Validation of aGeant4model of the X-ray fluorescence microprobe at the Australian Synchrotron

2015 ◽  
Vol 22 (2) ◽  
pp. 354-365 ◽  
Author(s):  
Matthew Richard Dimmock ◽  
Martin Daly de Jonge ◽  
Daryl Lloyd Howard ◽  
Simon Alexander James ◽  
Robin Kirkham ◽  
...  

AGeant4Monte Carlo simulation of the X-ray fluorescence microprobe (XFM) end-station at the Australian Synchrotron has been developed. The simulation is required for optimization of the scan configuration and reconstruction algorithms. As part of the simulation process, a Gaussian beam model was developed. Experimental validation of this simulation has tested the efficacy for use of the low-energy physics models inGeant4for this synchrotron-based technique. The observed spectral distributions calculated in the 384 pixel Maia detector, positioned in the standard back-scatter configuration, were compared with those obtained from experiments performed at three incident X-ray beam energies: 18.5, 11.0 and 6.8 keV. The reduced χ-squared (\chi^{2}_{\rm{red}}) was calculated for the scatter and fluorescence regions of the spectra and demonstrates that the simulations successfully reproduce the scatter distributions. Discrepancies were shown to occur in the multiple-scatter tail of the Compton continuum. The model was shown to be particularly sensitive to the impurities present in the beryllium window of the Maia detector and their concentrations were optimized to improve the \chi^{2}_{\rm{red}} parameterization in the low-energy fluorescence regions of the spectra.

Author(s):  
Wenbing Yun ◽  
Steve Wang ◽  
David Scott ◽  
Kenneth W. Nill ◽  
Waleed S. Haddad

Abstract A high-resolution table-sized x-ray nanotomography (XRMT) tool has been constructed that shows the promise of nondestructively imaging the internal structure of a full IC stack with a spatial resolution better than 100 nm. Such a tool can be used to detect, localize, and characterize buried defects in the IC. By collecting a set of X-ray projections through the full IC (which may include tens of micrometers of silicon substrate and several layers of Cu interconnects) and applying tomographic reconstruction algorithms to these projections, a 3D volumetric reconstruction can be obtained, and analyzed for defects using 3D visualization software. XRMT is a powerful technique that will find use in failure analysis and IC process development, and may facilitate or supplant investigations using SEM, TEM, and FIB tools, which generally require destructive sample preparation and a vacuum environment.


2021 ◽  
Vol 11 (10) ◽  
pp. 4349
Author(s):  
Tianzhong Xiong ◽  
Wenhua Ye ◽  
Xiang Xu

As an important part of pretreatment before recycling, sorting has a great impact on the quality, efficiency, cost and difficulty of recycling. In this paper, dual-energy X-ray transmission (DE-XRT) combined with variable gas-ejection is used to improve the quality and efficiency of in-line automatic sorting of waste non-ferrous metals. A method was proposed to judge the sorting ability, identify the types, and calculate the mass and center-of-gravity coordinates according to the shading of low-energy, the line scan direction coordinate and transparency natural logarithm ratio of low energy to high energy (R_value). The material identification was satisfied by the nearest neighbor algorithm of effective points in the material range to the R_value calibration surface. The flow-process of identification was also presented. Based on the thickness of the calibration surface, the material mass and center-of-gravity coordinates were calculated. The feasibility of controlling material falling points by variable gas-ejection was analyzed. The experimental verification of self-made materials showed that identification accuracy by count basis was 85%, mass and center-of-gravity coordinates calculation errors were both below 5%. The method proposed features high accuracy, high efficiency, and low operation cost and is of great application value even to other solid waste sorting, such as plastics, glass and ceramics.


Author(s):  
Asahina Shunsuke ◽  
Takahashi Hideyuki ◽  
Takakura Masaru ◽  
Ferdi Schüth ◽  
Terasaki Osamu

1975 ◽  
Vol 27 (12) ◽  
pp. 704-706 ◽  
Author(s):  
A. Lurio ◽  
W. Reuter
Keyword(s):  

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