Method for calibrating transmitted wavefront at any wavelength by refractive index formula

2018 ◽  
Author(s):  
Qiyuan Zhang ◽  
Sen Han ◽  
Haoyu Wang ◽  
Quanzhao Wang
Keyword(s):  
Refractive Index ◽  
Index Formula

EFFECTS OF Co CONCENTRATION ON THE STRUCTURAL AND OPTICAL PROPERTIES OF Zn1−xCoxS FILMS

2020 ◽  
Vol 27 (08) ◽  
pp. 1950196
Author(s):  
SHUFENG LI ◽  
LI WANG ◽  
XUEQIONG SU ◽  
YONG PANG ◽  
DONGWEN GAO ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Doping Concentration ◽  
Index Formula ◽  
X Ray Diffraction ◽  
Dispersion Energy ◽  
X Ray ◽  
Co Doping ◽  
Energy Formula

Amorphous and crystalline Zn[Formula: see text]CoxS ([Formula: see text], 0.3, 0.5) thin films were grown on sapphire (Al2O3) substrates by pulsed laser deposition at substrate temperature of 25∘C and 800∘C, respectively. The X-ray diffraction results show that the crystalline film has a cubic zinc blende structure and the crystalline quality decreased with increasing Co-doping concentration. The X-ray diffraction and X-ray photoelectron spectroscopy spectra reveal that the samples reached an overdoping state at Co-doping concentration of [Formula: see text]. The absorbance of films increases and the absorption edge shifts to longer wave length direction with increasing Co-doping concentration. The redshift of the band gap energy depends on the Co composition associating with the Urbach energy. Furthermore, the refractive index and dielectric constant increase with increasing Co-doping concentration. The dispersion parameters, such as dispersion energy ([Formula: see text]), oscillator energy ([Formula: see text]), static refractive index ([Formula: see text]), static dielectric constant ([Formula: see text]), interband transition strength moments ([Formula: see text] and [Formula: see text]), oscillator strength [Formula: see text] and oscillator wavelength [Formula: see text], have been analyzed by Wemple–DiDomenico single oscillator model. All these parameters were found to be dependent upon the Co-doping concentration in the Zn[Formula: see text]CoxS thin films.

scholarly journals Dielectric studies of binary mixtures of ethylene glycol mono phenyl ether with 1-butanol at different temperatures

2017 ◽  
Vol 07 (04) ◽  
pp. 1750023 ◽  
Author(s):  
H. A. Chaube ◽  
V. A. Rana
Keyword(s):  
Refractive Index ◽  
Ethylene Glycol ◽  
Binary Mixtures ◽  
Theoretical Calculations ◽  
Quantitative Information ◽  
Correlation Factor ◽  
Phenyl Ether ◽  
Index Formula ◽  
Static Permittivity ◽  
Kirkwood Correlation Factor

Static permittivity ([Formula: see text]), refractive index ([Formula: see text]) and density ([Formula: see text]) of binary mixtures of ethylene glycol mono phenyl ether (EGMPE) with 1-butanol (1-BuOH) over the entire range of mole fraction and at temperatures ([Formula: see text], 313.15 and 323.15[Formula: see text]K) have been measured. From the experimental data, parameters such as excess static permittivity ([Formula: see text]), excess permittivity at optical frequency ([Formula: see text]), effective Kirkwood correlation factor ([Formula: see text]), corrective Kirkwood correlation factor ([Formula: see text]) and Bruggeman factor ([Formula: see text]) have been calculated to obtain qualitative and quantitative information about the complex formation through H-bond in binary system. In order to predict the static permittivity of polar–polar binary mixtures six mixing rules were applied and for refractive index five mixing rule were applied. Experimental results of permittivity ([Formula: see text]) and refractive index (n) are compared with those obtained from theoretical calculations. Excess parameters were fitted to the Redlich–Kister type polynomial equation.

