Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy
2010 ◽
Vol 59
(4)
◽
pp. 251-261
◽
2013 ◽
pp. 287-331
◽
2000 ◽
Vol 18
(1)
◽
pp. 440
◽
1974 ◽
Vol 32
◽
pp. 514-515
1978 ◽
Vol 36
(2)
◽
pp. 82-83
◽
1982 ◽
Vol 40
◽
pp. 722-723
◽
1985 ◽
Vol 46
(C8)
◽
pp. C8-491-C8-494
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