STRUCTURE SIZE'S EFFECT ON THE PERFORMANCE OF THE SPM PIEZOELECTRIC MICROCANTILEVER
For the piezoelectric microcantilever, a device is designed for the IPC-208B type scanning probe microscope. We analyzed the structure size's effect on the piezoelectric cantilever device, and find that the deformation displacement of the cantilever tip depends mainly on the length, while the output voltage of piezoelectric layer depends on the aspect ratio of cantilever itself. We choose the device structure as the length and width dimensions of 200 μm × 40 μm, piezoelectric thickness of 2.0 μm, and electrode layer of 0.2 μm for the experimental analysis. We conclude that the device voltage sensitivity is 0.43 mV/nN, and tip displacement sensitivity up to 4.6 nm/nN, which shows that the output voltage is in the mV-level, is easy to meet the input requirements of testing circuit. The differentiable range can be in nanometer scale, which meets the SPM work requirements, and the device performance is considerable.