Evaluation of Subsurface Damage and Surface Roughness by Light Scattering Techniques

2014 ◽  
Author(s):  
Marcus Trost ◽  
Sven Schröder ◽  
Angela Duparré
Keyword(s):  
Surface Roughness ◽  
Light Scattering ◽  
Subsurface Damage

Experimental investigation and modelling of light scattering in a-Si:H solar cells deposited on glass/ZnO:Al substrates

2002 ◽  
Vol 715 ◽  
Author(s):  
J. Krc ◽  
M. Zeman ◽  
O. Kluth ◽  
F. Smole ◽  
M. Topic
Keyword(s):  
Surface Roughness ◽  
Experimental Investigation ◽  
Solar Cells ◽  
Angular Distribution ◽  
Light Scattering ◽  
Optical Model ◽  
Distribution Functions ◽  
Interface Roughness ◽  
Scattering Parameters ◽  
Good Agreement

AbstractThe descriptive scattering parameters, haze and angular distribution functions of textured ZnO:Al transparent conductive oxides with different surface roughness are measured. An approach to determine the scattering parameters of all internal interfaces in p-i-n a-Si:H solar cells deposited on the glass/ZnO:Al substrates is presented. Using the determined scattering parameters as the input parameters of the optical model, a good agreement between the measured and simulated quantum efficiencies of the p-i-n a-Si:H solar cells with different interface roughness is achieved.

Regimes of surface roughness measurable with light scattering

1993 ◽  
Vol 32 (19) ◽  
pp. 3401 ◽  
Author(s):  
Theodore V. Vorburger ◽  
Egon Marx ◽  
Thomas R. Lettieri
Keyword(s):  
Surface Roughness ◽  
Light Scattering

Light scattering by irregular particles much larger than the wavelength with wavelength-scale surface roughness

2016 ◽  
Vol 41 (15) ◽  
pp. 3491 ◽  
Author(s):  
Yevgen Grynko ◽  
Yuriy Shkuratov ◽  
Jens Förstner
Keyword(s):  
Surface Roughness ◽  
Light Scattering ◽  
Wavelength Scale ◽  
Scale Surface

Characterisation of surface roughness by laser light scattering: specularly scattered intensity measurement

Wear ◽  
1997 ◽  
Vol 209 (1-2) ◽  
pp. 328-337 ◽  
Author(s):  
J.C. Le Bosse ◽  
G. Hansali ◽  
J. Lopez ◽  
T. Mathia
Keyword(s):  
Surface Roughness ◽  
Light Scattering ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Intensity Measurement ◽  
Scattered Intensity

scholarly journals Identification of Plastic Type and Surface Roughness of Film-Type Plastics in Water Using Kramers–Kronig Analysis

Chemosensors ◽  
2020 ◽  
Vol 8 (4) ◽  
pp. 88
Author(s):  
Boniphace Elphace Kanyathare ◽  
Benjamin Asamoah ◽  
Muhammad Umair Ishaq ◽  
James Amoani ◽  
Jukka Räty ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Light Scattering ◽  
Optical Detection ◽  
Nir Spectroscopy ◽  
Water Bodies ◽  
Complex Environment ◽  
Large Size ◽  
Film Type ◽  
Plastic Type

The knowledge of the plastic type, thickness, and the nature of the surface is important towards the monitoring of microplastic pollution in water bodies, especially when vis-NIR spectroscopy is utilized. Factors such as complex environment and surface roughness induced-light scattering of the probing light limit the optical detection of these parameters in in-situ measurements, however. In this paper, a novel application of Kramers–Kronig analysis was exploited to identify both smooth and rough film-type macroplastics with unknown thickness. This method is particularly useful in the in-situ identification of unknown film-like macroplastics; although the sample is large, the ratio function is detected from an area that corresponds to the size of a MP. Therefore, it can be applied for the case of large size MPs. The validity of the method was demonstrated using transmittance data for smooth and roughened plastics given in Kanyathare et al., 2020.

scholarly journals Dense, Strong, and Precise Silicon Nitride-Based Ceramic Parts by Lithography-Based Ceramic Manufacturing

2020 ◽  
Vol 10 (3) ◽  
pp. 996 ◽  
Author(s):  
Altan Alpay Altun ◽  
Thomas Prochaska ◽  
Thomas Konegger ◽  
Martin Schwentenwein
Keyword(s):  
Surface Roughness ◽  
High Temperature ◽  
Light Scattering ◽  
Silicon Nitride ◽  
Material Properties ◽  
Refractive Indices ◽  
High Relative Density ◽  
Ceramic Manufacturing ◽  
High Level ◽  
First Time

