Synchrotron radiation biomedical imaging and radiotherapy: from the UK to the Antipodes

Although the general public might think of ‘X-rays’ as they are applied to imaging (radiography) and for the treatment of disease (radiotherapy), the use of synchrotron radiation (SR) X-ray beams in these areas of science was a minor activity 50 years ago. The largest gains in science from SR were seen to be in those areas where signals were weakest in laboratory instruments, such as X-ray diffraction and spectroscopy. As the qualities of SR X-rays were explored and more areas of science adopted SR-based methods, this situation changed. About 30 years ago, the clinical advantages of using SR X-ray beams for radiography, radiotherapy and clinical diagnostics started to be investigated. In the UK, a multi-disciplinary group, consisting of clinicians, medical physicists and other scientists working mainly with the Synchrotron Radiation Source (SRS) in Cheshire, started to investigate techniques for diagnosis and potentially a cure for certain cancers. This preliminary work influenced the design of new facilities being constructed around the world, in particular the Imaging and Medical Beam Line on the Australian Synchrotron in Melbourne. Two authors moved from the UK to Australia to participate in this exciting venture. The following is a personal view of some of the highlights of the early-year SRS work, following through to the current activities on the new facility in Australia. This article is part of the theme issue ‘Fifty years of synchrotron science: achievements and opportunities’.

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Applications of High-Resolution Powder X-Ray Diffraction

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.130.7 ◽

2007 ◽

Vol 130 ◽

pp. 7-14 ◽

Cited By ~ 4

Author(s):

Andrew N. Fitch

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

Powder Diffraction ◽

X Rays ◽

X Ray Diffraction ◽

Crystalline Materials ◽

X Ray ◽

Structural Characterisation ◽

Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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Analysis of stresses and crystal structure in the surface layer of hexagonal polycrystalline materials: a new methodology based on grazing incidence diffraction

Journal of Applied Crystallography ◽

10.1107/s1600576715021810 ◽

2016 ◽

Vol 49 (1) ◽

pp. 85-102 ◽

Cited By ~ 7

Author(s):

Marianna Marciszko ◽

Andrzej Baczmański ◽

Chedly Braham ◽

Mirosław Wróbel ◽

Wilfrid Seiler ◽

...

Keyword(s):

Synchrotron Radiation ◽

Stress Gradient ◽

Grazing Incidence ◽

Lattice Parameter ◽

Polycrystalline Materials ◽

X Rays ◽

X Ray Diffraction ◽

Surface Layers ◽

X Ray ◽

Good Agreement

The multireflection grazing-incidence X-ray diffraction (MGIXD) method is commonly used to determine a stress gradient in thin surface layers (about 1–20 µm for metals). In this article, the development of MGIXD to enable the determination not only of stresses but also of thec/aratio and thea0strain-free lattice parameter in hexagonal polycrystalline materials is presented and tested. The new procedure was applied for the results of measurements performed using a laboratory X-ray diffractometer and synchrotron radiation. The evolution of stresses and lattice parameters with depth was determined for Ti and Ti-alloy samples subjected to different mechanical surface treatments. A very good agreement of the results obtained using three different wavelengths of synchrotron radiation as well as classical X-rays (CuKα radiation) was found.

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Estimation of Order Parameter and Spin Moment of Fe3Pt by White X-Ray Diffraction Method

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.596.3 ◽

2013 ◽

Vol 596 ◽

pp. 3-7

Author(s):

Kenta Hiiragi ◽

Masahiro Naito ◽

Hiromi Watanabe ◽

Hiroshi Maruyama ◽

Masahisa Ito

Keyword(s):

Synchrotron Radiation ◽

Diffraction Data ◽

Order Parameter ◽

Diffraction Method ◽

Superlattice Reflection ◽

Spin Moment ◽

X Rays ◽

X Ray Diffraction ◽

X Ray ◽

Pt Alloy

Diffraction intensities of a single crystal of Fe3Pt alloy have been measured by using white X-rays of synchrotron radiation. The observed intensities have been compared with the calculated ones for fundamental and superlattice reflections. By normalizing the calculated intensities of fundamental reflections to the observed ones and evaluating the ratio of the observed intensity of superlattice reflection to the calculated ones, we have estimated the order parameter as 0.82±0.03. The obtained order parameter has been applied to an analysis of the X-ray magnetic diffraction data to estimate the spin moment of Fe and Pt atoms in this alloy.

