Mechanical behavior of individual WS2 nanotubes

2004 ◽  
Vol 19 (2) ◽  
pp. 454-459 ◽  
Author(s):  
I. Kaplan-Ashiri ◽  
S.R. Cohen ◽  
K. Gartsman ◽  
R. Rosentsveig ◽  
G. Seifert ◽  
...  
Keyword(s):  
Mechanical Behavior ◽  
Young’S Modulus ◽  
Density Functional ◽  
Young's Modulus ◽  
Bulk Material ◽  
Tight Binding ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Microscope Imaging ◽  
Single Wall Nanotubes

The Young's modulus of WS2 nanotubes is an important property for various applications. Measurements of the mechanical properties of individual nanotubes are challenged by their small size. In the current work, atomic force microscopy was used to determine the Young's modulus of an individual multiwall WS2 nanotube, which was mounted on a silicon cantilever. The buckling force was measured by pushing the nanotube against a mica surface. The average Young's modulus of an individual WS2 nanotube, which was calculated by using Euler's equation, was found to be 171 GPa. First-principle calculations of the Young's modulus of MoS2 single-wall nanotubes using density-functional–based tight-binding method resulted in a value (230 GPa) that is close to that of the bulk material. Furthermore, the diameter dependence of the Young's modulus in both zigzag and armchair configuration was studied and was found to approach the bulk value for nanotubes with few-nanometer diameters. Similar behavior is expected for WS2 nanotubes. The mechanical behavior of the WS2 nanotubes as atomic force microscope imaging tips gave further support for the measured Young's modulus.

Direct Tensile Tests of Individual WS2 Nanotubes

2005 ◽  
Vol 475-479 ◽  
pp. 4097-4102 ◽  
Author(s):  
I. Kaplan-Ashiri ◽  
S.R. Cohen ◽  
K. Gartsman ◽  
R. Rosentsveig ◽  
V. Ivanovskaya ◽  
...  
Keyword(s):  
Young’S Modulus ◽  
Young's Modulus ◽  
Tight Binding ◽  
Md Simulations ◽  
Tensile Tests ◽  
Average Value ◽  
Atomic Force ◽  
Direct Tensile ◽  
Single Wall Nanotubes ◽  
Good Agreement

The Young’s modulus of WS2 nanotubes is an important property for various applications. Measurements of the mechanical properties of individual nanotubes are challenging because of the small size of the tubes. Lately, measurements of the Young’s modulus by buckling of an individual nanotube using an atomic force microscope1 resulted in an average value of 171GPa. Tensile tests of individual WS2 nanotubes were performed experimentally using a scanning electron microscope and simulated tensile tests of MoS2 nanotubes were performed by means of a densityfunctional tight-binding (DFTB) based molecular dynamics (MD) scheme. Preliminary results for WS2 nanotubes show Young’s modulus value of ca.162GPa, tensile strength value of ca. 13GPa and average elongation of ca. 12%. MD simulations resulted in elongation of 19% for zigzag and 17% for armchair MoS2 single wall nanotubes. Since MoS2 and WS2 nanotubes have similar structures the same behavior is expected for both, hence there is a good agreement regarding the elongation of WS2 nanotubes between experiment and simulation.

Young’s Modulus Measurement of Electroplated Nickel Using AFM

2006 ◽  
Author(s):  
Sang-Hyun Kim ◽  
James G. Boyd
Keyword(s):  
Elastic Modulus ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Beam Theory ◽  
Spring Constant ◽  
Time Step ◽  
Simple Method ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Afm Cantilever

This paper addresses a relatively simple method of measuring Young's modulus of electroplated nickel using Atomic Force Microscope. Thin layer of nickel to be measured is electroplated onto the tip side of AFM silicon cantilever, whose Young's modulus and the geometric dimensions are defined from manufacturer. The resonant frequency and the quality factor of the electroplated AFM cantilever are measured by the tapping mode of AFM and its spring constant is calculated using Sader's method. The spring constant of the electroplated cantilever is also calculated by using the laminar composite beam theory. Comparing two spring constants, Young's modulus of the electroplated nickel is determined. The measured elastic modulus of nickel in each time step is in the range of between and the average elastic modulus is with relative uncertainty of less than 5%

