Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFETs
1995 ◽
Vol 42
(8)
◽
pp. 1467-1472
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Keyword(s):
Keyword(s):
2017 ◽
Vol 12
(2)
◽
pp. 62-70
Keyword(s):
2000 ◽
Vol 14
(07)
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pp. 751-760
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2011 ◽
Vol 20
(01)
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pp. 161-170
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2002 ◽
Vol 25
(2)
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pp. 161-167
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2002 ◽
Vol 41
(Part 1, No. 3A)
◽
pp. 1279-1283
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Keyword(s):
1995 ◽
pp. 247-252
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Keyword(s):