A review of EBSD: from rudimentary on line orientation measurements to high resolution elastic strain measurements over the past 30 years.

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

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On-line alignment and astigmatism correction using a TV and personal computer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146850 ◽

1993 ◽

Vol 51 ◽

pp. 202-203

Author(s):

F. Hosokawa ◽

Y. Kondo ◽

T. Honda ◽

Y. Ishida ◽

M. Kersker

Keyword(s):

High Resolution ◽

Personal Computer ◽

Block Diagram ◽

Incident Beam ◽

Ccd Camera ◽

Alignment Procedure ◽

Astigmatism Correction ◽

Transmission Electron ◽

Alignment System ◽

On Line

High-resolution transmission electron microscopy must attain utmost accuracy in the alignment of incident beam direction and in astigmatism correction, and that, in the shortest possible time. As a method to eliminate this troublesome work, an automatic alignment system using the Slow-Scan CCD camera has been introduced recently. In this method, diffractograms of amorphous images are calculated and analyzed to detect misalignment and astigmatism automatically. In the present study, we also examined diffractogram analysis using a personal computer and digitized TV images, and found that TV images provided enough quality for the on-line alignment procedure of high-resolution work in TEM. Fig. 1 shows a block diagram of our system. The averaged image is digitized by a TV board and is transported to a computer memory, then a diffractogram is calculated using an FFT board, and the feedback parameters which are determined by diffractogram analysis are sent to the microscope(JEM- 2010) through the RS232C interface. The on-line correction system has the following three modes.

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The Contribution of Intermediate-Voltage, High-Resolution Electron Microscopy In Materials Science: An Appraisal

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100181142 ◽

1990 ◽

Vol 48 (1) ◽

pp. 478-479

Author(s):

John L. Hutchison

Keyword(s):

High Resolution ◽

Materials Science ◽

High Resolution Electron Microscopy ◽

Optical Diffraction ◽

The Past ◽

Resolution Electron ◽

Extreme Sensitivity ◽

Electron Microscopes ◽

New Generation ◽

Small Metal Particles

Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.

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Study of Tip-Surface Interactions in Scanning Tunneling Microscopy (STM) by Reflection Electron Microscopy (REM)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180355 ◽

1990 ◽

Vol 48 (1) ◽

pp. 320-321

Author(s):

W. Lo ◽

J.C.H. Spence ◽

M. Kuwabara

Keyword(s):

High Resolution ◽

Elastic Strain ◽

Tunneling Current ◽

Surface Damage ◽

Surface Interactions ◽

Graphite Surface ◽

Scanning Tunneling ◽

Large Area ◽

Tunneling Microscopy ◽

High Resolution Tem

Work on the integration of STM with REM has demonstrated the usefulness of this combination. The STM has been designed to replace the side entry holder of a commercial Philips 400T TEM. It allows simultaneous REM imaging of the tip/sample region of the STM (see fig. 1). The REM technique offers nigh sensitivity to strain (<10−4) through diffraction contrast and high resolution (<lnm) along the unforeshortened direction. It is an ideal technique to use for studying tip/surface interactions in STM.The elastic strain associated with tunnelling was first imaged on cleaved, highly doped (S doped, 5 × 1018cm-3) InP(110). The tip and surface damage observed provided strong evidence that the strain was caused by tip/surface contact, most likely through an insulating adsorbate layer. This is consistent with the picture that tunnelling in air, liquid or ordinary vacuum (such as in a TEM) occurs through a layer of contamination. The tip, under servo control, must compress the insulating contamination layer in order to get close enough to the sample to tunnel. The contaminant thereby transmits the stress to the sample. Elastic strain while tunnelling from graphite has been detected by others, but never directly imaged before. Recent results using the STM/REM combination has yielded the first direct evidence of strain while tunnelling from graphite. Figure 2 shows a graphite surface elastically strained by the STM tip while tunnelling (It=3nA, Vtip=−20mV). Video images of other graphite surfaces show a reversible strain feature following the tip as it is scanned. The elastic strain field is sometimes seen to extend hundreds of nanometers from the tip. Also commonly observed while tunnelling from graphite is an increase in the RHEED intensity of the scanned region (see fig.3). Debris is seen on the tip and along the left edges of the brightened scan region of figure 4, suggesting that tip abrasion of the surface has occurred. High resolution TEM images of other tips show what appear to be attached graphite flakes. The removal of contamination, possibly along with the top few layers of graphite, seems a likely explanation for the observed increase in RHEED reflectivity. These results are not inconsistent with the “sliding planes” model of tunnelling on graphite“. Here, it was proposed that the force due to the tunnelling probe acts over a large area, causing shear of the graphite planes when the tip is scanned. The tunneling current is then modulated as the planes of graphite slide in and out of registry. The possiblity of true vacuum tunnelling from the cleaned graphite surface has not been ruled out. STM work function measurements are needed to test this.

