Pull-in behavior and multistability of a curved microbeam actuated by a distributed electrostatic force

2015 ◽

Vol 471 (2177) ◽

pp. 20150072 ◽

Cited By ~ 16

Author(s):

X. Chen ◽

S. A. Meguid

Keyword(s):

Electrostatic Force ◽

Couple Stress Theory ◽

Beam Theory ◽

Intermolecular Forces ◽

Modified Couple Stress Theory ◽

Casimir Forces ◽

Governing Equations ◽

Stress Theory ◽

Fringing Field ◽

Curved Microbeam

In this paper, the snap-through buckling of an initially curved microbeam subject to an electrostatic force, accounting for fringing field effect, is investigated. The general governing equations of the curved microbeam are developed using Euler–Bernoulli beam theory and used to develop a new criterion for the snap-through buckling of that beam. The size effect of the microbeam is accounted for using the modified couple stress theory, and intermolecular effects, such as van der Waals and Casimir forces, are also included in our snap-through formulations. The snap-through governing equations are solved using Galerkin decomposition of the deflection. The results of our work enable us to carefully characterize the snap-through behaviour of the initially curved microbeam. They further reveal the significant effect of the beam size, and to a much lesser extent, the effect of fringing field and intermolecular forces, upon the snap-through criterion for the curved beam.

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Enhanced type I photoreaction of indocyanine green via electrostatic-force-driven aggregation

Nanoscale ◽

10.1039/d0nr01208d ◽

2020 ◽

Vol 12 (17) ◽

pp. 9517-9523 ◽

Cited By ~ 3

Author(s):

Huizhen Fan ◽

Yu Fan ◽

Wenna Du ◽

Rui Cai ◽

Xinshuang Gao ◽

...

Keyword(s):

Mesoporous Silica ◽

Indocyanine Green ◽

Electrostatic Force ◽

Type I ◽

Positively Charged

ICG forms aggregates in positively charged mesoporous silica, which show an enhanced type I photoreaction pathway.

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Enhancements of Non-contact Measurements of Electrical Waveforms on the Proximity of a Signal Surface Using Groups of Pulses

ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2002p0483 ◽

2002 ◽

Author(s):

Fenglei Du ◽

Greg Bridges ◽

D.J. Thomson ◽

Rama R. Goruganthu ◽

Shawn McBride ◽

...

Keyword(s):

Integrated Circuits ◽

Integrated Circuit ◽

Signal To Noise Ratio ◽

Electrostatic Force ◽

Single Pulse ◽

Electric Signal ◽

Measurement Instruments ◽

Cycle Times ◽

Force Microscopy ◽

And Performance

Abstract With the ever-increasing density and performance of integrated circuits, non-invasive, accurate, and high spatial and temporal resolution electric signal measurement instruments hold the key to performing successful diagnostics and failure analysis. Sampled electrostatic force microscopy (EFM) has the potential for such applications. It provides a noninvasive approach to measuring high frequency internal integrated circuit signals. Previous EFMs operate using a repetitive single-pulse sampling approach and are inherently subject to the signal-to-noise ratio (SNR) problems when test pattern duty cycle times become large. In this paper we present an innovative technique that uses groups of pulses to improve the SNR of sampled EFM systems. The approach can easily provide more than an order-ofmagnitude improvement to the SNR. The details of the approach are presented.

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Direct imaging method of frequency response of capacitance in dual bias modulation electrostatic force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ab9ae0 ◽

2020 ◽

Vol 59 (7) ◽

pp. 078001

Author(s):

Ryota Fukuzawa ◽

Takuji Takahashi

Keyword(s):

Frequency Response ◽

Electrostatic Force ◽

Electrostatic Force Microscopy ◽

Imaging Method ◽

Direct Imaging ◽

Force Microscopy

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Thermal Noise Decoupling of Micro-Newton Thrust Measured in a Torsion Balance

Symmetry ◽

10.3390/sym13081357 ◽

2021 ◽

Vol 13 (8) ◽

pp. 1357

Author(s):

Linxiao Cong ◽

Jianchao Mu ◽

Qian Liu ◽

Hao Wang ◽

Linlin Wang ◽

...

Keyword(s):

Thermal Noise ◽

Rotation Axis ◽

Electrostatic Force ◽

Thermal Control ◽

Positive Temperature Coefficient ◽

Torsion Balance ◽

Positive Temperature ◽

Thermal Drift ◽

Low Thrust ◽

Z Domain

The space gravitational wave detection and drag free control requires the micro-thruster to have ultra-low thrust noise within 0.1 mHz–0.1 Hz, which brings a great challenge to calibration on the ground because it is impossible to shield any spurious couplings due to the asymmetry of torsion balance. Most thrusters dissipate heat during the test, making the rotation axis tilt and components undergo thermal drift, which is hysteretic and asymmetric for micro-Newton thrust measurement. With reference to LISA’s research and coming up with ideas inspired from proportional-integral-derivative (PID) control and multi-timescale (MTS), this paper proposes to expand the state space of temperature to be applied on the thrust prediction based on fine tree regression (FTR) and to subtract the thermal noise filtered by transfer function fitted with z-domain vector fitting (ZDVF). The results show that thrust variation of diurnal asymmetry in temperature is decoupled from 24 μN/Hz1/2 to 4.9 μN/Hz1/2 at 0.11 mHz. Additionally, 1 μN square wave modulation of electrostatic force is extracted from the ambiguous thermal drift background of positive temperature coefficient (PTC) heater. The PID-FTR validation is performed with experimental data in thermal noise decoupling, which can guide the design of thermal control and be extended to other physical quantities for noise decoupling.

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Determination of the Conductivity of Individual Carbon Nanotubes Based on Image Profile Analysis of Electrostatic Force Microscopy

Instruments and Experimental Techniques ◽

10.1134/s0020441219040031 ◽

2019 ◽

Vol 62 (4) ◽

pp. 578-581

Author(s):

N. A. Davletkildeev ◽

D. V. Sokolov ◽

E. Yu. Mosur ◽

V. V. Bolotov ◽

I. A. Lobov

Keyword(s):

Carbon Nanotubes ◽

Profile Analysis ◽

Electrostatic Force ◽

Electrostatic Force Microscopy ◽

Force Microscopy

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Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.10.62 ◽

2019 ◽

Vol 10 ◽

pp. 617-633 ◽

Cited By ~ 5

Author(s):

Aaron Mascaro ◽

Yoichi Miyahara ◽

Tyler Enright ◽

Omur E Dagdeviren ◽

Peter Grütter

Keyword(s):

Atomic Force Microscopy ◽

Electrostatic Force ◽

Oscillation Period ◽

Electrostatic Force Microscopy ◽

Time Varying ◽

Time Resolved ◽

Battery Materials ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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