Cross-section TEM observation of Ba2YCu3O7-x thin film on SrTiO3
The structure of Ba2YCu3O7-x(BYCO) has been almost completely analyzed using neutron,x-ray, and electron diffraction techniques. However, most of these analyses have studied bulk polycrystallinites or single crystals of BYCO, not the thin film structure. In this study, cross sections of thin annealed films on SrTiO3 substrate are observed using transmission electron microscopy (TEM). The crystal structure near the film/substrate interface is examined.The samples for TEM observation were cut from the same film which showed an onset temperature of 80 K. Samples for cross-sectional TEM observation were prepared by the ordinary method without using water. Milling was performed using a 4 kV Ar+ beam at an incident angle of about 15°. Observation was performed using a JEOL JEM 4000EX microscope at an accelerating voltage of 400 kV.A low magnification cross-sectional image of the BYCO annealed film is shown in Fig. 1. The film thickness is about 0.7 μm.