scholarly journals Effect of Gamma Radiation on Characteristic of bipolar junction Transistors (BJTs )

2021 ◽  
pp. 1-9
Author(s):  
Abdenabi Ali Elamin ◽  
Waell H Alawad
Keyword(s):  
Gamma Radiation ◽  
Power Supplies ◽  
Strong Increase ◽  
Bipolar Junction Transistors ◽  
Bipolar Junction Transistor ◽  
Before And After ◽  
Junction Transistor ◽  
The Individual ◽  
Silicon Transistor ◽  
Different Doses

This paper describes the effects of 60Cogamma radiation hardness of characteristic and parameters of Bipolar Junction Transistors in order to analyze the performance changes of the individual devices used in nuclear field. Bipolar Junction Transistor (BJT) of the type (BC-301) (npn) silicon, Transistor was irradiated by gamma radiation using 60Cosource at different doses (1, 2, 3, 4, and 5) KGy. The characteristics and parameter of Bipolar Junction Transistor was studied before and after irradiated by using Transistor Characteristics Apparatus with regulated power supplies. Obtained result showed that, the saturation voltage VCE(sat) of Bipolar Junction Transistor decreased because of the gain degradation of the transistor and increased silicon resistivity, Another parameter of a bipolar junction transistor affected by ionizing radiation is a collector-base leakage current, a strong increase of the current is caused by the build-up charge near the junction.

IV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction Transistors

2015 ◽  
Vol 1083 ◽  
pp. 185-189 ◽  
Author(s):  
Konstantin O. Petrosyants ◽  
Igor A. Kharitonov ◽  
Lev M. Sambursky ◽  
Maxim V. Kozhukhov
Keyword(s):  
Measurement Error ◽  
Bipolar Junction Transistors ◽  
Bipolar Junction Transistor ◽  
Wire Method ◽  
Junction Transistor

I-V-characteristics of an irradiated transistor in many cases should be measured inside the radiation chamber with long cables, which introduces noticeable measurement error. In this paper IV-characteristics of an irradiated bipolar junction transistor measured with the 4-wire and the 2-wire circuits are presented and compared to direct (without cables) measurements. Significant enlargement of measurement error for the 2-wire method in comparison with the 4-wire method is shown for different currents.

scholarly journals Ultra-High Sensitivity MEMS Pressure Sensor Utilizing Bipolar Junction Transistor for -1…+1 kPa

2021 ◽  
Author(s):  
Mikhail
Keyword(s):  
Circuit Design ◽  
Pressure Sensor ◽  
Feedback Loop ◽  
High Sensitivity ◽  
Electrical Circuit ◽  
Bipolar Junction Transistors ◽  
Chip Area ◽  
Bipolar Junction Transistor ◽  
Junction Transistor ◽  
Type V

The theoretical model and experimental characteristics of ultra-high sensitivity MEMS pressure sensor chip for 1 kPa utilizing a novel electrical circuit are presented. The electrical circuit uses piezosensitive differential amplifier with negative feedback loop (PDA-NFL) based on two bipolar-junction transistors (BJT). The BJT has a vertical structure of n-p-n type (V-NPN) formed on a non-deformable chip area. The circuit contains eight piezoresistors located on a profiled membrane in the areas of maximum mechanical stresses. The circuit design provides a balance between high pressure sensitivity (S =44.9 mV/V/kPa) and fairly low temperature coefficient of zero signal (TCZ = 0.094% FS/°C). Additionally, high membrane burst pressure of P = 550 kPa was reached.

scholarly journals Ultra-High Sensitivity MEMS Pressure Sensor Utilizing Bipolar Junction Transistor for -1…+1 kPa

2021 ◽  
Author(s):  
Mikhail Basov
Keyword(s):  
Circuit Design ◽  
Pressure Sensor ◽  
Feedback Loop ◽  
High Sensitivity ◽  
Electrical Circuit ◽  
Bipolar Junction Transistors ◽  
Chip Area ◽  
Bipolar Junction Transistor ◽  
Junction Transistor ◽  
Type V

The theoretical model and experimental characteristics of ultra-high sensitivity MEMS pressure sensor chip for the range of -1...+1 kPa utilizing a novel electrical circuit are presented. The electrical circuit uses piezosensitive differential amplifier with negative feedback loop (PDA-NFL) based on two bipolar-junction transistors (BJT). The BJT has a vertical structure of n-p-n type (V-NPN) formed on a non-deformable chip area. The circuit contains eight piezoresistors located on a profiled membrane in the areas of maximum mechanical stresses. The circuit design provides a balance between high pressure sensitivity (S = 44.9 mV/V/kPa) and fairly low temperature dependence of zero output signal (TCZ = 0.094% FS/°C). Additionally, high membrane burst pressure of P = 550 kPa was reached.

