Theory of moiré fringes on X-ray diffraction topographs of bicrystals

1999 ◽  
Vol 55 (3) ◽  
pp. 413-422 ◽  
Author(s):  
Michael Ohler ◽  
Jürgen Härtwig
Keyword(s):  
Optical Properties ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Moiré Fringes ◽  
Diffraction Geometry

The theory of moiré fringes on X-ray diffraction topographs of bicrystals is derived from the dynamical theory of X-ray diffraction for the reflection (Bragg) and the transmission (Laue) case. The influence on the moiré fringes of the diffraction geometry, of the geometry of the sample, of its optical properties and of the topographic method is investigated. The perfect-crystal theory is also expanded to weakly deformed bicrystals.

Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer

1998 ◽  
Vol 5 (3) ◽  
pp. 967-968 ◽  
Author(s):  
Keiichi Hirano ◽  
Atsushi Momose
Keyword(s):  
Phase Shift ◽  
Silicon Crystal ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bragg Geometry

The phase shift of forward-diffracted X-rays by a perfect crystal is discussed on the basis of the dynamical theory of X-ray diffraction. By means of a triple Laue-case X-ray interferometer, the phase shift of forward-diffracted X-rays by a silicon crystal in the Bragg geometry was investigated.

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. I. Semi-dynamical model

2020 ◽  
Vol 76 (1) ◽  
pp. 45-54
Author(s):  
V. B. Molodkin ◽  
S. I. Olikhovskii ◽  
S. V. Dmitriev ◽  
A. I. Nizkova ◽  
V. V. Lizunov
Keyword(s):  
Silicon Crystal ◽  
Azimuthal Angle ◽  
Dynamical Theory ◽  
Bragg Diffraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Diffraction Geometry ◽  
Coulomb Type ◽  
Analytical Expressions

The analytical expressions for the coherent and diffuse components of the integrated reflection coefficient are considered in the case of asymmetric Bragg diffraction geometry for a single crystal of arbitrary thickness, which contains randomly distributed Coulomb-type defects. The possibility to choose the combinations of diffraction conditions optimal for characterizing defects of several types by accounting for dynamical effects in the integrated coherent and diffuse scattering intensities, i.e. primary extinction and anomalous absorption, has been analysed based on the statistical dynamical theory of X-ray diffraction by imperfect crystals. The measured integrated reflectivity dependencies of the imperfect silicon crystal on azimuthal angle were fitted to determine the diffraction parameters characterizing defects in the sample using the proposed formulas in semi-dynamical and semi-kinematical approaches.

THE SIMULATION OF MODULATED PENDELLÖSUNG FRINGES OF PERFECT CRYSTALS FOR SPHERICAL X-RAY WAVE

1989 ◽  
Vol 03 (04) ◽  
pp. 319-323
Author(s):  
S.S. JIANG ◽  
Y. QIU
Keyword(s):  
Theoretical Calculation ◽  
Fringe Pattern ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
Experimental Result ◽  
X Ray Diffraction ◽  
Fringe Visibility ◽  
X Ray ◽  
Computer Based ◽  
Polarization States

The modulation in Pendellösung fringe visibility in perfect crystal is due to the interference between σ and π polarization states of X-ray wave. It is simulated by superposition of two polarization states by computer based on spherical X-ray wave dynamical theory and compared with fringe pattern on X-ray diffraction section topograph. It is found that the agreement between experimental result and theoretical calculation is satisfactory.

A study on the limit of application of kinematical theory of X-ray diffraction

2020 ◽  
Vol 235 (11) ◽  
pp. 523-531
Author(s):  
Diego Felix Dias ◽  
José Marcos Sasaki
Keyword(s):  
Critical Thickness ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
Bragg Angle ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
Linear Absorption ◽  
X Ray ◽  
Integrated Intensities ◽  
Kinematical Theory

AbstractIn this work, the limit of application of the kinematical theory of X-ray diffraction was calculate integrated intensities was evaluated as a function of perfect crystal thickness, when compared with the Ewald–Laue dynamical theory. The percentual difference between the dynamical and kinematical integrated intensities was calculated as a function of unit cell volume, Bragg angle, wavelength, module, and phase of structure factor and linear absorption coefficient. A critical thickness was defined to be the value for which the intensities differ 5%. We show that this critical thickness is 13.7% of the extinction length, which a specific combination of the parameters mentioned before. Also, we find a general expression, for any percentage of the difference between both theories, to determine the validity of the application of the kinematical theory. Finally, we also showed that the linear absorption decreases this critical thickness.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

scholarly journals Study on the Electrical, Structural, Chemical and Optical Properties of PVD Ta(N) Films Deposited with Different N2 Flow Rates

Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 937
Author(s):  
Yingying Hu ◽  
Md Rasadujjaman ◽  
Yanrong Wang ◽  
Jing Zhang ◽  
Jiang Yan ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Optical Properties ◽  
Photoelectron Spectroscopy ◽  
Crystal Size ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Flow Rates ◽  
X Ray ◽  
N2 Flow Rate

By reactive DC magnetron sputtering from a pure Ta target onto silicon substrates, Ta(N) films were prepared with different N2 flow rates of 0, 12, 17, 25, 38, and 58 sccm. The effects of N2 flow rate on the electrical properties, crystal structure, elemental composition, and optical properties of Ta(N) were studied. These properties were characterized by the four-probe method, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE). Results show that the deposition rate decreases with an increase of N2 flows. Furthermore, as resistivity increases, the crystal size decreases, the crystal structure transitions from β-Ta to TaN(111), and finally becomes the N-rich phase Ta3N5(130, 040). Studying the optical properties, it is found that there are differences in the refractive index (n) and extinction coefficient (k) of Ta(N) with different thicknesses and different N2 flow rates, depending on the crystal size and crystal phase structure.

scholarly journals Structural and optical properties of SnO2–Al2O3 nanocomposite synthesized via sol-gel route

2015 ◽  
Vol 33 (4) ◽  
pp. 714-718 ◽  
Author(s):  
Neeraj K. Mishra ◽  
Chaitnaya Kumar ◽  
Amit Kumar ◽  
Manish Kumar ◽  
Pratibha Chaudhary ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Properties ◽  
Sol Gel ◽  
Physical Interaction ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Sensing Applications ◽  
Scanning Electron

AbstractA nanocomposite of 0.5SnO2–0.5Al2O3 has been synthesized using a sol-gel route. Structural and optical properties of the nanocomposite have been discussed in detail. Powder X-ray diffraction and scanning electron microscopy with energy-dispersive X-ray diffraction spectroscopy confirm the phase purity and the particle size of the 0.5SnO2–0.5Al2O3 nanocomposite (13 to 15 nm). The scanning electron microscopy also confirms the porosity in the sample, useful in sensing applications. The FT-IR analysis confirms the presence of physical interaction between SnO2 and Al2O3 due to the slight shifting and broadening of characteristic bands. The UV-Vis analysis confirms the semiconducting nature because of direct transition of electrons into the 0.5SnO2–0.5Al2O3 nanocomposites.

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