Practical applications of the phase problem solution

1995 ◽  
Author(s):  
A. V. Frolov ◽  
G. A. Akimova ◽  
V. V. Mataibaev ◽  
M. P. Romanova ◽  
Yu. P. Seryikh
Keyword(s):  
Problem Solution ◽  
Phase Problem ◽  
Practical Applications

scholarly journals The Use of Connected Masks for Reconstructing the Single Particle Image from X-Ray Diffraction Data. II. The Dependence of the Accuracy of the Solution on the Sampling Step of Experimental Data

2015 ◽  
Vol 10 (2) ◽  
pp. 508-525 ◽  
Author(s):  
Н.Л. Лунина ◽  
N.L. Lunina
Keyword(s):  
Experimental Data ◽  
Particle Image ◽  
Expected Improvement ◽  
Problem Solution ◽  
Phase Problem ◽  
X Ray Diffraction ◽  
Sampling Step ◽  
X Ray ◽  
X Ray Crystallography ◽  
Grid Points

Advances in the methodology of the X-ray diffraction experiments leads to a possibility to register the rays scattered by large isolated biological particles (viruses and individual cells) but not only by crystalline samples. The experiment with an isolated particle provides researchers with the intensities of the scattered rays for the continuous spectrum of scattering vectors. Such experiment gives much more experimental data than an experiment with a crystalline sample where the information is limited to a set of Bragg reflections. This opens up additional opportunities in solving underlying problem of X-ray crystallography, namely, calculating phase values for the scattered waves needed to restore the structure of the object under study. In practice, the original continuous diffraction pattern is sampled, reduced to the values at grid points in the space of scattering vectors (in the reciprocal space). The sampling step determines the amount of the information involved in solving the phase problem and the complexity of the necessary calculations. In this paper, we investigate the effect of the sampling step on the accuracy of the phase problem solution obtained by the method proposed earlier by the authors. It is shown that an expected improvement of the accuracy of the solution with the reducing the sampling step continues even after crossing the Nyquist limit defined as the inverse of the double size of the object under study.

scholarly journals Identification of fingers on the basis of Hamiltonian cycles of local features

2020 ◽  
Keyword(s):  
Computational Complexity ◽  
Local Features ◽  
Complex Problem ◽  
Reference Points ◽  
Hamiltonian Cycles ◽  
Problem Solution ◽  
Arbitrary Graph ◽  
Practical Applications ◽  
Distribution Of Points ◽  
Angular Displacements

The problem of finding the lengths of Hamiltonian cycles on complex graphs is considered. The task has such practical applications as determining the optimal routes (salesman's task), identifying graph structures (recognizing the characteristics of local features of biometric objects), etc. When solving the task of verification of biometric samples, the problems of addition or disappearance of reference points, deformation of the distances between them, the appearance of linear and angular displacements of the whole sample emerges. Using the method described in the article, the problem of displacements can be eliminated, as the solution is stable when shuffling of the points is present. Moreover, it is possible to obtain reference plans with the same stability. Obtaining them requires less computational complexity and provides greater recognition accuracy. A detailed description of the problem solution based on the application of the method of branches and boundaries for symmetric matrices of graphs, which describe the distribution of local features in the images of fingerprints, has been proposed. It is known that a guaranteed solution for finding the length of the Hamiltonian cycle for an arbitrary graph of the planar distribution of points is possible only by using an exhaustive search. However, the computational complexity of such a search is not acceptable. The method of branches and boundaries, like all existing methods of directional search, does not guarantee finding a solution with an arbitrarily large dimension of the graph. Therefore, a method of decomposing graphs is proposed, which allows reducing a complex problem to a set of simpler ones. That allows for a significant reduction in computational complexity. The relative invariance of the metrics of Hamiltonian cycles to probabilistic shifts, which are characteristic of biometric pattern recognition problems, has been shown.

scholarly journals Crystallographic molecular replacement using an in silico-generated search model of SARS-CoV-2 ORF8

2021 ◽  
Author(s):  
Thomas G. Flower ◽  
James H. Hurley
Keyword(s):  
Ab Initio ◽  
Structural Parameters ◽  
Search Model ◽  
Problem Solution ◽  
Molecular Replacement ◽  
Phase Problem ◽  
Search Models ◽  
Sad Phasing ◽  
Predicted Model ◽  
Β Sheet

