Void-Lattice Formation in Natural Fluorite by Electron Irradiation

1976 ◽  
Vol 34 ◽  
pp. 614-615 ◽  
Author(s):  
L.E. Murr
Keyword(s):  
Electron Microscope ◽  
Electron Irradiation ◽  
Heavy Ion ◽  
High Energy ◽  
Stoichiometric Ratio ◽  
Direct Observations ◽  
Transmission Electron ◽  
Anion Vacancies ◽  
Cation And Anion Vacancies ◽  
Lattice Formation

The production of void lattices in metals as a result of displacement damage associated with high energy and heavy ion bombardment is now well documented. More recently, Murr has shown that a void lattice can be developed in natural (colored) fluorites observed in the transmission electron microscope. These were the first observations of a void lattice in an irradiated nonmetal, and the first, direct observations of color-center aggregates. Clinard, et al. have also recently observed a void lattice (described as a high density of aligned "pores") in neutron irradiated Al2O3 and Y2O3. In this latter work, itwas pointed out that in order that a cavity be formed,a near-stoichiometric ratio of cation and anion vacancies must aggregate. It was reasoned that two other alternatives to explain the pores were cation metal colloids and highpressure anion gas bubbles.Evans has proposed that void lattices result from the presence of a pre-existing impurity lattice, and predicted that the formation of a void lattice should restrict swelling in irradiated materials because it represents a state of saturation.

Biological X-ray Microanalysis: The Past, Present Practices, and Future Prospects

2001 ◽  
Vol 7 (2) ◽  
pp. 211-219 ◽  
Author(s):  
Patrick Echlin
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Transmission Electron Microscope ◽  
Low Voltage ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
X Ray ◽  
Ambient Temperatures ◽  
Advantages And Disadvantages ◽  
Transmission Electron

Abstract A brief description is given of the events surrounding the development of biological X-ray microanalysis during the last 30 years, with particular emphasis on the contribution made by research workers in Cambridge, UK. There then follows a broad review of some applications of biological X-ray microanalysis. A more detailed consideration is given to the main thrust of current procedures and applications that are, for convenience, considered as four different kinds of samples. Thin frozen dried sections which are analyzed at ambient temperatures in a transmission electron microscope (TEM); semithin frozen dried sections which are analyzed at low temperature in a scanning transmission electron microscope (STEM); thick frozen hydrated sections which are analyzed at low temperature in a scanning electron microscope (SEM), and bulk samples which are analyzed at low temperature in the same type of instrument. A brief outline is given of the advantages and disadvantages of performing low-voltage, low-temperature X-ray microanalysis on frozen hydrated bulk biological material. The article concludes with a consideration of alternative approaches to in situ analysis using either high-energy beams or visible and near-visible photons.

The Creation and Annealing of Heavy Ion Damage in Silicon

1987 ◽  
Vol 93 ◽  
Author(s):  
L. M. Howe ◽  
M. H. Rainville
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Distribution ◽  
High Resolution ◽  
Heavy Ion ◽  
High Energy ◽  
Transmission Electron ◽  
Ion Damage ◽  
Deposited Energy ◽  
Microscopy Techniques

ABSTRACTHigh resolution transmission electron microscopy techniques have been used to obtain information on the contrast, spatial distribution, size and annealing behaviour of the damaged regions produced within individual collision cascades by heavy ion (As, Sb and Bi) bombardment (10–120 KeV) of silicon with 1.0 × 1011 – 6.0 × 1011 ions cm−2. The fraction of the theoretical cascade volume occupied by a heavily damaged region steadily increased as the average deposited energy density within the cascade increased. At high energy densities, the visible damage produced in the main cascade consisted of a single, isolated damaged region. With decreasing values of (i.e. increasing ion implant energies), there was an increasing tendency for multiple damaged regions to be produced within the main cascade.

