Abstract
The “head-in-pillow” (HnP) defects in lead-free solder joint interconnections of IC packages with conventional (small) stand-off heights of the solder joints, and particularly in packages with fine pitches, are attributed by many electronic material scientists to the three major causes: 1) attributes of the manufacturing process, 2) solder material properties and 3)design-related issues. The latter are thought to be caused primarily by elevated stresses in the solder material, as well as by the excessive warpage of the PCB-package assembly and particularly to the differences in the thermally induced curvatures of the PCB and the package. In this analysis the stress-and-warpage issue is addressed using an analytical predictive stress model. This model is a modification and an extension of the model developed back in 1980-s by the first author. It is assumed that it is the difference in the post-fabrication deflections of the PCB-package assembly that is the root cause of the solder materials failures and particularly and perhaps the HnP defects. The calculated data based on the developed analytical thermal stress model suggest that the replacement of the conventional ball-grid-array (BGA) designs with designs characterized by elevated stand-off heights of the solder joints could result in significant stress and warpage relief and, hopefully, in a lower propensity of the IC package to HnP defects as well. The general concepts are illustrated by a numerical example, in which the responses to the change in temperature of a conventional design referred to as ball-grid-array (BGA) and a design with solder joints with elevated stand-off heights referred to as column-grid-array (CGA) are compared. The computed data indicated that the effective stress in the solder material is relieved by about 40% and the difference between the maximum deflections of the PCB and the package is reduced by about 60%, when the BGA design is replaced by a CGA system. Although no proof that the use of solder joints with elevated stand-off heights will lessen the package propensity to the HnP defects is provided, the authors think that there is a reason to believe that the application of solder joints with elevated stand-off heights could result in a substantial improvement in the general IC package performance, including, perhaps, its propensity to HnP defects.
Impact of Conformal Coating Material on the Long-Term Reliability of Ball Grid Array Solder Joints