AbstractThe majority of crystal structures are determined by the method of molecular replacement (MR). The range of application of MR is limited mainly by the need for an accurate search model. In most cases, pre-existing experimentally determined structures are used as search models. In favorable cases, ab initio predicted structures have yielded search models adequate for molecular replacement. The ORF8 protein of SARS-CoV-2 represents a challenging case for MR using an ab initio prediction because ORF8 has an all β-sheet fold and few orthologs. We previously determined experimentally the structure of ORF8 using the single anomalous dispersion (SAD) phasing method, having been unable to find an MR solution to the crystallographic phase problem. Following a report of an accurate prediction of the ORF8 structure, we assessed whether the predicted model would have succeeded as an MR search model. A phase problem solution was found, and the resulting structure was refined, yielding structural parameters equivalent to the original experimental solution.

Experimental methodology on reconstruction of object fields by phase problem solution

1995 ◽  
Author(s):  
A. V. Frolov ◽  
G. A. Akimova ◽  
V. V. Mataibaev ◽  
Yu. P. Seryikh
Keyword(s):  
Experimental Methodology ◽  
Problem Solution ◽  
Phase Problem

scholarly journals The Simultaneous Localization and Mapping (SLAM)-An Overview

2021 ◽  
Vol 1 (02) ◽  
pp. 34-45
Author(s):  
Samer Karam ◽  
Bashar Alsadik
Keyword(s):  
Autonomous Navigation ◽  
Simultaneous Localization And Mapping ◽  
Computer Hardware ◽  
Problem Solution ◽  
Active Sensors ◽  
Practical Applications ◽  
Radio Detection ◽  
Localization And Mapping ◽  
Mathematical Techniques ◽  
Pose Graph Optimization

Positioning is a need for many applications related to mapping and navigation either in civilian or military domains. The significant developments in satellite-based techniques, sensors, telecommunications, computer hardware and software, image processing, etc. positively influenced to solve the positioning problem efficiently and instantaneously. Accordingly, the mentioned development empowered the applications and advancement of autonomous navigation. One of the most interesting developed positioning techniques is what is called in robotics as the Simultaneous Localization and Mapping SLAM. The SLAM problem solution has witnessed a quick improvement in the last decades either using active sensors like the RAdio Detection And Ranging (Radar) and Light Detection and Ranging (LiDAR) or passive sensors like cameras. Definitely, positioning and mapping is one of the main tasks for Geomatics engineers, and therefore it's of high importance for them to understand the SLAM topic which is not easy because of the huge documentation and algorithms available and the various SLAM solutions in terms of the mathematical models, complexity, the sensors used, and the type of applications. In this paper, a clear and simplified explanation is introduced about SLAM from a Geomatical viewpoint avoiding going into the complicated algorithmic details behind the presented techniques. In this way, a general overview of SLAM is presented showing the relationship between its different components and stages like the core part of the front-end and back-end and their relation to the SLAM paradigm. Furthermore, we explain the major mathematical techniques of filtering and pose graph optimization either using visual or LiDAR SLAM and introduce a summary of the deep learning efficient contribution to the SLAM problem. Finally, we address examples of some existing practical applications of SLAM in our reality.

Ion Beam Induced Interfacial Reactions in Molybdenum Thin Films on Silicon

1981 ◽  
Vol 39 ◽  
pp. 162-163
Author(s):  
L. J. Chen ◽  
L. S. Hung ◽  
J. W. Mayer
Keyword(s):  
Ion Beam ◽  
Chemical Vapor ◽  
Interfacial Reactions ◽  
Practical Applications ◽  
Microelectronic Devices ◽  
Recent Emergence ◽  
Chemical Vapor Deposited ◽  
Atomic Mixing ◽  
Silicon Interface ◽  
Kinetics Of

When an energetic ion penetrates through an interface between a thin film (of species A) and a substrate (of species B), ion induced atomic mixing may result in an intermixed region (which contains A and B) near the interface. Most ion beam mixing experiments have been directed toward metal-silicon systems, silicide phases are generally obtained, and they are the same as those formed by thermal treatment.Recent emergence of silicide compound as contact material in silicon microelectronic devices is mainly due to the superiority of the silicide-silicon interface in terms of uniformity and thermal stability. It is of great interest to understand the kinetics of the interfacial reactions to provide insights into the nature of ion beam-solid interactions as well as to explore its practical applications in device technology.About 500 Å thick molybdenum was chemical vapor deposited in hydrogen ambient on (001) n-type silicon wafer with substrate temperature maintained at 650-700°C. Samples were supplied by D. M. Brown of General Electric Research & Development Laboratory, Schenectady, NY.

