Investigation of breakdown voltage degradation in low-voltage narrow gate trench MOSFET by edge termination optimization
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2014 ◽
Vol 778-780
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pp. 915-918
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1983 ◽
Vol 22
(Part 2, No. 8)
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pp. L539-L540
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2005 ◽
Vol 483-485
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pp. 793-796
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2013 ◽
Vol 347-350
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pp. 1506-1509
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