scholarly journals Deep learning-based denoising for improved dose efficiency in EDX tomography of nanoparticles

Nanoscale ◽  
2021 ◽  
Author(s):  
Alexander Skorikov ◽  
Wouter Heyvaert ◽  
Wiebke Albrecht ◽  
Daan Pelt ◽  
Sara Bals

The combination of energy-dispersive X-ray spectroscopy (EDX) and electron tomography is a powerful approach to retrieve the 3D elemental distribution in nanomaterials, providing an unprecedented level of information for complex,...

Author(s):  
S. Wu ◽  
A. Van Daele ◽  
W. Jacob ◽  
R. Gijbels ◽  
A. Verbeeck ◽  
...  

There is a considerable interest for the study of the elemental distribution and composition in silver halide photographic emulsions, particularly for the microanalysis of individual microcrystals. In this work, elemental distributions and contents of tabular and cubic silver halide microcrystals were obtained by backscattered electron imaging (BSEI), scanning transmission electron imaging (STEI), x-ray mapping and x-ray microanalysis in a scanning electron microscope (STEM) combined with energy-dispersive x-ray analysis (EDX).Several kinds of silver halide microcrystals were prepared, After removing the gelatin, repeated centrifugation and washing in distilled water, the grains were resuspended and dispersed onto carbon coated 50 mesh copper grids. All analyses were carried out on a JEOL 1200 EX electron microscope equipped with detectors for backscattered, secondary and transmitted electrons and an energy dispersive x-ray analysis system. An image processing system was used for acquiring and processing BSE images, STE images and x-ray maps. The role of the image processing computer system (IBAS Kontron) is twofold: it allows to optimize the acquisition conditions and to process the images afterwards.


2014 ◽  
Vol 17 (7) ◽  
pp. 1449-1459 ◽  
Author(s):  
Maznah Ismail ◽  
Nordiana Abdul Hadi ◽  
Rafiuz-Zaman Haroun ◽  
Siti Nor Asma Musa ◽  
Mustapha Umar Imam

Polymers ◽  
2021 ◽  
Vol 13 (20) ◽  
pp. 3504
Author(s):  
Imran Alam Moheet ◽  
Norhayati Luddin ◽  
Ismail Ab Rahman ◽  
Sam’an Malik Masudi ◽  
Thirumulu Ponnuraj Kannan ◽  
...  

One of the foremost missions in restorative dentistry is to discover a suitable material that can substitute lost and damaged tooth structure. To this date, most of the restorative materials utilized in dentistry are bio-inert. It is predicted that the addition of nano-HA-SiO2 to GIC matrix could produce a material with better ion-exchange between the restorative material and natural teeth. Therefore, the aim of the current study was to synthesize and investigate the transfer of specific elements (calcium, phosphorus, fluoride, silica, strontium, and alumina) between nano-hydroxyapatite-silica added GIC (nano-HA-SiO2-GIC) and human enamel and dentine. The novel nano-hydroxyapatite-silica (nano-HA-SiO2) was synthesized using one-pot sol-gel method and added to cGIC. Semi-quantitative energy dispersive X-ray (EDX) analysis was carried out to determine the elemental distribution of fluorine, silicon, phosphorus, calcium, strontium, and aluminum. Semi-quantitative energy dispersive X-ray (EDX) analysis was performed by collecting line-scans and dot-scans. The results of the current study seem to confirm the ionic exchange between nano-HA-SiO2-GIC and natural teeth, leading to the conclusion that increased remineralization may be possible with nano-HA-SiO2-GIC as compared to cGIC (Fuji IX).


2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Jihan Zhou ◽  
Matthew Taylor ◽  
Georgian A. Melinte ◽  
Ashwin J. Shahani ◽  
Chamila C. Dharmawardhana ◽  
...  

1995 ◽  
Vol 410 ◽  
Author(s):  
D. Manessis ◽  
H. Du ◽  
I. L. Singer ◽  
R. Larker

ABSTRACTSilicon oxynitride (Si2N2O) ceramics were oxidized in 1 atm dry oxygen at 11 00IC and 13000C. The oxidized samples were studied using x-ray photoelectron spectroscopy and crosssectional transmission electron microscopy in conjunction with energy dispersive x-ray analysis. TEM characterization revealed the chemical abruptness of the SiO2 and Si2N2O interface. Further investigation indicated the inclusions of residual SiO2 in Si2N2O, which contributed to the broad XPS elemental distribution in the oxide-substrate interface region.


Author(s):  
J.M. Titchmarsh

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.


Sign in / Sign up

Export Citation Format

Share Document