Synchrotron X-ray Microbeam Characteristics for X-ray Fluorescence Analysis

1994 ◽  
Vol 38 ◽  
pp. 283-289
Author(s):  
A. Iida ◽  
T. Noma

X-ray fluorescence analysis using a synchrotron x-ray microprobe has become an indispensable technique for non-destructive micro-analysis. One of the most important parameters that characterize the x-ray microbeam system for x-ray fluorescence analysis is the beam size. For practical analysis, however, the photon flux, the energy resolution and the available energy range are also crucial. Three types of x-ray microbeam systems, including monochromatic and continuum excitation systems, were compared with reference to the sensitivity, the minimum detection limit and the applicability to various types of x-ray spectroscopic analysis.

2021 ◽  
Vol 13 (5) ◽  
Author(s):  
Viktória Mozgai ◽  
Bernadett Bajnóczi ◽  
Zoltán May ◽  
Zsolt Mráv

AbstractThis study details the non-destructive chemical analysis of composite silver objects (ewers, situlas, amphora and casket) from one of the most significant late Roman finds, the Seuso Treasure. The Seuso Treasure consists of fourteen large silver vessels that were made in the fourth–early fifth centuries AD and used for dining during festive banquets and for washing and beautification. The measurements were systematically performed along a pre-designed grid at several points using handheld X-ray fluorescence analysis. The results demonstrate that all the objects were made from high-quality silver (above 90 wt% Ag), with the exception of the base of the Geometric Ewer B. Copper was added intentionally to improve the mechanical properties of soft silver. The gold and lead content of the objects shows constant values (less than 1 wt% Au and Pb). The chemical composition as well as the Bi/Pb ratio suggests that the parts of the composite objects were manufactured from different silver ingots. The ewers were constructed in two ways: (i) the base and the body were made separately, or (ii) the ewer was raised from a single silver sheet. The composite objects were assembled using three methods: (i) mechanical attachment; (ii) low-temperature, lead-tin soft solders; or (iii) high-temperature, copper-silver hard solders. Additionally, two types of gilding were revealed by the XRF analysis, one with remnants of mercury, i.e. fire-gilding, and another type without remnants of mercury, presumably diffusion bonding.


1995 ◽  
Vol 90 ◽  
pp. 137-153 ◽  
Author(s):  
K. Demakopoulou ◽  
E. Mangou ◽  
R. E. Jones ◽  
E. Photos-Jones

Current technical interest in the nature of the black inlaid decoration on ancient metalware has stimulated an examination of some of the well-known bronze daggers, silver vessels, and other fragments, all with inlaid decoration and dating to the 16–14th centuries BC, from Mycenae, Prosymna, Dendra, Routsi, and Pylos. Results of non-destructive X-ray fluorescence analysis point to great versatility in working with copper (or bronze)–gold–silver alloys. The black inlaid decoration is usually copper/bronze–gold alloy with small quantities of silver. Four of the objects were also examined by X-ray radiography.


2013 ◽  
Vol 20 (4) ◽  
pp. 541-549 ◽  
Author(s):  
J. Strempfer ◽  
S. Francoual ◽  
D. Reuther ◽  
D. K. Shukla ◽  
A. Skaugen ◽  
...  

The resonant scattering and diffraction beamline P09 at PETRA III is designed for X-ray experiments requiring small beams, energy tunability, variable polarization and high photon flux. It is highly flexible in terms of beam size and offers full higher harmonic suppression. A state-of-the-art double phase-retarder set-up provides variable linear or circular polarization. A high-precision Psi-diffractometer and a heavy-load diffractometer in horizontal Psi-geometry allow the accommodation of a wide variety of sample environments. A 14 T cryo-magnet is available for scattering experiments in magnetic fields.


Author(s):  
Enrico Franceschi ◽  
Dion Nole ◽  
Stefano Vassallo

Aims: The present study is part of a project concerning the characterisation of a limited number of selected Albanian Byzantine and post-Byzantine icons, through the identification of pigments, of painting technique and the state of conservation of the artworks. The Albanian iconographers produced an extraordinary amount of icons from the 14th till the 19th century, and over six thousand of them are kept in the Museum of Medieval Art of Korça (Albania). This paper refers to the results obtained in the study of two artworks, the first one by Simoni i Ardenices an important Albanian painter of XVII century, and the second one attributed to him. Study Design:  The present work is part of a more general study concerning Albanian Byzantine and post-Byzantine icons. Place and Duration of Study: Museum of Medieval Art of Korça, Albania, between June 2008 and July 2009. Methodology: The work was conducted by non-destructive methods, X-ray fluorescence, visible light reflectance spectrophotometry and UV fluorescence analysis, according to a systematic procedure developed in the same Chemical Physical Laboratory for Cultural Heritage. A number of areas, for each painting, were chosen in order to carry out the measurements. With this procedure, we could identify the inorganic pigments from their characteristic features. Moreover, the study of the chemical physical properties of paintings is of fundamental importance for any accurate restoration intervention.  Results and Conclusion: The present work, concerning the study of two icons of the second half of 17th century by Simoni i Ardenices, has allowed us to identify the painting technique and the palette used in these works of art. Moreover, the areas of the paintings in which old restorations have been made have also been identified.


Author(s):  
J. Walter ◽  
W. Mack ◽  
C.Y. Lee ◽  
C. Gspan

Abstract The analysis of thin layers in semiconductor components represents a central point in the quality control of semiconductor companies. Not only to control production processes, but to successfully operate also reverse engineering, reliable thin-film measurement methods are essential. In this work, non-destructive thin film EDX (energy dispersive X-ray micro analysis) software and μXRF (micro x-ray fluorescence analysis) were compared with TEM analysis. These methods ensure a high lateral resolution which is essential in the analysis of semiconductor structures. As an example, four different, for the semiconductor industry interesting, very thin coating systems in the nanometer range have been tested. In the individual cases best TEM detector contrast settings could be found, as well as optimum fluorescence lines settings on the EDX to minimize the errors. The TEM measurements, in thickness and composition, were compared to the thin film EDX software and the μXRF method results to determine their accuracy. It turns out that depending on the layer system recalibration with multilayer standards or at least with elemental standards is recommended. It could be shown that with μXRF and thin film EDX a reliable, rapid and non-destructive layer analysis is possible.


2013 ◽  
Vol 103 (11) ◽  
pp. 113904 ◽  
Author(s):  
C. Streeck ◽  
S. Brunken ◽  
M. Gerlach ◽  
C. Herzog ◽  
P. Hönicke ◽  
...  

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