1000 V, 30 A SiC Bipolar Junction Transistors and Integrated Darlington Pairs

2005 ◽  
Vol 483-485 ◽  
pp. 901-904 ◽  
Author(s):  
Sumi Krishnaswami ◽  
Anant K. Agarwal ◽  
Craig Capell ◽  
Jim Richmond ◽  
Sei Hyung Ryu ◽  
...  
Keyword(s):  
Room Temperature ◽  
Voltage Drop ◽  
Active Area ◽  
Current Gain ◽  
Bipolar Junction Transistors ◽  
Collector Current ◽  
Bipolar Junction Transistor ◽  
Forward Voltage Drop ◽  
Junction Transistor ◽  
A Current

1000 V Bipolar Junction Transistor and integrated Darlington pairs with high current gain have been developed in 4H-SiC. The 3.38 mm x 3.38 mm BJT devices with an active area of 3 mm x 3 mm showed a forward on-current of 30 A, which corresponds to a current density of 333 A/cm2, at a forward voltage drop of 2 V. A common-emitter current gain of 40 was measured on these devices. A specific on-resistance of 6.0 mW-cm2 was observed at room temperature. The onresistance increases at higher temperatures, while the current gain decreases to 30 at 275°C. In addition, an integrated Darlington pair with an active area of 3 mm x 3 mm showed a collector current of 30 A at a forward drop of 4 V at room temperature. A current gain of 2400 was measured on these devices. A BVCEO of 1000 V was measured on both of these devices.

A Novel Low Line Regulation Voltage Reference with No Amplifier

2018 ◽  
Vol 27 (10) ◽  
pp. 1850152 ◽  
Author(s):  
Qiang Li Li ◽  
WanLing Deng ◽  
Xiao Yu Ma ◽  
JunKai Huang
Keyword(s):  
Power Supply ◽  
Output Voltage ◽  
Power Supplies ◽  
Cmos Process ◽  
Voltage Reference ◽  
Bipolar Junction Transistor ◽  
Rejection Ratio ◽  
Power Supply Rejection Ratio ◽  
Junction Transistor ◽  
Simulation Results

A novel low line regulation voltage reference (VR) without an amplifier is presented in this paper. The design is achieved by subtracting two voltages which have the same temperature curves. All circuits use only one Bipolar Junction Transistor (BJT) to decrease the area greatly. Designed with the SMIC 0.18[Formula: see text][Formula: see text]m CMOS process, the simulation results show that the output voltage is 0.902[Formula: see text]V at TT process corner when the power supply is larger than 1.7[Formula: see text]V. The temperature coefficient (TC) is 3.6[Formula: see text]ppm/[Formula: see text]C to 7.4[Formula: see text]ppm/[Formula: see text]C at different power supplies and process corners. The simulated power supply rejection ratio (PSRR) is [Formula: see text]80[Formula: see text]dB at TT process corner when the power supply is 2.5[Formula: see text]V, and the PSRR at different process corners are almost the same. The line regulation of the proposed circuit is 0.005[Formula: see text]mV/V.

Identification of Deep Level Defects in SiC Bipolar Junction Transistors

2006 ◽  
Vol 527-529 ◽  
pp. 567-570
Author(s):  
Patrick M. Lenahan ◽  
N.T. Pfeiffenberger ◽  
T.G. Pribicko ◽  
Aivars J. Lelis
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Deep Level ◽  
Physical Nature ◽  
Bipolar Junction Transistors ◽  
Bipolar Junction Transistor ◽  
Direct Observations ◽  
Spin Resonance ◽  
Junction Transistor ◽  
Recombination Centers

In this study, we report on the observation of recombination center defects in the base of 4H-SiC bipolar junction transistors. The defects are observed through a very sensitive electrically detected electron spin resonance technique called spin dependent recombination. To the best of our knowledge, these results represent the first electron spin resonance results of any kind reported in a fully processed SiC bipolar junction transistor and provide the first direct observations of the chemical and physical nature of recombination centers in SiC bipolar junction transistors. Our results clearly demonstrate the power of SDR techniques in the detection of recombination centers in SiC bipolar junction transistors.