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X-rays in art and archaeology: An overview

Powder Diffraction ◽

10.1154/1.1649963 ◽

2004 ◽

Vol 19 (1) ◽

pp. 3-11 ◽

Cited By ~ 51

Author(s):

M. Schreiner ◽

B. Frühmann ◽

D. Jembrih-Simbürger ◽

R. Linke

Keyword(s):

Synchrotron Radiation ◽

Diffraction Analysis ◽

Crystalline Structure ◽

Manufacturing Process ◽

Standard Technique ◽

Material Composition ◽

X Rays ◽

X Ray Diffraction ◽

X Ray

An overview of the techniques used in art and archaeology is presented and the applicability of X-ray radiography, X-ray fluorescence (XRF), and X-ray diffraction analysis (XRD) as a tool for nondestructive investigations of objects of art and archaeology is discussed. X-ray radiography, for example, is a standard technique widely used and accepted by art historians, archaeologists, curators, and conservators as this method enables information about the manufacturing process and the condition of an object without “touching” the artifact. XRF and XRD enable a nondestructive determination of the material composition of artifacts and the determination of the crystalline structure of the components too. Air path systems and instruments with the micro-beam of X-ray and synchrotron radiation were applied for the analysis of easel paintings, pigments in paint layers, glass artifacts, and coins.

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X-ray diffraction properties of curved crystal diffractors

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133308 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1734-1735

Author(s):

W. Z. Chang ◽

D. B. Wittry

Keyword(s):

Diffraction Theory ◽

X Rays ◽

Diffraction Image ◽

X Ray Diffraction ◽

Rocking Curve ◽

X Ray ◽

Bent Crystal ◽

Diffraction Geometry ◽

Crystal Parameter ◽

Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

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Charge order of bismuth ions and nature of chemical bonds in double perovskite-type oxide BaBiO3 visualized by synchrotron radiation X-ray diffraction

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abb00d ◽

2020 ◽

Vol 59 (9) ◽

pp. 095505

Author(s):

Qing Zhao ◽

Tomohiro Abe ◽

Chikako Moriyoshi ◽

Sangwook Kim ◽

Ayako Taguchi ◽

...

Keyword(s):

Synchrotron Radiation ◽

Charge Order ◽

Double Perovskite ◽

Chemical Bonds ◽

X Ray Diffraction ◽

X Ray ◽

Perovskite Type Oxide ◽

Perovskite Type

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X-ray and Neutron Study on the Structure of Hydrous SiO2 Glass up to 10 GPa

Minerals ◽

10.3390/min10010084 ◽

2020 ◽

Vol 10 (1) ◽

pp. 84 ◽

Cited By ~ 2

Author(s):

Satoru Urakawa ◽

Toru Inoue ◽

Takanori Hattori ◽

Asami Sano-Furukawa ◽

Shinji Kohara ◽

...

Keyword(s):

Oxide Glasses ◽

Void Space ◽

X Ray Diffraction ◽

Amorphous Sio2 ◽

Sio2 Glass ◽

X Ray ◽

X Ray Scattering ◽

Medium Range ◽

Two Phases ◽

A Minor

The structure of hydrous amorphous SiO2 is fundamental in order to investigate the effects of water on the physicochemical properties of oxide glasses and magma. The hydrous SiO2 glass with 13 wt.% D2O was synthesized under high-pressure and high-temperature conditions and its structure was investigated by small angle X-ray scattering, X-ray diffraction, and neutron diffraction experiments at pressures of up to 10 GPa and room temperature. This hydrous glass is separated into two phases: a major phase rich in SiO2 and a minor phase rich in D2O molecules distributed as small domains with dimensions of less than 100 Å. Medium-range order of the hydrous glass shrinks compared to the anhydrous SiO2 glass by disruption of SiO4 linkage due to the formation of Si–OD deuterioxyl, while the response of its structure to pressure is almost the same as that of the anhydrous SiO2 glass. Most of D2O molecules are in the small domains and hardly penetrate into the void space in the ring consisting of SiO4 tetrahedra.

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Current status of the studies of x-ray diffraction on tungsten during pulsed heat loads at the scattering station «plasma» at the VEPP-4 source of synchrotron radiation

10.1063/5.0030577 ◽

2020 ◽

Author(s):

Sergey Kazantsev ◽

Aleksey Arakcheev ◽

Oleg Evdokov ◽

Lev Shekhtman ◽

Boris Tolochko ◽

...

Keyword(s):

Synchrotron Radiation ◽

Current Status ◽

X Ray Diffraction ◽

X Ray ◽

Heat Loads

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X-ray imaging of silicon die within fully packaged semiconductor devices

Powder Diffraction ◽

10.1017/s088571562100021x ◽

2021 ◽

pp. 1-7

Author(s):

Brian K. Tanner ◽

Patrick J. McNally ◽

Andreas N. Danilewsky

Keyword(s):

Synchrotron Radiation ◽

Feasibility Studies ◽

Monochromatic Radiation ◽

X Ray Diffraction ◽

Divergent Beam ◽

X Ray ◽

X Ray Imaging ◽

Setting Process ◽

Diffraction Imaging ◽

Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

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