Interactive Nano Visualization for Science and Engineering Education-Scanning Probe Microscope on the Web

1998 ◽  
Vol 4 (S2) ◽  
pp. 46-47
Author(s):  
B.L. Ramakrishna ◽  
A. Razdan ◽  
J. Sun ◽  
E. Ong ◽  
A. A. Garcia
Keyword(s):  
High School ◽  
Engineering Education ◽  
Surface Characterization ◽  
Scanning Probe Microscope ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Science And Engineering ◽  
Probe Microscope ◽  
Science And Engineering Education ◽  
The Web

The integration of nano-science and technology concepts into upper-division high school and lower-division college curricula will require innovative educational approaches that will help students understand the structures and properties of matter on a scale below 100 nanometers, i.e., the nanoscale. This Interactive Nano-Visualization in Science and Engineering Education (IN-VSEE) project will create a consortium of university and industry researchers, community college and high school science faculty, computer scientists and museum educators with a common vision of creating an interactive World Wide Web (WWW) site to develop a new educational thrust based on remote operation of advanced microscopes and nanofabrication tools coupled to powerful surface characterization methods. The centerpiece of this project is the web-based operation of the revolutionary scanning probe microscope (SPM), which has evolved rapidly into a relatively simple, yet powerful, technique capable of imaging and manipulating materials at resolutions down to the atomic scale.

A Methodology for Integrating Information Technology in Software Engineering Education

2009 ◽  
pp. 204-222 ◽  
Author(s):  
Pankaj Kamthan
Keyword(s):  
Information Technology ◽  
Software Engineering ◽  
Engineering Education ◽  
Computer Science ◽  
Information Technologies ◽  
The Internet ◽  
Science And Engineering ◽  
Software Engineering Education ◽  
Science And Engineering Education ◽  
The Web

The discipline of software engineering has been gaining increasing significance in computer science and engineering education. In this chapter, the goal is to describe a systematic approach toward integrating information technologies in software engineering education (SEE), both inside and outside the classroom. A methodology for integrating IT is proposed and explored in the context of SEE, particularly related to the Internet and the Web; in this context, SEE supports a heterogeneous combination of objectivism and constructivism, and aims to be feasibility sensitive. In doing so, the prospects and concerns of incorporating IT in SEE are presented. The potential of integrating IT in SEE is illustrated by examples.

scholarly journals Nanoscience & Nanotechnology Concepts For High School Students: The Scanning Probe Microscope

2020 ◽  
Author(s):  
Venkat Chandrasekhar ◽  
Marcel Grdinic ◽  
Nathan Unterman ◽  
R.P.H. Chang ◽  
Emma Tevaarwerk
Keyword(s):  
High School ◽  
High School Students ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
School Students ◽  
Probe Microscope

scholarly journals Visualizing the ‘Invisible’

Leonardo ◽  
2015 ◽  
Vol 48 (1) ◽  
pp. 64-65
Author(s):  
Philip Moriarty
Keyword(s):  
Quantum Physics ◽  
Image Data ◽  
Scanning Probe Microscope ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Size Regime ◽  
Accurate Picture ◽  
Probe Microscope ◽  
The Invisible

The ability of scientists to image and manipulate matter at the (sub)atomic scale is a result of stunning advances in microscopy. Foremost amongst these was the invention of the scanning probe microscope, which, despite its classification as a microscope, does not rely on optics to generate images. Instead, images are produced via the interaction of an atomically sharp probe with a surface. Here the author considers to what extent those images represent an accurate picture of ‘reality’ at a size regime where quantum physics holds sway, and where the image data can be acquired and manipulated in a variety of ways.

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

Future Directions in International Science Education

1997 ◽  
Vol 3 (1) ◽  
pp. 233-239 ◽  
Author(s):  
Patrick Holmes
Keyword(s):  
Science Education ◽  
Engineering Education ◽  
Science And Engineering ◽  
Future Directions ◽  
International Dimension ◽  
The World ◽  
Scientists And Engineers ◽  
Science And Engineering Education

The international dimension of science and engineering education is of paramount importance and merits serious consideration of the coherent skill set that is required to allow scientists and engineers more readily to transport themselves and their work to other locations in the world. 

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