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The Contribution of Phonon-Scattered Electrons to High-Resolution Electron Micrographs of Crystals

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100179063 ◽

1990 ◽

Vol 48 (1) ◽

pp. 62-63

Author(s):

H. Kohl

Keyword(s):

High Resolution ◽

Spherical Aberration ◽

High Resolution Electron Microscopy ◽

Static Potential ◽

Qualitative Comparison ◽

The Past ◽

Resolution Electron ◽

High Resolution Images ◽

High Resolution Electron Micrographs ◽

Extract Information

High-Resolution Electron Microscopy is able to determine structures of crystals and interfaces with a spatial resolution of somewhat less than 2 Å. As the image is strongly dependent on instrumental parameters, notably the defocus and the spherical aberration, the interpretation of micrographs necessitates a comparison with calculated images. Whereas one has often been content with a qualitative comparison of theory with experiment in the past, one is currently striving for quantitative procedures to extract information from the images [1,2]. For the calculations one starts by assuming a static potential, thus neglecting inelastic scattering processes.We shall confine the discussion to periodic specimens. All electrons, which have only been elastically scattered, are confined to very few directions, the Bragg spots. In-elastically scattered electrons, however, can be found in any direction. Therefore the influence of inelastic processes on the elastically (= Bragg) scattered electrons can be described as an attenuation [3]. For the calculation of high-resolution images this procedure would be correct only if we had an imaging energy filter capable of removing all phonon-scattered electrons. This is not realizable in practice. We are therefore forced to include the contribution of the phonon-scattered electrons.

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Q & A. Lisa Randall. [interview]

10.31219/osf.io/sjfxn ◽

2019 ◽

Author(s):

Adib Rifqi Setiawan

Keyword(s):

New York ◽

New York City ◽

Particle Physics ◽

Harvard University ◽

The Past ◽

Talent Search ◽

Cosmological Inflation ◽

On Line ◽

Theoretical Physicist ◽

Fundamental Forces

Lisa Randall is a theoretical physicist working in particle physics and cosmology. She was born in Queens, New York City, on June 18, 1962. Lisa Randall is an alumna of Hampshire College Summer Studies in Mathematics; and she graduated from Stuyvesant High School in 1980. She won first place in the 1980 Westinghouse Science Talent Search at the age of 18; and at Harvard University, Lisa Randall earned both a BA in physics (1983) and a PhD in theoretical particle physics (1987) under advisor Howard Mason Georgi III, a theoretical physicist. She is currently Frank B. Baird, Jr. Professor of Science on the physics faculty of Harvard University, where he has been for the past a decade. Her works concerns elementary particles and fundamental forces, and has involved the study of a wide variety of models, the most recent involving dimensions. She has also worked on supersymmetry, Standard Model observables, cosmological inflation, baryogenesis, grand unified theories, and general relativity. Consequently, her studies have made her among the most cited and influential theoretical physicists and she has received numerous awards and honors for her scientific endeavors. Since December 27, 2010 at 00:42 (GMT+7), Lisa Randall is Twitter’s user with account @lirarandall. “Thanks to new followers. Interesting how different it feels broadcasting on line vs.via book or article. Explanations? Pithiness? Rapidity?” is her first tweet.

