MEMS Testbed for Mechanical Testing of Nanowires
Keyword(s):
Test Bed
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In this paper, we present a MEMS test bed for electromechanical testing of nanowires and nanotubes. The MEMS device exploits the mechanics of post buckling deformation of slender columns to achieve very high force and displacement resolution. The proposed technique involves manipulating the nanowire or nanotube to the device site and hence is applicable to any type of one-dimensional solid. Initial experiments on semiconducting ZnO nanowires estimated the elastic modulus to be 1 GPa.
2012 ◽
Vol 226-228
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pp. 1755-1759
2018 ◽
pp. 95-110
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2020 ◽
Keyword(s):
2019 ◽
Vol 53
(3)
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pp. 959-985
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2002 ◽
Vol 32
(10)
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pp. 1545-1550
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