Due to the high level of light absorption and light scattering of dark colored powders connected with the high refractive indices of ceramic particles, the majority of ceramics studied via stereolithography (SLA) have been light in color, including ceramics such as alumina, zirconia and tricalcium phosphate. This article focuses on a lithography-based ceramic manufacturing (LCM) method for β-SiAlON ceramics that are derived from silicon nitride and have excellent material properties for high temperature applications. This study demonstrates the general feasibility of manufacturing of silicon nitride-based ceramic parts by LCM for the first time and combines the advantages of SLA, such as the achievable complexity and low surface roughness (Ra = 0.50 µm), with the typical properties of conventionally manufactured silicon nitride-based ceramics, such as high relative density (99.8%), biaxial strength (σf = 764 MPa), and hardness (HV10 = 1500).

scholarly journals Laser-assisted grinding of reaction-bonded SiC

2020 ◽  
Vol 3 (2) ◽  
pp. 93-98
Author(s):  
Xichun Luo ◽  
Zhipeng Li ◽  
Wenlong Chang ◽  
Yukui Cai ◽  
Jining Sun ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Process Development ◽  
Thermal Control ◽  
Subsurface Damage ◽  
Experimental Comparison ◽  
Depth Of Cut ◽  
Machined Surface ◽  
Control Approach ◽  
Damage Layer ◽  
Conventional Grinding

The article presents the development of a novel laser-assisted grinding (LAG) process to reduce surface roughness and subsurface damage in grinding reaction-bonded silicon carbide (RB-SiC). A thermal control approach is proposed to facilitate the process development, in which a two-temperature model (TTM) is applied to control the required laser power to thermal softening of RB-SiC prior to the grinding operation without melting the workpiece or leaving undesirable microstructural alteration. Fourier’s law is adopted to obtain the thermal gradient for verification. An experimental comparison of conventional grinding and LAG shows significant reduction of machined surface roughness (37%–40%) and depth of subsurface damage layer (22%–50.6%) using the thermal control approach under the same grinding conditions. It also shows high specific grinding energy 1.5 times that in conventional grinding at the same depth of cut, which accounts for the reduction of subsurface damage as it provides enough energy to promote ductile-regime material removal.

Experimental Investigation on Surface/Subsurface Damage in Rotary Ultrasonic Machining of Glass BK7

2013 ◽  
Vol 325-326 ◽  
pp. 1357-1361 ◽  
Author(s):  
Yan Hua Huang ◽  
Dong Xi Lv ◽  
Yong Jian Tang ◽  
Hong Xiang Wang ◽  
Hai Jun Zhang
Keyword(s):  
Surface Roughness ◽  
Ultrasonic Vibration ◽  
Process Parameters ◽  
Subsurface Damage ◽  
Spindle Speed ◽  
Feed Speed ◽  
Ultrasonic Machining ◽  
Rotary Ultrasonic Machining ◽  
Cutting Depth ◽  
Influence Of Process Parameters

Experiments were carried out to study the effect of ultrasonic vibration on the surface roughness and subsurface damage (SSD) in rotary ultrasonic machining (RUM) of glass BK7. As a comparison, some conventional grinding (CG) experiments were also performed under the same process parameters with there of the RUM ones. The surface roughness of the RUM/CG samples was measured with a surface profilometer. The SSD of these specimens was assessed and characterized by a measuring microscope with the help of the taper polishing method. Also, the influence of process parameters (cutting depth, feed speed, and spindle speed) on the surface/subsurface quality was discussed. As a result, both the surface roughness and the SSD depth of the RUM/CG specimens were reduced with the increased spindle speed, while increased with the increasing of feed speed and cutting depth of the diamond tool. Compared with the CG process, the introduction of ultrasonic vibration resulted in the higher surface roughness and SSD depth, due to the fact that the max cutting depth of the abrasive in the RUM process increased by an amplitude compared with that in the CG process.

The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering

2006 ◽  
Author(s):  
M. L. Zanaveskin ◽  
Yu. V. Grishchenko ◽  
A. L. Tolstikhina ◽  
V. E. Asadchikov ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Light Scattering ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering
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