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d4PDF: large-ensemble and high-resolution climate simulations for global warming risk assessment

Progress in Earth and Planetary Science ◽

10.1186/s40645-020-00367-7 ◽

2020 ◽

Vol 7 (1) ◽

Author(s):

Masayoshi Ishii ◽

Nobuhito Mori

Keyword(s):

Risk Assessment ◽

Global Warming ◽

High Resolution ◽

Climate Changes ◽

Future Climate ◽

Atmospheric Models ◽

Large Ensemble ◽

Past Climate ◽

The Past ◽

Climate Simulations

Abstract A large-ensemble climate simulation database, which is known as the database for policy decision-making for future climate changes (d4PDF), was designed for climate change risk assessments. Since the completion of the first set of climate simulations in 2015, the database has been growing continuously. It contains the results of ensemble simulations conducted over a total of thousands years respectively for past and future climates using high-resolution global (60 km horizontal mesh) and regional (20 km mesh) atmospheric models. Several sets of future climate simulations are available, in which global mean surface air temperatures are forced to be higher by 4 K, 2 K, and 1.5 K relative to preindustrial levels. Nonwarming past climate simulations are incorporated in d4PDF along with the past climate simulations. The total data volume is approximately 2 petabytes. The atmospheric models satisfactorily simulate the past climate in terms of climatology, natural variations, and extreme events such as heavy precipitation and tropical cyclones. In addition, data users can obtain statistically significant changes in mean states or weather and climate extremes of interest between the past and future climates via a simple arithmetic computation without any statistical assumptions. The database is helpful in understanding future changes in climate states and in attributing past climate events to global warming. Impact assessment studies for climate changes have concurrently been performed in various research areas such as natural hazard, hydrology, civil engineering, agriculture, health, and insurance. The database has now become essential for promoting climate and risk assessment studies and for devising climate adaptation policies. Moreover, it has helped in establishing an interdisciplinary research community on global warming across Japan.

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Super Resolution Digital Image Correlation (SR-DIC): an Alternative to Image Stitching at High Magnifications

Experimental Mechanics ◽

10.1007/s11340-021-00729-2 ◽

2021 ◽

Author(s):

R. S. Hansen ◽

D. W. Waldram ◽

T. Q. Thai ◽

R. B. Berke

Keyword(s):

High Resolution ◽

Digital Image Correlation ◽

Spatial Resolution ◽

Digital Image ◽

Super Resolution ◽

Image Correlation ◽

Low Resolution ◽

Strain Measurements ◽

Resolution Image ◽

High Resolution Image

Abstract Background High-resolution Digital Image Correlation (DIC) measurements have previously been produced by stitching of neighboring images, which often requires short working distances. Separately, the image processing community has developed super resolution (SR) imaging techniques, which improve resolution by combining multiple overlapping images. Objective This work investigates the novel pairing of super resolution with digital image correlation, as an alternative method to produce high-resolution full-field strain measurements. Methods First, an image reconstruction test is performed, comparing the ability of three previously published SR algorithms to replicate a high-resolution image. Second, an applied translation is compared against DIC measurement using both low- and super-resolution images. Third, a ring sample is mechanically deformed and DIC strain measurements from low- and super-resolution images are compared. Results SR measurements show improvements compared to low-resolution images, although they do not perfectly replicate the high-resolution image. SR-DIC demonstrates reduced error and improved confidence in measuring rigid body translation when compared to low resolution alternatives, and it also shows improvement in spatial resolution for strain measurements of ring deformation. Conclusions Super resolution imaging can be effectively paired with Digital Image Correlation, offering improved spatial resolution, reduced error, and increased measurement confidence.

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