Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO2 Surface Films

2018 ◽  
Vol 52 (13) ◽  
pp. 1696-1703
Author(s):  
K. V. Feklistov ◽  
A. G. Cherkov ◽  
V. P. Popov ◽  
L. I. Fedina
Keyword(s):  
High Dose ◽  
Surface Films ◽  
Surface Layers ◽  
Sio2 Surface ◽  
Recoil Atoms

scholarly journals Effect of Silicon, Titanium, and Zirconium Ion Implantation on NiTi Biocompatibility

2012 ◽  
Vol 2012 ◽  
pp. 1-16 ◽  
Author(s):  
L. L. Meisner ◽  
A. I. Lotkov ◽  
V. A. Matveeva ◽  
L. V. Artemieva ◽  
S. N. Meisner ◽  
...  
Keyword(s):  
Stem Cells ◽  
Flow Cytometry ◽  
Mesenchymal Stem Cells ◽  
Ion Implantation ◽  
Cell Counting ◽  
High Dose ◽  
Surface Layers ◽  
Test Flow ◽  
Ion Implanted

The objective of the work was to study the effect of high-dose ion implantation (HDII) of NiTi surface layers with Si Ti, or Zr, on the NiTi biocompatibility. The biocompatibility was judged from the intensity and peculiarities of proliferation of mesenchymal stem cells (MSCs) on the NiTi specimen surfaces treated by special mechanical, electrochemical, and HDII methods and differing in chemical composition, morphology, and roughness. It is shown that the ion-implanted NiTi specimens are nontoxic to rat MSCs. When cultivated with the test materials or on their surfaces, the MSCs retain the viability, adhesion, morphology, and capability for proliferationin vitro, as evidenced by cell counting in a Goryaev chamber, MTT test, flow cytometry, and light and fluorescence microscopy. The unimplanted NiTi specimens fail to stimulate MSC proliferation, and this allows the assumption of bioinertness of their surface layers. Conversely, the ion-implanted NiTi specimens reveal properties favorable for MSC proliferation on their surface.

Amorphous Solids, Small Particles and Thin Surface Films

1957 ◽  
Vol 1 ◽  
pp. 73-99 ◽  
Author(s):  
F. Schossberger
Keyword(s):  
Electroless Nickel ◽  
Surface Films ◽  
Fibrous Materials ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
X Ray ◽  
Cold Rolled ◽  
Combination Of Methods ◽  
Diffraction Effects ◽  
The Relationship

AbstractA comprehensive chart is preserit of the X-ray diffraction effects of gas-and Uquid-like armorphous substances, small particle-size materials, mixtures of amorphous and crystalline compounds, sheetlike crystals, and fibrous materials.The relationship between the X-ray diagrams and chemical preparations as shown by typical examples from the field of the manufacture of active catalysts cadmium sulfide semiconductors, pour point-depressed lubricants, electroless nickel platings and metal-filled cellulose fibers.The investigation of thin surface layers formed by chemical reactions required the combination of electron and X-ray diffraction techniques. The usefulness of this combination of methods is demonstrated by a study of black stain formation on cold rolled annealed steel. By identifying the materials in the stain and determining the sequence in which they formed a reaction mechanism between steel surface and annealing-gas can be postulated.

The Effect of Surface Layers on Thin Foil Standards on the Accuracy of Quantitative E.D.S. Analysis

1982 ◽  
Vol 40 ◽  
pp. 484-485
Author(s):  
J.M. Brown ◽  
H.L. Fraser
Keyword(s):  
Data Analysis ◽  
Thin Foil ◽  
Surface Films ◽  
Surface Layers ◽  
X Ray ◽  
Thin Foils ◽  
Accurate Quantification ◽  
Effect Of Surface

Quantitative X-ray microanalysis of thin foils may be achieved either by calculation or by making use of standards. This paper, although advocating the use of pure elemental standards for accurate quantification, points out some of the problems involved in the choice of good standards. Specifically, the presence of surface films on as-prepared thin foil standards must be removed or accounted for during data analysis.

