The interface state density characterization by temperature-dependent capacitance–conductance–frequency measurements in Au/Ni/n-GaN structures
2015 ◽
Vol 2
(9)
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pp. 096304
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2020 ◽
Vol 31
(23)
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pp. 21260-21271
2018 ◽
Vol 924
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pp. 285-288
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2017 ◽
Vol 34
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pp. 097301
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2002 ◽
Vol 31
(2)
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pp. 119-123
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2013 ◽
Vol 133
(7)
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pp. 1279-1284
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1998 ◽
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2014 ◽
Vol 778-780
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pp. 631-634
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2017 ◽
Vol 254
(8)
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pp. 1600691
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