REALIZATION AND CHARACTERIZATION OF A NEW ORGANIC THIN FILM SEMICONDUCTOR

2019 ◽  
Vol 26 (01) ◽  
pp. 1850127 ◽  
Author(s):  
IMANE TIFFOUR ◽  
SALAH BASSAID ◽  
ABDELKADER DEHBI ◽  
ABDELKADER BELFEDAL ◽  
ABDEL-HAMID I. MOURAD ◽  
...  
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Optical Measurement ◽  
Semiconductor Material ◽  
Index Formula ◽  
Organic Thin Film ◽  
Optical Analysis ◽  
Dispersion Energy ◽  
Optical Energy Bandgap

The main objective of this paper is the realization and characterization of a new organic thin film semiconductor material through the use of an ideal mixture of Acetaminophen/Curcumin utilizing several characterization techniques. From optical analysis, we can conclude that our semiconductor material is comparable and shows good concurrency to the semiconductors applied in technologic applications. In fact, the analysis of the optical measurement (transmittance [Formula: see text] conducting to the optical energy bandgap, [Formula: see text], it was found the optical bandgap is around to [Formula: see text][Formula: see text]eV. In addition, by using the Wemple Didominico model it was found the dispersion energy ED varied from 5[Formula: see text]eV to 7[Formula: see text]eV, the average bandgap [Formula: see text] separated the center of both bands occupied and unoccupied is around 4.5[Formula: see text]eV and the static refractive index [Formula: see text] varies from 1.3 to 2 and it dependent on the compactness and transparency of the material.

Relationship between band gap and equivalent volume of electron cloud

2020 ◽  
Vol 34 (35) ◽  
pp. 2050400
Author(s):  
Tao Zhang
Keyword(s):  
Refractive Index ◽  
Band Gap ◽  
Characteristic Parameter ◽  
Electron Cloud ◽  
Index Formula ◽  
Semiconductor Materials ◽  
Decisive Effect ◽  
Change Behavior ◽  
Solid Media ◽  
Composition Characteristics

The characteristic parameter [Formula: see text] related to bandgap [Formula: see text] is proposed ([Formula: see text] is the equivalent volume of the outermost electron cloud of molecule). [Formula: see text] values of dozens of solid media are calculated. The results show that [Formula: see text] decreases as [Formula: see text] increases. Furthermore, change behavior of [Formula: see text] with composition is studied by using [Formula: see text], and the composition characteristics of high-[Formula: see text] solid media are summarized. According to this result, [Formula: see text] can be regulated to a certain extent by adjusting the composition. Importantly, connection among refractive index [Formula: see text], [Formula: see text] and [Formula: see text] is revealed: [Formula: see text] has both a major contribution to [Formula: see text] and a decisive effect on [Formula: see text]. These results help to promote the development of new semiconductor materials.

scholarly journals Enhancing the sensitivity of mesoscopic light reflection statistics in weakly disordered media by interface reflections

2016 ◽  
Vol 30 (23) ◽  
pp. 1650155 ◽  
Author(s):  
Daniel J. Park ◽  
Prabhakar Pradhan ◽  
Vadim Backman
Keyword(s):  
Refractive Index ◽  
Reflection Coefficient ◽  
Random Media ◽  
Surrounding Medium ◽  
Index Formula ◽  
Refractive Indices ◽  
Detailed Calculation ◽  
Theoretical Derivation ◽  
Potential Applications ◽  
The Mean

Reflection statistics have not been well studied for optical random media whose mean refractive indices do not match with the refractive indices of their surrounding media. Here, we theoretically study how this refractive index mismatch between a one-dimensional (1D) optical sample and its surrounding medium affects the reflection statistics in the weak disorder limit, when the fluctuation part of the refractive index [Formula: see text] is much smaller than the mismatch as well as the mean refractive index of the sample [Formula: see text]. In the theoretical derivation, we perform a detailed calculation that results in the analytical forms of the mean and standard deviation (STD) of the reflection coefficient in terms of disorder parameters [Formula: see text] and its correlation length [Formula: see text] in an index mismatched backscattering system. Particularly, the orders of disorder parameters in STD of the reflection coefficient for index mismatched systems are shown to be lower [Formula: see text] than that of the matched systems [Formula: see text]. By comparing STDs of the reflection coefficient values of index matched and mismatched systems, we show that reflection coefficient at the sample boundaries in index mismatched systems can enhance the signal of the STD to the “disorder parameters” of the reflection coefficient. In terms of biophotonics applications, this result can lead to potential techniques that effectively extract the sample disorder parameters by manipulating the index mismatched conditions. Potential applications of the technique for enhancement in sensitivity of cancer detection at the single cell level are also discussed.