4H-SiC Bipolar Junction Transistors with Graded Base Doping Profile

2009 ◽  
Vol 615-617 ◽  
pp. 829-832 ◽  
Author(s):  
Jian Hui Zhang ◽  
Leonid Fursin ◽  
Xue Qing Li ◽  
Xiao Hui Wang ◽  
Jian Hui Zhao ◽  
...  
Keyword(s):  
High Performance ◽  
Chemical Vapor ◽  
Doping Profile ◽  
Current Gain ◽  
Bipolar Junction Transistors ◽  
Bipolar Junction Transistor ◽  
Blocking Voltage ◽  
Junction Transistor ◽  
Dc Current ◽  
Base Doping

This work reports 4H-SiC bipolar junction transistor (BJT) results based upon our first intentionally graded base BJT wafer with both base and emitter epi-layers continuously grown in the same reactor. The 4H-SiC BJTs were designed to improve the common emitter current gain through the built-in electrical fields originating from the grading of the base doping. Continuously-grown epi-layers are also believed to be the key to increasing carrier lifetime and high current gains. The 4H-SiC BJT wafer was grown in an Aixtron/Epigress VP508, a horizontal hot-wall chemical vapor deposition reactor using standard silane/propane chemistry and nitrogen and aluminum dopants. High performance 4H-SiC BJTs based on this initial non-optimized graded base doping have been demonstrated, including a 4H-SiC BJT with a DC current gain of ~33, specific on-resistance of 2.9 mcm2, and blocking voltage VCEO of over 1000 V.

scholarly journals Ultra-High Sensitivity MEMS Pressure Sensor Utilizing Bipolar Junction Transistor for -1…+1 kPa

2021 ◽  
Author(s):  
Mikhail Basov
Keyword(s):  
Circuit Design ◽  
Pressure Sensor ◽  
Feedback Loop ◽  
High Sensitivity ◽  
Electrical Circuit ◽  
Bipolar Junction Transistors ◽  
Chip Area ◽  
Bipolar Junction Transistor ◽  
Junction Transistor ◽  
Type V

The theoretical model and experimental characteristics of ultra-high sensitivity MEMS pressure sensor chip for the range of -1...+1 kPa utilizing a novel electrical circuit are presented. The electrical circuit uses piezosensitive differential amplifier with negative feedback loop (PDA-NFL) based on two bipolar-junction transistors (BJT). The BJT has a vertical structure of n-p-n type (V-NPN) formed on a non-deformable chip area. The circuit contains eight piezoresistors located on a profiled membrane in the areas of maximum mechanical stresses. The circuit design provides a balance between high pressure sensitivity (S = 44.9 mV/V/kPa) and fairly low temperature dependence of zero output signal (TCZ = 0.094% FS/°C). Additionally, high membrane burst pressure of P = 550 kPa was reached.

TCAD Model Calibration of High Voltage 4H-SiC Bipolar Junction Transistors

2019 ◽  
Vol 963 ◽  
pp. 670-673
Author(s):  
Daniel Johannesson ◽  
Muhammad Nawaz ◽  
Hans Peter Nee
Keyword(s):  
High Voltage ◽  
Model Calibration ◽  
Bipolar Junction Transistors ◽  
Device Structure ◽  
Bipolar Junction Transistor ◽  
Junction Transistor ◽  
Technology Cad ◽  
Tcad Simulation ◽  
Device Operation ◽  
Fine Tune

In this project, a Technology CAD (TCAD) model has been calibrated and verified against experimental data of a 15 kV silicon carbide (SiC) bipolar junction transistor (BJT). The device structure of the high voltage BJT has been implemented in the Synopsys Sentaurus TCAD simulation platform and design of experiment simulations have been performed to extract and fine-tune device parameters and 4H-SiC material parameters to accurately reflect the 15 kV SiC BJT experimental results. The set of calibrated TCAD parameters may serve as a base for further investigations of various SiC device design and device operation in electrical circuits.

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