Near-Grazing Based Intermittent Contact Mode Atomic Force Microscopy

2008 ◽  
Author(s):  
Andrew J. Dick
Keyword(s):  
Operation Mode ◽  
Qualitative Change ◽  
Frequency Component ◽  
Separation Distance ◽  
Beam Equation ◽  
Dual Frequency ◽  
Contact Mode ◽  
Atomic Force ◽  
Dynamics Simulations ◽  
Cantilever Probe

The dynamic behavior of an atomic force microscope cantilever probe is studied for dual frequency excitation. By using the Euler-Bernoulli beam equation with a multi-mode approximation, the system is modeled with base excitation and tip-sample interaction forces obtain from molecular dynamics simulations. The dynamic response of the cantilever probe is simulated for a range of separation distance values and analyzed using Poincare´ sections, bifurcation diagrams, and spectral analysis. The response of the cantilever probe is found to display a qualitative change when influenced by surface forces. The frequency component at half of the fundamental frequency provides an effective way to monitor the amount of force that the probe is applying to the surface of the sample. With this frequency component, an amplitude modulation operation mode is proposed in order to maintain near-grazing behavior during imaging.

Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy

2010 ◽  
Vol 6 (3) ◽  
Author(s):  
Andrew J. Dick ◽  
Santiago D. Solares
Keyword(s):  
Fundamental Frequency ◽  
Period Doubling ◽  
Qualitative Change ◽  
Surface Forces ◽  
Resonance Excitation ◽  
Atomic Interaction ◽  
Beam Model ◽  
Dual Frequency ◽  
Atomic Force ◽  
Frequency Excitation

A beam model is developed and discretized to study the dynamic behavior of the cantilever probe of an atomic force microscope. Atomic interaction force models are used with a multimode approximation in order to simulate the probe’s response. The system is excited at two-and-a-half times the fundamental frequency and with a dual-frequency signal consisting of the AFM probe’s fundamental frequency and two-and-a-half times the fundamental frequency. A qualitative change in the response in the form of period doubling is observed for the harmonic off-resonance excitation when significantly influenced by repulsive surface forces. Through the use of dual-frequency excitation, standard response characteristics are maintained, while the inclusion of the off-resonance frequency component results in an identifiable qualitative change in the response. By monitoring specific frequency components, the influence of attractive and repulsive surface forces may be distinguished. This information could then be used to distinguish between imaging regimes when bistability occurs or to operate at the separation distance between surface force regimes to minimize force levels.

Van der Pol Type Self-Excited Microcantilever and Its Application to AFM

2009 ◽  
Author(s):  
Hiroshi Yabuno ◽  
Masaharu Kuroda ◽  
Takashi Someya ◽  
Masahiro Ohta ◽  
Ryohei Kokawa
Keyword(s):  
Natural Frequency ◽  
The Self ◽  
Material Surface ◽  
Van Der Pol ◽  
Contact Mode ◽  
Response Frequency ◽  
Atomic Force ◽  
Micro Cantilever ◽  
Excited Oscillator ◽  
Cantilever Probe

We propose a van der Pol type self-excited micro-cantilever probe for AFM (atomic force microscope). Because the response frequency of self-excited oscillators is its natural frequency, the equivalent natural frequency depending on the atomic force is easily measured from detecting the response frequency of the self-excited micro-cantilever probe. While the amplitude of the linear self-excited oscillator grows with time, it can be kept very small by the nonlinear effect as van ver Pol oscillator. Therefore, if the micro-cantilever probe has the same dynamics as that of van Pol oscillator, the contact of the micro-cantilever to the material surface is prohibited and non-contact mode AFM is realized. In the present study, we design a van der Pol type micro-cantilever for the application to the practical AFM system.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

2021 ◽  
Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Piezoelectric Actuator ◽  
High Speed ◽  
Closed Loop ◽  
Coefficient Of Thermal Expansion ◽  
Measuring System ◽  
Contact Mode ◽  
Loop Control ◽  
Atomic Force ◽  
Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

scholarly journals Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 362
Author(s):  
Luke Oduor Otieno ◽  
Bernard Ouma Alunda ◽  
Jaehyun Kim ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscope ◽  
Natural Frequency ◽  
High Speed ◽  
Contact Mode ◽  
Ongoing Process ◽  
Atomic Force ◽  
Constant Height ◽  
Mode Tracking

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.

A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy

2004 ◽  
Vol 126 (2) ◽  
pp. 327-335 ◽  
Author(s):  
Nader Jalili ◽  
Mohsen Dadfarnia ◽  
Darren M. Dawson
Keyword(s):  
Imaging Techniques ◽  
Interaction Force ◽  
Intermolecular Forces ◽  
Scanning Tunneling ◽  
Atomic Interaction ◽  
Force Estimation ◽  
Contact Mode ◽  
Distributed Parameters ◽  
Atomic Force ◽  
Insight Into

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The non-contact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy, especially when utilized for reliable measurements of soft samples (e.g., biological species). Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) representation of the micro-cantilevers coupled with an adhoc method for atomic interaction force estimation (especially in non-contact mode). Since the magnitude of the interaction force lies within the range of nano-Newtons to pica-Newtons, precise estimation of the atomic force is crucial for accurate topographical imaging. In contrast to the previously utilized lumped modeling methods, this paper aims at improving current AFM measurement technique through developing a general distributed-parameters base modeling approach that reveals greater insight into the fundamental characteristics of the microcantilever-sample interaction. For this, the governing equations of motion are derived in the global coordinates via the Hamilton’s Extended Principle. An interaction force identification scheme is then designed based on the original infinite dimensional distributed-parameters system which, in turn, reveals the unmeasurable distance between AFM tip and sample surface. Numerical simulations are provided to support these claims.

Conductive AFM: Probing Nano-scale Electrical Properties of Model Cell Membranes

2012 ◽  
Vol 1465 ◽  
Author(s):  
Paul Farrar ◽  
Del Atkinson ◽  
Andrew J. Gallant
Keyword(s):  
Lipid Bilayers ◽  
Electrical Contact ◽  
Pyrolytic Graphite ◽  
Elastic Response ◽  
Electrical Measurements ◽  
Contact Mode ◽  
Biologically Relevant ◽  
Atomic Force ◽  
Current Voltage ◽  
Model Cell

ABSTRACTBiologically relevant lipid bilayers supported on highly ordered pyrolytic graphite (HOPG) were probed both mechanically and electrically with a Conductive Atomic Force Microscope (C-AFM) capable of measuring ultra-low currents. Results show that these membranes undergo an elastic response up to 26 nN on average when compressed with an AFM tip. Measuring the films with a low contact force demonstrates that contact mode AFM can be used repeatedly to image without damaging the film. Based on current-voltage measurements made with the C-AFM, it is shown that apparently high resistances seen for the films could be the result of variable electrical contact between the tip and surface. As a result, the paper proposes that the deflection of the cantilever should always be measured in order to ensure knowledge of the location of the tip during all electrical measurements.

Sign in / Sign up

Export Citation Format

Share Document