1250-kilovolt scanning transmission electron microscope

1984 ◽  
Vol 42 ◽  
pp. 624-625
Author(s):  
T. Imura ◽  
S. Maruse ◽  
K. Mihama ◽  
M. Iseki ◽  
M. Hibino ◽  
...  
Keyword(s):  
High Voltage ◽  
Electron Probe ◽  
Scanning Transmission Electron Microscope ◽  
Pressure Vessels ◽  
Practical Applications ◽  
Voltage Generator ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
New Applications ◽  
High Voltage Generator

Ultra high voltage STEM has many inherent technical advantages over CTEM. These advantages include better signal detectability and signal processing capability. It is hoped that it will explore some new applications which were previously not possible. Conventional STEM (including CTEM with STEM attachment), however, has been unable to provide these inherent advantages due to insufficient performance and engineering problems. Recently we have developed a new 1250 kV STEM and completed installation at Nagoya University in Japan. It has been designed to break through conventional engineering limitations and bring about theoretical advantage in practical applications.In the design of this instrument, we exercised maximum care in providing a stable electron probe. A high voltage generator and an accelerator are housed in two separate pressure vessels and they are connected with a high voltage resistor cable.(Fig. 1) This design minimized induction generated from the high voltage generator, which is a high frequency Cockcroft-Walton type, being transmitted to the electron probe.

Characterization of intergranular cuprous oxide in polycrystalline YBa2Cu3O7-x

1988 ◽  
Vol 46 ◽  
pp. 880-881
Author(s):  
Bradley L. Thiel ◽  
Chan Han R. P. ◽  
Kurosky L. C. Hutter ◽  
I. A. Aksay ◽  
Mehmet Sarikaya
Keyword(s):  
Grain Boundary ◽  
Cuprous Oxide ◽  
Room Temperature ◽  
Boundary Phase ◽  
Spectroscopic Techniques ◽  
Transition Width ◽  
Practical Applications ◽  
Thin Foils ◽  
Superconducting Oxides

The identification of extraneous phases is important in understanding of high Tc superconducting oxides. The spectroscopic techniques commonly used in determining the origin of superconductivity (such as RAMAN, XPS, AES, and EXAFS) are surface-sensitive. Hence a grain boundary phase several nanometers thick could produce irrelevant spectroscopic results and cause erroneous conclusions. The intergranular phases present a major technological consideration for practical applications. In this communication we report the identification of a Cu2O grain boundary phase which forms during the sintering of YBa2Cu3O7-x (1:2:3 compound).Samples are prepared using a mixture of Y2O3. CuO, and BaO2 powders dispersed in ethanol for complete mixing. The pellets pressed at 20,000 psi are heated to 950°C at a rate of 5°C per min, held for 1 hr, and cooled at 1°C per min to room temperature. The samples show a Tc of 91K with a transition width of 2K. In order to prevent damage, a low temperature stage is used in milling to prepare thin foils which are then observed, using a liquid nitrogen holder, in a Philips 430T at 300 kV.

Resolution and measurement in the scanning electron microscope

1987 ◽  
Vol 45 ◽  
pp. 534-537 ◽  
Author(s):  
Michael T. Postek
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Engineering Design ◽  
Resolving Power ◽  
Practical Applications ◽  
Instrument Resolution ◽  
Accurate Definition ◽  
Definition Of ◽  
Scanning Electron ◽  
Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

1992 ◽  
Vol 50 (1) ◽  
pp. 256-257
Author(s):  
Tai D. Nguyen ◽  
Ronald Gronsky ◽  
Jeffrey B. Kortright
Keyword(s):  
Layered Structure ◽  
Driving Force ◽  
High Energy ◽  
Superior Performance ◽  
In Situ Tem ◽  
Rayleigh Instability ◽  
Practical Applications ◽  
Transmission Electron ◽  
Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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