Characterizing high-pressure compressed C60 whiskers and C60 powder
2003 ◽
Vol 18
(1)
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pp. 166-172
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Keyword(s):
X Ray
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Structural, mechanical, and electrical properties were examined for C60 whiskers, high-pressure sintered C60 whiskers, and C60 powder. A high density of dislocations was observed in the C60 whiskers, and the C60 whiskers with diameters of a few hundred nanometers were found to be flexible. Although both the specimens sintered under the same condition showed similar surface x-ray diffraction profiles with a strong accumulation of [110]tr orientation, the sintered C60 whiskers showed a higher micro-Vickers hardness and an electrical resistivity four orders of magnitude lower than that of the sintered C60 powder.