XPS studies of SiO2 surface layers formed by oxygen ion implantation into silicon

1983 ◽  
Vol 76 (1) ◽  
pp. K21-K24 ◽  
Author(s):  
D. Schulze ◽  
J. Finster ◽  
E. Hensel ◽  
W. Skorupa ◽  
U. Kreissig
Keyword(s):  
Ion Implantation ◽  
Surface Layers ◽  
Sio2 Surface ◽  
Oxygen Ion ◽  
Oxygen Ion Implantation

The friction and lubrication of polymers

1966 ◽  
Vol 291 (1425) ◽  
pp. 186-207 ◽  
Keyword(s):  
Water Film ◽  
Deformation Mode ◽  
Surface Films ◽  
Surface Layers ◽  
Adsorbed Films ◽  
Lubricating Layer ◽  
Local Pressures ◽  
Elastic And Plastic Deformation ◽  
Work Supports ◽  
Polar Polymer

This paper describes a study of the friction of a typical polar polymer, nylon, and a typical non-polar polymer, polyethylene. The friction of unlubricated surfaces varies with load and geometry in a manner that can be explained in terms of the multi-asperity model of Howell & Lodge (1954), modified to allow for a deformation mode that is intermediate between elastic and plastic deformation. Nylon is markedly plasticized by water and its effect as it diffuses into the bulk of the polymer has been studied using hardness measurements. Initially the water produces a softening restricted to the surface layers and this leads to a modest reduction in friction. After a protracted period the bulk softening of the polymer causes an increase in the area of contact (cf. Rubenstein 1961) and the friction again rises. If one of the surfaces is a hydrophilic substance such as glass a more marked reduction in friction occurs when water is introduced to the surface. There is strong evidence that this due to the formation of a weakly held water film, a few molecules thick, attached to the hydrophilic surface. The film survives because the local pressures are not too severe. For this reason water provides effective lubrication for glass sliding on polyethylene or rubber but not for glass on glass where the contact pressures are much higher. Long chain acids produce negligible plasticization of the polymers but lubricate by forming adsorbed surface films. They are not as effective on polymers as on metals and this work supports the view of Fox & Zisman (1952) that this is because the films are not fully condensed. Polyethylene surfaces are lubricated by surface films of oleamide or stearamide. These materials may also be incorporated, in small quantities, within the bulk of the polymer and can diffuse to the surface to provide an effective lubricating layer. Non-polar liquids and some silicones produce a small reduction in the friction of polymers; the effect is more marked if one of the surfaces is of glass (or metal). It is suggested that these liquids form weakly adsorbed films which survive the relatively gentle stresses at the contact regions and so reduce the amount of polymer-polymer or polymer-glass interaction.

Direct Wafer Bonding of Preamorphized Silicon Wafers.

1995 ◽  
Vol 378 ◽  
Author(s):  
A. Laporte ◽  
G. Sarrabayrouse ◽  
M. Benamara ◽  
A. Claverie ◽  
A. Rocher ◽  
...  
Keyword(s):  
Wafer Bonding ◽  
General Structure ◽  
Striking Difference ◽  
Interfacial Region ◽  
High Dose ◽  
Extended Defects ◽  
Electrical Characteristics ◽  
Surface Layers ◽  
Tem Analysis ◽  
Direct Wafer Bonding

AbstractThis paper presents the comparison of the structural and electrical characteristics of Si/Si bonded interfaces depending on whether the surface layers were rendered amorphous by high dose ion implantation prior to annealing or not. While the general structure of the interfaces is the same when the wafers are preamorphized more precipitates are seen in the interface along with a few extended defects propagating into the volume. The most striking difference between both procedures is that the Spreading Resistance profile is more complicated in shape and difficult to master in the case of preamorphized wafers. Careful TEM analysis shows that only in this case the interfacial region is stressed in contrast with the fully relaxed structure obtained by direct bonding of crystalline wafers.For these reasons, there is little chance that the preamorphization technique will benefit to the bonding procedure of direct Si wafers.

