High-resolution TEM characterization of MOVPE-grown (111)-BP layer on hexagonal 6H (0001)-SiC
2005 ◽
Vol 244
(1-4)
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pp. 285-288
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2010 ◽
Vol 241
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pp. 012031
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2013 ◽
Vol 108
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pp. 204-208
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1983 ◽
Vol 41
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pp. 194-195
Keyword(s):
2011 ◽
Vol 04
(02)
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pp. 117-122
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