Temperature Dependence of Piezoresistance in P-Type PbTe

1963 ◽  
Vol 18 (9) ◽  
pp. 1343-1343 ◽  
Author(s):  
Ryoichi Ito ◽  
Kisaburo Shogenji
2015 ◽  
Vol 45 (4) ◽  
pp. 2087-2091 ◽  
Author(s):  
Shirong Zhao ◽  
Heather McFavilen ◽  
Shuo Wang ◽  
Fernando A. Ponce ◽  
Chantal Arena ◽  
...  

1999 ◽  
Vol 607 ◽  
Author(s):  
F. Szmulowicz ◽  
A. Shen ◽  
H. C. Liu ◽  
G. J. Brown ◽  
Z. R. Wasilewski ◽  
...  

AbstractThis paper describes a study of the photoresponse of long-wavelength (LWIR) and mid-infrared (MWIR) p-type GaAs/AlGaAs quantum well infrared photodetectors (QWIPs) as a function of temperature and QWIP parameters. Using an 8x8 envelope-function model (EFA), we designed and calculated the optical absorption of several bound-to-continuum (BC) structures, with the optimum designs corresponding to the second light hole level (LH2) coincident with the top of the well. For the temperature-dependent study, one non-optimized LWIR and one optimized MWIR samples were grown by MBE and their photoresponse and absorption characteristics measured to test the theory. The theory shows that the placement of the LH2 resonance at the top of the well for the optimized sample and the presence of light-hole-like quasi-bound states within the heavy-hole continuum for the nonoptimized sample account for their markedly different thermal and polarization characteristics. In particular, the theory predicts that, for the LWIR sample, the LH-like quasi-bound states should lead to an increased Ppolarized photoresponse as a function of temperature. Our temperature dependent photoresponse measurements corroborate most of the theoretical findings with respect to the long-wavelength threshold, shape, and polarization and temperature dependence of the spectra.


1995 ◽  
Vol 378 ◽  
Author(s):  
S.R. Smith ◽  
A.O. Evwaraye ◽  
W.C. Mitchel

AbstractWe have examined the temperature dependence of the barrier height of Au, Ag, Ni, and Al, metal-semiconductor contacts on n-type 6H-SiC, and Al metal-semiconductor contacts on p-type 6H-SiC. The barrier height was determined from the (1/C2) vs VR characteristics of the contacts at temperatures ranging from 300K to 670K. The measurements were made at 1 MHz. These measurements were compared to I-V measurements at various temperatures, and to the behavior predicted by standard models.


1989 ◽  
Vol 175 ◽  
Author(s):  
L. P. Rector ◽  
D. DeGroot ◽  
T. J. Marks ◽  
S. H. Carr

AbstractElectrically conducting composite polypyrrole/poly(p-phenyleneterephthalamide) (PPTA or KEVLAR) fibers have been prepared by chemical polymerization of pyrrole within the interstices of the hydrogen-bonded gel structure of never-dried PPTA fibers. The resultant fibers contain a uniform dispersion of polypyrrole, as evidenced by scanning electron microscopy. The temperature dependence of the electrical conductivity of these hybrid fibers is presented. The conductivity is well described by the fluctuation-induced charge transport model over the entire temperature range of interest. However, the low temperature electrical conductivity also exhibits a hoppinglike temperature dependence, and an Arrhenius-like temperature dependence is observed in the high temperature limit. Measurements of the temperaturedependent tbermopower are indicative of a p-type carrier.


2006 ◽  
Vol 527-529 ◽  
pp. 633-636 ◽  
Author(s):  
Sylvie Contreras ◽  
Marcin Zielinski ◽  
Leszek Konczewicz ◽  
Caroline Blanc ◽  
Sandrine Juillaguet ◽  
...  

We report on investigation of p-type doped, SiC wafers grown by the Modified- Physical Vapor Transport (M-PVT) method. SIMS measurements give Al concentrations in the range 1018 to 1020 cm-3, with weak Ti concentration but large N compensation. To measure the wafers’ resistivity, carrier concentration and mobility, temperature-dependant Hall effect measurements have been made in the range 100-850 K using the Van der Pauw method. The temperature dependence of the mobility suggests higher Al concentration, and higher compensation, than estimated from SIMS. Additional LTPL measurements show no evidence of additional impurities in the range of investigation, but suggest that the additional compensation may come from an increased concentration of non-radiative centers.


2008 ◽  
Vol 22 (14) ◽  
pp. 2309-2319 ◽  
Author(s):  
K. ERTURK ◽  
M. C. HACIISMAILOGLU ◽  
Y. BEKTORE ◽  
M. AHMETOGLU

The electrical characteristics of Cr / p – Si (100) Schottky barrier diodes have been measured in the temperature range of 100–300 K. The I-V analysis based on thermionic emission (TE) theory has revealed an abnormal decrease of apparent barrier height and increase of ideality factor at low temperature. The conventional Richardson plot exhibits non-linearity below 200 K with the linear portion corresponding to activation energy 0.304 eV and Richardson constant (A*) value of 5.41×10-3 Acm-2 K -2 is determined from the intercept at the ordinate of this experimental plot, which is much lower than the known value of 32 Acm-2 K -2 for p-type Si . It is demonstrated that these anomalies result due to the barrier height inhomogeneities prevailing at the metal-semiconductor interface. Hence, it has been concluded that the temperature dependence of the I-V characteristics of the Cr/p – Si Schottky barrier diode can be successfully explained on the basis of TE mechanism with a Gaussian distribution of the barrier heights. Furthermore, the value of the Richardson constant found is much closer than that obtained without considering the inhomogeneous barrier heights.


1991 ◽  
Vol 168 (1) ◽  
pp. K19-K21 ◽  
Author(s):  
A. G. Kazanskii ◽  
S. V. Kuznetsov
Keyword(s):  
Type A ◽  

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