ANNEALED In2S3 THIN FILMS PREPARED BY SPRAY TECHNIQUE: REPORT ON THE STRUCTURAL, OPTICAL AND DISPERSION ENERGY PARAMETERS

2019 ◽  
Vol 26 (07) ◽  
pp. 1850223
Author(s):  
Y. BCHIRI ◽  
N. BOUGUILA ◽  
M. KRAINI ◽  
S. ALAYA
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Near Infrared ◽  
Spray Pyrolysis Technique ◽  
Dielectric Constants ◽  
Index Formula ◽  
Optical Parameters ◽  
Dispersion Parameters ◽  
Dispersion Energy ◽  
Molar Ratios

In2S3 thin films with different S/In molar ratios (from 1.5 to 3.5) were deposited via a spray pyrolysis technique on glass substrates at 340∘C. Then, the obtained films were annealed at the same temperature 400∘C for 2[Formula: see text]h. X-ray diffraction study reveals the formation of cubic [Formula: see text]-In2S3 phase with (400) as preferred orientation. The crystallite size varies in the range 64–97[Formula: see text]nm. Optical analysis exhibits that transmittance in visible and near infrared regions is higher than 65% for all films. The optical band gap varied from 2.58[Formula: see text]eV to 2.67[Formula: see text]eV. The optical parameters (refractive index, extinction coefficient, dielectric constants) were calculated through the transmittance ([Formula: see text]) and reflectance ([Formula: see text]). Dispersion parameters ([Formula: see text], [Formula: see text]), high frequency dielectric constant ([Formula: see text]), refractive index ([Formula: see text]), oscillator length strength ([Formula: see text]), average oscillator wavelength ([Formula: see text]) and optical moments ([Formula: see text]) were determined by Wemple–DiDomenico model. The surface and volume energy losses with photon energy were also calculated. The optical and electrical conductivities were estimated. These properties of In2S3 films are important for photovoltaic applications.

scholarly journals ESTIMATION OF THE ATMOSPHERIC REFRACTION EFFECT IN AIRBORNE IMAGES USING RADIOSONDE DATA

2016 ◽  
Vol XLI-B1 ◽  
pp. 281-286
Author(s):  
U. Beisl ◽  
U. Tempelmann
Keyword(s):  
Refractive Index ◽  
Weather Conditions ◽  
Image Sensor ◽  
Radiosonde Data ◽  
Index Formula ◽  
Geometric Accuracy ◽  
Profile Data ◽  
Atmospheric Refraction ◽  
Adverse Weather ◽  
Atmospheric Profiles

The influence of the atmospheric refraction on the geometric accuracy of airborne photogrammetric images was already considered in the days of analogue photography. The effect is a function of the varying refractive index on the path from the ground to the image sensor. Therefore the effect depends on the height over ground, the view zenith angle and the atmospheric constituents. It is leading to a gradual increase of the scale towards the borders of the image, i.e. a magnification takes place. Textbooks list a shift of several pixels at the borders of standard wide angle images. As it was the necessity of that time when images could only be acquired at good weather conditions, the effect was calculated using standard atmospheres for good atmospheric conditions, leading to simple empirical formulas. Often the pixel shift caused by refraction was approximated as linear with height and compensated by an adjustment of the focal length. With the advent of sensitive digital cameras, the image dynamics allows for capturing images at adverse weather conditions. So the influence of the atmospheric profiles on the geometric accuracy of the images has to be investigated and the validity of the standard correction formulas has to be checked. This paper compares the results from the standard formulas by Saastamoinen with the results calculated from a broad selection of atmospheres obtained from radiosonde profile data. The geometric deviation is calculated by numerical integration of the refractive index as a function of the height using the refractive index formula by Ciddor. It turns out that the effect of different atmospheric profiles (including inversion situations) is generally small compared to the overall effect except at low camera heights. But there the absolute deviation is small. Since the necessary atmospheric profile data are often not readily available for airborne images a formula proposed by Saastamoinen is verified that uses only camera height, the pressure at the ground and the camera level, and the temperature at the camera level.

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