Optimum Detector Arrangements in the Stem for Thick Objects
Radiation damage is the main obstacle in achieving high resolution images of biological objects. Therefore it is desirable to indicate that imaging method which yields maximum information about a specific object for a given number N0 of incident electrons. The amount of useful information is determined by the signal to noise ratio. Applying difference techniques the contrast in the STEM can be varied arbitrarily (l). Although the subjective impression of the image quality may be improved by such a procedure the amount of information available will not be changed. Most of the present day STEMs operate in the dark field mode using an annular detector which collects all electrons scattered out of the illumination cone. The corresponding incoherent bright field image is obtained from the electrons which pass through the hole of the dark field detector.