Contribution à l'étude des effets de charge sur l'émission X des matériaux isolants non métallisés
The presence of charges perturbs the X-microanalysis on insulator samples. Attempts to suppress these effects have been fruitless and a better understanding of the charge phenomenon is the only way to a clear interpretation of the results of a X-microanalysis. From a simulation of the charges implanted by an electron beam on an insulator target, we compute, as a fuction of the integrated dose, the characteristics of the emitted X-rays, such as the generating function ϕ (ρ z) or the intensity of the characteristic lines. We underline the role of the electric field on the primary beam and on the electron trajectories in the target. These results allow the analysis of experimentally measured X-rays. Our studies on the effects of the diameter of the probe and on the exposure time led us to establish the best conditions for the successful X-microanalysis of an insulator. [Journal translation]