Crystalline to Amorphous Transformation of Fe3B By 1 MeV Electron Irradiation

1981 ◽  
Vol 7 ◽  
Author(s):  
A. Mogro-Campero ◽  
E.L. Hall ◽  
J.L. Walter ◽  
A.J. Ratkowski
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Irradiation ◽  
Room Temperature ◽  
Ion Irradiation ◽  
Rapid Quenching ◽  
Al Alloy ◽  
Bright Field ◽  
Transmission Electron ◽  
Diffraction Patterns

ABSTRACTSpecimens of amorphous Fe75B25 produced by rapid quenching from the melt were annealed to complete crystallization and subjected to 1 MeV electron irradiation in a transmission electron microscope at room temperature and at 130 K. The irradiation was interrupted at various intervals in order to obtain bright field images and diffraction patterns. The Fe3B crystals did not become amorphous at room temperature, even after damage levels of several dpa, whereas at 130 K the crystalline to amorphous transformation was observed to be complete at damage levels below 1 dpa. The results are combined with those of ion irradiation work on Fe3B; qualitative agreement is found between Fe3B and previous work on the Zr3Al alloy concerning their response to displacement damage by electron and ion irradiation.

A Hvem Study of the Electron Irradiated Defects in Nitrogen Doped FZ-Si Single Crystal

1989 ◽  
Vol 163 ◽  
Author(s):  
Gao Yuzun ◽  
T. Takeyama
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Irradiation ◽  
Defect Density ◽  
Migration Energy ◽  
Nitrogen Doped ◽  
Temperature Range ◽  
Transmission Electron ◽  
Excellent Property ◽  
P Type

AbstractHigh voltage transmission electron microscope (JEM-1000) has been used to investigate the electron irradiated defects in in p-type FZ-Si and nitrogen doped p-type FZ-Si. It was found that when the irradiated conditions were the saie ,the irradiated defects were easier to be produced in the FZ-Si than in nitrogen doped FZ-Si in the temperature range 573-773 K. The defect density was higher in the foraer. The migration energy of the vacancies in the temperature range 573-773 K was 0.34 and 0.58 eV for FZ-Si and nitrogen doped FZ-Si respectively. It seems to indicate that there was some interaction between vacancies and nitrogen atoms in the nitrogen doped FZ-Si. The results proved that the nitrogen doped FZ-Si has excellent property against electron irradiation.

scholarly journals PEMANFAATAN TEKNIK HEM UNTUK PENUMBUHAN CNT DARI GRAFIT MENGGUNAKAN Ni SEBAGAI KATALIS = UTILIZATION OF HEM TECHNIQUE FOR GROWTH OF CNT FROM GRAPHITE POWDERS BY USING Ni AS CATALYST

2016 ◽  
Vol 10 (1) ◽  
pp. 35-40
Author(s):  
Yunasfi . ◽  
P. Purwanto ◽  
Mashadi .
Keyword(s):  
Particle Size ◽  
Raman Spectroscopy ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Surface Area ◽  
Transmission Electron Microscope ◽  
Milling Time ◽  
High Energy ◽  
Milling Process ◽  
Transmission Electron

