Sulphur-selenium compounds
Keyword(s):
X Ray
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The characterization of various mixtures obtained by fractional recrystallization of sulphur-selenium melts is described. Optical absorption spectra of thin films, mass spectra, and X-ray diffraction data reveal two distinct ranges of homogeneity, the break occurring at 14 at. % Se. The optical absorption edge of crystals containing less than 14 at. % Se varies linearly with composition. A direct optical transition to the conduction band of S8 and a transition due to trapped excitons are thought to contribute to the excessive width of this absorption edge.
2013 ◽
Vol 77
(7)
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pp. 2941-2953
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2017 ◽
Vol 20
(2)
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pp. 246-249
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2001 ◽
Vol 15
(09n10)
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pp. 291-297
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2016 ◽
Vol 654
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pp. 467-474
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1973 ◽
Vol 31
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pp. 132-133
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