New methods for determining the thermal activation energies of light sensitive traps

1994 ◽  
Vol 23 (2-3) ◽  
pp. 335-338 ◽  
Author(s):  
M.A. Short ◽  
Man-Yin W. Tso
2000 ◽  
Vol 88 (5) ◽  
pp. 2564-2569 ◽  
Author(s):  
D. J. Kim ◽  
D. Y. Ryu ◽  
N. A. Bojarczuk ◽  
J. Karasinski ◽  
S. Guha ◽  
...  

1997 ◽  
Vol 258-263 ◽  
pp. 691-696 ◽  
Author(s):  
A.O. Evwaraye ◽  
S.R. Smith ◽  
W.C. Mitchel ◽  
H. McD. Hobgood ◽  
G. Augustine ◽  
...  

2006 ◽  
Vol 911 ◽  
Author(s):  
Nguyen Tien Son ◽  
Patrick Carlsson ◽  
Björn Magnusson ◽  
Erik Janzén

AbstractElectron paramagnetic resonance was used to study defects in high-purity semi-insulating (HPSI) substrates grown by high-temperature chemical vapor deposition and physical vapor transport. Deep level defects associated to different thermal activation energies of the resistivity ranging from ~0.6 eV to ~1.6 eV in HPSI substrates are identified and their roles in carrier compensation processes are discussed. Based on the results obtained in HPSI materials, we discuss the carrier compensation processes in vanadium-doped SI SiC substrates and different activation energies in the material.


1998 ◽  
Vol 510 ◽  
Author(s):  
S. Bhunia ◽  
D.N. Bose

AbstractThe effects of hydrogen passivation in undoped p-ZnTe single crystals were studied by photoluminescence (PL) and photoconductivity (PC) measurements. Samples were exposed to r.f hydrogen plasma at 250 °C for different durations. Before passivation PL peaks were observed at 2.06 eV, 1.47 eV, 1.33 eV and 1.06 eV. After 60 minutes exposure, samples showed strong band edge green luminescence at 2.37 eV due to an exciton bound to a Cu acceptor. Further exposure to plasma resulted in disappearance of 2.37eV and 2.34 eV peaks due to damage. In PC studies the dark current was found to decrease by a factor of 70 on 60 minutes passivation. From the temperature dependence of PC gain, the minority carrier lifetime τn, was found to go through a maximum of 4.5 × 10−7 sec at 220 K before passivation. After 60 minutes exposure, τn, remained constant at 4.5 × 10−7 sec for T > 220 K and decreased for T < 220 K. The activation energies of τn, were determined and show marked changes on passivation for T > 220 K. Comparison between PL and PC studies showed that the deep acceptor level OTe responsible for emission at 2.06 eV is passivated giving rise to strong band edge emission at 2.37 eV while emission due to the midgap impurity levels at 1.47, 1.33 and 1.05 eV remained unaffected. The thermal activation energies of the PL peaks have also been determined and allow the construction of a defect energy level diagram for ZnTe.


Author(s):  
В. Кажукаускас ◽  
Р. Гарбачаускас ◽  
С. Савицки

AbstractTlBr single crystals grown by the Bridgman–Stockbarger method are studied. It is established that frozen-conductivity effects manifest themselves under interband excitation by light at temperatures below 200 K. Herewith, clearly pronounced superlinear dependences of the induced photoconductivity on the strength of the applied electric field manifest themselves. The results of studying thermally stimulated conductivity evidence that these phenomena can be associated with the filling of trap states with thermal activation energies of 0.08–0.12 eV. This state can be removed due to thermal quenching at temperatures of ≳180 K because of the emptying of energy states with an activation energy of 0.63–0.65 eV filled after optical generation.


1995 ◽  
Vol 406 ◽  
Author(s):  
I. Kuskovsky ◽  
G. F. Neumark

AbstractPhotoluminescence (PL) and Hall measurements allow one to obtain important parameters of semiconductors, such as impurity concentrations, compensation, and activation energies (EA). Usual analyses of such data assume constant EA. However, it is well known that EA depends on free carrier and impurity concentrations, and thus on temperature, due to screening effects. We here analyze literature data on ZnSe:N using screening effects. An observed decrease of EA with temperature (from PL data) had been used to suggest an interstitial site for N. With inclusion of screening, we obtained good agreement with the data, so that the idea of interstitial N is not required. In applying the screening theory to Hall measurements, we obtained lower impurity concentrations than with use of a constant EA. It is also to be noted that we fit both optical and electrical data with this approach. We further suggest that screening is the cause of an observed difference between optically observed and thermal activation energies.


2001 ◽  
Vol 16 (1) ◽  
pp. 192-196 ◽  
Author(s):  
Seong-Ho Kim ◽  
Jung-Ho Moon ◽  
Jae-Hwan Park ◽  
Jae-Gwan Park ◽  
Yoonho Kim

The thermal activation energies for conduction of Nb-doped SrTiO3 grains and grain boundaries have been investigated by impedance spectroscopy. First, to observe the effect of electrode/SrTiO3 bulk interface, the varied impedances of SrTiO3 single crystal were measured with temperatures. The activation energy of an electrode/bulk interface was determined to be 1.3 eV, whereas that of bulk was 0.8 eV. When the impedances of Nb-doped SrTiO3 ceramics were measured, it was suggested that the more precise impedance values of a single grain and a single grain to grain junction be obtained using a microelectrode method. The activation energies for a grain, a grain boundary, and an electrode/bulk interface were determined to be about 0.8, 1.3, and 1.5 eV, respectively. From these measured results, it was suggested that the activation energy, 0.8 eV, measured in grain was originated from oxygen vacancies and the activation energy, 1.3 eV, in grain boundary was from strontium vacancies.


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