Utilization of HEM (high energy milling) technique for growth of CNT (carbon nanotube) from graphite powders by using Ni as catalyst was carried out. Milling process performed on a mixture of graphite powder and nickel powder (Ni-C powders) with the ratio of weight percent of 98%: 2%, with a variation of milling time between 25 up to 75 hours. Characterization using PSA (Powder Size Analyzer), SAA (Surface Area Analyzer), TEM (Transmission Electron Microscope) and Raman Spectroscopy performed to obtain information about particle size, surface area, morphology and the structure bonding of the milled powder respectively. The analysis results of Ni-C powders using PSA and SAA showed the smallest particle size and biggest surface area obtained after milling process for 50 hours, i.e. 80 nm and 705 m2/g, respectively. TEM observations revealed formation of flat fibers which quantity increased with increasing milling time. This flattened fiber behave as an initiator for the growth of CNTs. Ni-C powder milling for 50 hours results more clearly show the growth of CNTs. Analysis by Raman Spectroscopy showed two bands at 1582 cm−1 as a peak of G band and at 1350 cm-1 as a peak of D band. These spectra are typical for sp2 structure. The position of G band peak is close to 1600 cm-1 as the evidence of a change to nano-crystalline graphite. The highest intensity of D band shown in the milling process for 50 hours, which indicates that this milling time produces more graphite-like structure compared to other conditions, and is predicted good for growing CNTs. AbstrakPemanfaatan teknik HEM (High Energy Milling) untuk penumbuhan CNT (carbon nanotube) dari serbuk grafit dengan menggunakan Ni sebagai katalis. Proses milling dilakukan terhadap campuran serbuk grafit dan serbuk nikel (serbuk Ni-C) dengan perbandingan berat 98% : 2%, dengan variasi waktu milling antara 25-75 jam. Karakterisasi menggunakan fasilitas PSA (Particle Size Analyzer), SAA (Surface Area Analyzer), dan TEM (Transmission Electron Microscope) serta Raman Spektroscopy yang masing-masingnya untuk mendapatkan informasi tentang ukuran partikel, luas permukaan dan morfologi serta struktur ikatan serbuk hasil milling. Hasil analisis serbuk Ni-C dengan PSA dan SAA menunjukkan ukuran partikel paling kecil dan luas permukaan paling besar diperoleh setelah proses milling selama 50 jam, masing-masing 80 nm dan 705 m2/g. Pengamatan TEM menunjukkan serbuk-serbuk berbentuk serat pipih dengan kuantitas yang meningkat dengan bertambahnya waktu milling. Serat pipih ini perupakan cikal bakal penumbuhan CNT. Serbuk Ni-C hasil milling menunjukkan penumbuhan CNT terlihat lebih jelas setelah milling selama 50 jam. Hasil analisis dengan Raman Spectroscopy memperlihatkan puncak G band pada bilangan gelombang 1582 cm−1 yang merupakan spektrum untuk struktur sp2 dari grafit dan puncak D band pada bilangan gelombang 1350 cm-1 yang mungkin merupakan deformasi struktur grafit. Posisi puncak G band mendekati 1600 cm-1 menjadi bukti perubahan ke grafit nano kristal. Intensitas D band tertinggi ditunjukkan oleh sistem komposit Ni-C hasil proses milling selama 50 jam dan hal ini sebagai indikasi bahwa proses milling selama 50 jam terhadap sistem komposit Ni-C lebih berstruktur mirip grafit (graphitic-like material) dibanding kondisi lainnya dan diprediksi bagus untuk menumbuhkan CNT. Dengan demikian, waktu milling yang optimal untuk penumbuhan CNT dari serbuk grafit dengan menggunakan Ni sebagai katalis adalah adalah 50 jam.  

Energy-Filtered CTEM Image of MgO Smoke Particles

1985 ◽  
Vol 43 ◽  
pp. 410-411
Author(s):  
Y. Kondo ◽  
T. Yoshioka ◽  
T. Oikawa ◽  
Y. Kokubo ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Energy Resolution ◽  
Transmission Electron Microscope ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
High Energy Resolution ◽  
Energy Analyzer ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Sector Type

The energy filtered imaging technique has so far been carried out in a scanning transmission electron microscope (STEM) fitted with a sector type energy analyzer. The STEM has a disadvantage of low beam parallelity because it uses a convergent beam, while the conventional transmission electron microscope (CTEM) allows good phase contrast and diffraction contrast to be obtained because of the high parallelity of the beam, and allows also high resolution images to be obtained. The technique to obtain energy filtered CTEM images has thus far been carried out by a Castaing-Henry type filter or an Ω type filter. However, these filters have the disadvantage of lower energy resolution than conventional sector type energy analyzer at the present time. This paper reports energy filtered CTEM images of MgO smoke, obtained using a new scanning CTEM image technique and a high energy resolution sector type energy analyzer which can resolve bulk and surface plasmon energy.

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