electrostatic lens.

Three-fold astigmatism: An important TEM aberration

1993 ◽  
Vol 51 ◽  
pp. 972-973 ◽  
Author(s):  
O.L. Krivanek ◽  
M.L. Leber
Keyword(s):  
High Resolution ◽  
Spatial Frequency ◽  
Field Emission ◽  
Azimuthal Angle ◽  
Hollow Cone ◽  
Small Probe ◽  
Wide Range ◽  
High Resolution Images ◽  
Image Position

Three-fold astigmatism resembles regular astigmatism, but it has 3-fold rather than 2-fold symmetry. Its contribution to the aberration function χ(q) can be written as:where A3 is the coefficient of 3-fold astigmatism, λ is the electron wavelength, q is the spatial frequency, ϕ the azimuthal angle (ϕ = tan-1 (qy/qx)), and ϕ3 the direction of the astigmatism.Three-fold astigmatism is responsible for the “star of Mercedes” aberration figure that one obtains from intermediate lenses once their two-fold astigmatism has been corrected. Its effects have been observed when the beam is tilted in a hollow cone over a wide range of angles, and there is evidence for it in high resolution images of a small probe obtained in a field emission gun TEM/STEM instrument. It was also expected to be a major aberration in sextupole-based Cs correctors, and ways were being developed for dealing with it on Cs-corrected STEMs.

Scanning tunneling microscopy of polymers: A status report

1989 ◽  
Vol 47 ◽  
pp. 330-331
Author(s):  
P.E. Russell ◽  
I.H. Musselman
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Sample Surface ◽  
Atomic Scale ◽  
Constant Current ◽  
Scanning Tunneling ◽  
Status Report ◽  
Tunneling Microscopy ◽  
Research Issues ◽  
Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

Study of Tip-Surface Interactions in Scanning Tunneling Microscopy (STM) by Reflection Electron Microscopy (REM)

1990 ◽  
Vol 48 (1) ◽  
pp. 320-321
Author(s):  
W. Lo ◽  
J.C.H. Spence ◽  
M. Kuwabara
Keyword(s):  
High Resolution ◽  
Elastic Strain ◽  
Tunneling Current ◽  
Surface Damage ◽  
Surface Interactions ◽  
Graphite Surface ◽  
Scanning Tunneling ◽  
Large Area ◽  
Tunneling Microscopy ◽  
High Resolution Tem

Work on the integration of STM with REM has demonstrated the usefulness of this combination. The STM has been designed to replace the side entry holder of a commercial Philips 400T TEM. It allows simultaneous REM imaging of the tip/sample region of the STM (see fig. 1). The REM technique offers nigh sensitivity to strain (<10−4) through diffraction contrast and high resolution (<lnm) along the unforeshortened direction. It is an ideal technique to use for studying tip/surface interactions in STM.The elastic strain associated with tunnelling was first imaged on cleaved, highly doped (S doped, 5 × 1018cm-3) InP(110). The tip and surface damage observed provided strong evidence that the strain was caused by tip/surface contact, most likely through an insulating adsorbate layer. This is consistent with the picture that tunnelling in air, liquid or ordinary vacuum (such as in a TEM) occurs through a layer of contamination. The tip, under servo control, must compress the insulating contamination layer in order to get close enough to the sample to tunnel. The contaminant thereby transmits the stress to the sample. Elastic strain while tunnelling from graphite has been detected by others, but never directly imaged before. Recent results using the STM/REM combination has yielded the first direct evidence of strain while tunnelling from graphite. Figure 2 shows a graphite surface elastically strained by the STM tip while tunnelling (It=3nA, Vtip=−20mV). Video images of other graphite surfaces show a reversible strain feature following the tip as it is scanned. The elastic strain field is sometimes seen to extend hundreds of nanometers from the tip. Also commonly observed while tunnelling from graphite is an increase in the RHEED intensity of the scanned region (see fig.3). Debris is seen on the tip and along the left edges of the brightened scan region of figure 4, suggesting that tip abrasion of the surface has occurred. High resolution TEM images of other tips show what appear to be attached graphite flakes. The removal of contamination, possibly along with the top few layers of graphite, seems a likely explanation for the observed increase in RHEED reflectivity. These results are not inconsistent with the “sliding planes” model of tunnelling on graphite“. Here, it was proposed that the force due to the tunnelling probe acts over a large area, causing shear of the graphite planes when the tip is scanned. The tunneling current is then modulated as the planes of graphite slide in and out of registry. The possiblity of true vacuum tunnelling from the cleaned graphite surface has not been ruled out. STM work function measurements are needed to test this.

High Resolution Displacement of Functional Groups onto Fluorocarbon Resin Surface by Using ArF Excimer Laser

1996 ◽  
Vol 451 ◽  
Author(s):  
T. Shimizu ◽  
M. Murahara
Keyword(s):  
Contact Angle ◽  
High Resolution ◽  
Laser Beam ◽  
Thin Layer ◽  
Functional Groups ◽  
Excimer Laser ◽  
Laser Fluence ◽  
Large Area ◽  
Three Solutions ◽  
Arf Excimer Laser

ABSTRACTA Fluorocarbon resin surface was selectively modified by irradiation with a ArF laser beam through a thin layer of NaAlO2, B(OH)3, or H2O solution to give a hydrophilic property. As a result, with low fluence, the surface was most effectively modified with the NaAlO2 solution among the three solutions. However, the contact angle in this case changed by 10 degrees as the fluence changed only 1mJ/cm2. When modifying a large area of the surface, high resolution displacement could not be achieved because the laser beam was not uniform in displacing functional groups. Thus, the laser fluence was successfully made uniform by homogenizing the laser beam; the functional groups were replaced on the fluorocarbon resin surface with high resolution, which was successfully modified to be hydrophilic by distributing the laser fluence uniformly.

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