The Effect of Shallow Trap Density on the Electrical Characteristics of an Organic Nonvolatile Memory Device Based on Eight-Hydroxyquinoline

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A low-power nonvolatile memory device is fabricated by dispersing nickel oxide nanorods (nNiO) into a ferroelectric liquid crystal (FLC) host. The dipolar nNiO adsorbed ions in the FLC and thereby reduced the screening effect, which resulted in the enhanced memory behavior.


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