Temperature-dependent resistive switching behaviour of an oxide memristor

2021 ◽  
pp. 130451
Author(s):  
Karuna Kumari ◽  
S. Majumder ◽  
Ajay D. Thakur ◽  
S.J. Ray
Nanoscale ◽  
2018 ◽  
Vol 10 (42) ◽  
pp. 19711-19719 ◽  
Author(s):  
Fahmida Rahman ◽  
Taimur Ahmed ◽  
Sumeet Walia ◽  
Edwin Mayes ◽  
Sharath Sriram ◽  
...  

Reversible resistive switching behaviour is observed in MoOx memory devices, at relatively low set/reset voltages, with switching ratios exceeding 103.


MRS Advances ◽  
2018 ◽  
Vol 3 (33) ◽  
pp. 1943-1948 ◽  
Author(s):  
C. Strobel ◽  
T. Sandner ◽  
S. Strehle

AbstractMemristors represent an intriguing two-terminal device strategy potentially able to replace conventional memory devices as well as to support neuromorphic computing architectures. Here, we present the resistive switching behaviour of the sustainable and low-cost biopolymer chitosan, which can be extracted from natural chitin present for instance in crab exoskeletons. The biopolymer films were doped with Ag ions in varying concentrations and sandwiched between a bottom electrode such as fluorinated-tin-oxide and a silver top electrode. Silver-doped devices showed an overall promising resistive switching behaviour for doping concentrations between 0.5 to 1 wt% AgNO3. As bottom electrode fluorinated-tin-oxide, nickel, silver and titanium were studied and multiple write and erase cycles were recorded. However, the overall reproducibility and stability are still insufficient to support broader applicability.


2019 ◽  
Vol 7 (4) ◽  
pp. 843-852 ◽  
Author(s):  
Kui Zhou ◽  
Guanglong Ding ◽  
Chen Zhang ◽  
Ziyu Lv ◽  
Shenghuang Luo ◽  
...  

A memory device based on metal–oxo cluster-assembled materials demonstrates a redox-based resistive switching behaviour which is correlated with the migration of hydroxide ions with low activation energy.


Crystals ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 736
Author(s):  
Wei Yi ◽  
Jun Chen ◽  
Takashi Sekiguchi

Electron-beam-induced current (EBIC) and cathodoluminescence (CL) have been applied to investigate the electrical and optical behaviors of dislocations in SrTiO3. The electrical recombination activity and defect energy levels of dislocations have been deduced from the temperature-dependent EBIC measurement. Dislocations contributed to resistive switching were clarified by bias-dependent EBIC. The distribution of oxygen vacancies around dislocations has been obtained by CL mapping. The correlation between switching, dislocation and oxygen vacancies was discussed.


2013 ◽  
Vol 7 (4) ◽  
pp. 282-284 ◽  
Author(s):  
G. S. Tang ◽  
F. Zeng ◽  
C. Chen ◽  
S. Gao ◽  
H. D. Fu ◽  
...  

2017 ◽  
Vol 47 (2) ◽  
pp. 1620-1629 ◽  
Author(s):  
Srinu Rowtu ◽  
L. D. Varma Sangani ◽  
M. Ghanashyam Krishna

2017 ◽  
Vol 5 (8) ◽  
pp. 2153-2159 ◽  
Author(s):  
Fran Kurnia ◽  
Chunli Liu ◽  
Guangqing Liu ◽  
Rama K. Vasudevan ◽  
Sang Mo Yang ◽  
...  

Resistive switching behaviour is observed for GaP thin films. Conductive AFM and FORC-IV measurements show that the current is localised at grain boundaries. The switching mechanism is driven by Ga migration along the grain boundaries.


2012 ◽  
Vol 46 (4) ◽  
pp. 045103 ◽  
Author(s):  
E Hernández-Rodríguez ◽  
A Márquez-Herrera ◽  
E Zaleta-Alejandre ◽  
M Meléndez-Lira ◽  
W de la Cruz ◽  
...  

2014 ◽  
Vol 11 (11-12) ◽  
pp. 1611-1617 ◽  
Author(s):  
Jürgen Beister ◽  
Andre Wachowiak ◽  
André Heinzig ◽  
Jens Trommer ◽  
Thomas Mikolajick ◽  
...  

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