New indirect estimation technique for the determination of the moisture diffusivity from transient moisture content profiles measured by means of X-ray radiography

In the paper is presented calculation of hygric properties of hollow brick block. Namely it is adsorption isotherm, water vapour diffusion resistance factor and moisture diffusivity. The brick block cavities was filled only by air. In first step the properties of brick body were measured. Then the properties of the whole brick block were calculated by using homogenisation techniques.

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Experimental determination of effective moisture diffusivity during the drying of clean olive stone: Dependence of temperature, moisture content and sample thickness

Fuel Processing Technology ◽

10.1016/j.fuproc.2015.03.018 ◽

2015 ◽

Vol 137 ◽

pp. 320-326 ◽

Cited By ~ 18

Author(s):

Francisco J. Gómez-de la Cruz ◽

José M. Palomar-Carnicero ◽

Pedro J. Casanova-Peláez ◽

Fernando Cruz-Peragón

Keyword(s):

Moisture Content ◽

Experimental Determination ◽

Moisture Diffusivity ◽

Sample Thickness ◽

Effective Moisture Diffusivity ◽

Effective Moisture ◽

Olive Stone

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Improved method based on dual-energy X-ray absorptiometry for nondestructive evaluation of solid wood moisture content

Holzforschung ◽

10.1515/hf-2014-0295 ◽

2015 ◽

Vol 69 (9) ◽

pp. 1133-1136 ◽

Cited By ~ 3

Author(s):

Takashi Tanaka

Keyword(s):

Moisture Content ◽

Pure Water ◽

Solid Wood ◽

Dual Energy ◽

Wood Moisture ◽

Strong Negative Correlation ◽

X Ray ◽

Wide Range ◽

Better Than

Abstract An accurate, rapid, and convenient method is presented for moisture content (MC) determination of solid wood based on dual-energy X-ray absorptiometry (DXA). Poly(methyl methacrylate)-equivalent thicknesses (PMMA-EThs) of sugi (Cryptomeria japonica D. Don) wood blocks and pure water were measured by means of a wide range of X-ray tube voltages (20–100 kV). The ratio of the PMMA-ETh of pure water to that of wood decreased as X-ray tube voltage was increased, suggesting that an appropriate pair of tube voltages for DXA is 20 and 100 kV. According to this result, X-ray images of 30 wood samples were taken at 20- and 100-kV tube voltages, and their average PMMA-Eths from both images was determined. There was a strong negative correlation between the wet-basis MC of the wood sample and the ratio of its PMMA-Eth at 100 kV to that at 20 kV. A regression equation was developed for estimating the dry-basis MC of wood samples from their PMMA-ETh ratios. The standard error of estimate was 2.2%, which is better than those determined for electric moisture meters. This approach may lead to the development of a practical, nondestructive moisture meter for wood.

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Lateral resolution of the electron microbeam analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109859 ◽

1978 ◽

Vol 36 (1) ◽

pp. 542-543

Author(s):

H.J. Dudek

Keyword(s):

Quantitative Analysis ◽

Depth Resolution ◽

Lateral Resolution ◽

Cylindrical Particle ◽

Correction Procedure ◽

X Ray ◽

Element Concentrations ◽

Microbeam Analysis ◽

The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

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Sem and X-Ray Analysis of Renal and Biliary Calculi

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100091512 ◽

1976 ◽

Vol 34 ◽

pp. 306-307

Author(s):

R. J. Narconis ◽

G. L. Johnson

Keyword(s):

Chemical Constituents ◽

Natural State ◽

X Ray Diffraction ◽

Chemical Methods ◽

X Ray ◽

Additional Dimension ◽

Biliary Calculi ◽

Calculus Formation ◽

Scanning Electron

Analysis of the constituents of renal and biliary calculi may be of help in the management of patients with calculous disease. Several methods of analysis are available for identifying these constituents. Most common are chemical methods, optical crystallography, x-ray diffraction, and infrared spectroscopy. The application of a SEM with x-ray analysis capabilities should be considered as an additional alternative.A scanning electron microscope equipped with an x-ray “mapping” attachment offers an additional dimension in its ability to locate elemental constituents geographically, and thus, provide a clue in determination of possible metabolic etiology in calculus formation. The ability of this method to give an undisturbed view of adjacent layers of elements in their natural state is of advantage in determining the sequence of formation of subsequent layers of chemical constituents.

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Preparation And elemental analysis of ancient fibers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100126846 ◽

1987 ◽

Vol 45 ◽

pp. 410-411

Author(s):

Allen Angel ◽

Kathryn A. Jakes

Keyword(s):

Cross Sections ◽

Physical Structure ◽

Energy Dispersive ◽

Archaeological Sites ◽

X Ray ◽

Long Term Storage ◽

Backscattered Electron ◽

Electron Imaging

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.

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Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100134922 ◽

1990 ◽

Vol 48 (2) ◽

pp. 264-265

Author(s):

D. R. Liu ◽

S. S. Shinozaki ◽

R. J. Baird

Keyword(s):

Thin Film ◽

Thin Films ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Compound Semiconductors ◽

Energy Dispersive Analysis ◽

X Ray ◽

Metastable Alloys ◽

Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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