Crystallisation and Diffusion in Oriented Sapphire Amorphised by Zinc Ion Implantation

1990 ◽  
Vol 201 ◽  
Author(s):  
L. A. Bunn ◽  
D. K. Sood
Keyword(s):  
Epitaxial Growth ◽  
Zinc Ion ◽  
High Dose ◽  
Low Doses ◽  
Surface Layers ◽  
Rapid Diffusion ◽  
High Doses ◽  
Amorphous Surface ◽  
And Diffusion ◽  
Post Implantation

AbstractHigh dose zinc implantation (1×1016 to 6×1016 ions/cm2) into c-axis sapphire at 770K produces amorphous surface layers. Post-implantation annealing at temperatures at and above 800°C show that the modes of recrystallisation are strongly dependant on ion dose. At low doses formation of crystallites of α and γ phase Al2O3 is seen, with no evidence of any planar epitaxial growth at the original crystalline-amorphous interface. The zinc is seen to diffuse isotropically within the crystallised layer and becomes partially substitutional within the crystallites. At high doses, however, the formation of crystallites is inhibited, with the layer remaining amorphous. A more rapid diffusion of zinc is seen in the amorphous Al2O3, with some of the zinc being lost at the surface.

Characterization of SiC Crystals by Using Deep UV Excitation Raman Spectroscopy

2006 ◽  
Vol 527-529 ◽  
pp. 333-338 ◽  
Author(s):  
Shinichi Nakashima ◽  
Takeshi Mitani
Keyword(s):  
Raman Spectroscopy ◽  
Peak Frequency ◽  
High Dose ◽  
Surface Layers ◽  
Raman Analysis ◽  
Localized Defects ◽  
Light Excitation ◽  
Deep Uv ◽  
Induced Defects

Raman spectroscopy using deep UV (DUV) light excitation has been applied to characterizing process-induced defects in surface layers in SiC. Raman spectra of P+-ion implanted and post annealed SiC have been measured as a function of dose level and annealing temperature. The recovery of the crystallinity and electrical activity have been evaluated. Precipitation of excess phosphorus was found in heavily doped specimens. High dose implanted and post annealed samples show uneven distribution of residual defects, which is demonstrated by mapping of Raman bandwidth. Damage in 4H-SiC surfaces, which were mechanically polished with various sizes of abrasives, has been evaluated from DUV micro-Raman measurements. The Raman analysis demonstrates that bandwidth and peak frequency can be used as monitors of the polish–induced damage. It is found that localized defects reducing free carrier density remain even after polishing with small sized abrasives.

The formation of surface films at the transition between mild and severe metallic wear

1963 ◽  
Vol 273 (1355) ◽  
pp. 466-483 ◽  
Keyword(s):  
Surface Film ◽  
Surface Films ◽  
Surface Layers ◽  
Severe Wear ◽  
Wear Process ◽  
High Speeds ◽  
Mild Wear ◽  
Oxide Particles ◽  
Heavy Loads ◽  
Micro Analysis

The conditions of sliding have been found in which a transition occurs between the régimes of mild and severe wear for a leaded brass (60/40 brass containing 2% lead) sliding on hardened steel without lubrication. At light loads, low speeds, and low temperatures, mild wear begins when sufficient time is available to establish a protective surface film by oxidation; in addition, mild wear also occurs at heavy loads, high speeds and high temperatures because of an increase in the rate of oxidation. The topography and composition of the films generated on the brass during mild wear have been examined by reflexion electron microscopy and X-ray micro-analysis. The presence of a relatively large proportion of iron oxide in the surface layers, originating from the steel, increases their hardness and, in turn, causes wear of the steel itself. The variation of the rates of mild wear with load and speed is complex and, in contrast to the severe wear process, there is no unique mechanism of wear. It is concluded that mild wear of brass results from the combined effects of intermittent metal-to-metal contact, abrasion by oxide particles, and flaking of the oxide layers from the surface.

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