Mechanical behavior of glass fiber‐reinforced Nylon‐6 syntactic foams and its Young's modulus numerical study

2021 ◽  
Vol 138 (27) ◽  
pp. 50648 ◽  
Author(s):  
Roberto Yáñez‐Macías ◽  
Jorge E. Rivera‐Salinas ◽  
Silvia Solís‐Rosales ◽  
Daniel Orduña‐Altamirano ◽  
David Ruíz‐Mendoza ◽  
...  
Keyword(s):  
Mechanical Behavior ◽  
Glass Fiber ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Numerical Study ◽  
Nylon 6 ◽  
Syntactic Foams ◽  
Fiber Reinforced ◽  
Glass Fiber Reinforced

Coating agent-induced mechanical behavior of 3D self-assembled nanocrystals

2017 ◽  
Vol 19 (35) ◽  
pp. 23887-23897 ◽  
Author(s):  
Arzu Çolak ◽  
Jingjing Wei ◽  
Imad Arfaoui ◽  
Marie-Paule Pileni
Keyword(s):  
Mechanical Behavior ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Three Dimensional ◽  
Coating Agent ◽  
Self Assembled

The Young's modulus of three-dimensional self-assembled Ag nanocrystals, as so-called supracrystals, is correlated with the type of coating agent as well as the nanocrystal morphology.

Ultrasonically synthesized organic liquid-filled chitosan microcapsules: part 2: characterization using AFM (atomic force microscopy) and combined AFM–confocal laser scanning fluorescence microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (16) ◽  
pp. 3192-3201 ◽  
Author(s):  
Srinivas Mettu ◽  
Qianyu Ye ◽  
Meifang Zhou ◽  
Raymond Dagastine ◽  
Muthupandian Ashokkumar
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Young’S Modulus ◽  
Laser Scanning ◽  
Young's Modulus ◽  
Organic Liquid ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy (AFM) is used to measure the stiffness and Young's modulus of individual microcapsules that have a chitosan cross-linked shell encapsulating tetradecane.

Measuring Young’s modulus of biological objects in a liquid medium using an atomic force microscope with a special probe

2009 ◽  
Vol 35 (4) ◽  
pp. 371-374 ◽  
Author(s):  
D. V. Lebedev ◽  
A. P. Chuklanov ◽  
A. A. Bukharaev ◽  
O. S. Druzhinina
Keyword(s):  
Atomic Force Microscope ◽  
Liquid Medium ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Biological Objects ◽  
Atomic Force

scholarly journals Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

2019 ◽  
Vol 9 (13) ◽  
pp. 2604 ◽  
Author(s):  
Ashley D. Slattery ◽  
Adam J. Blanch ◽  
Cameron J. Shearer ◽  
Andrew J. Stapleton ◽  
Renee V. Goreham ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Correction Factor ◽  
Young's Modulus ◽  
Spring Constant ◽  
Beam Equation ◽  
Euler Beam ◽  
Plan View ◽  
Atomic Force

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial when quantifying adhesive forces, material properties of surfaces, and in determining deposited mass for sensing applications. A key component in the spring constant of a cantilever is the plan-view shape. In recent years, the trapezoidal plan-view shape has become available since it offers certain advantages to fast-scanning AFM and can improve sensor performance in fluid environments. Euler beam equations relating cantilever stiffness to the cantilever dimensions and Young’s modulus have been proven useful and are used extensively to model cantilever mechanical behaviour and calibrate the spring constant. In this work, we derive a simple correction factor to the Euler beam equation for a beam-shaped cantilever that is applicable to any cantilever with a trapezoidal plan-view shape. This correction factor is based upon previous analytical work and simplifies the application of the previous researchers formula. A correction factor to the spring constant of an AFM cantilever is also required to calculate the torque produced by the tip when it contacts the sample surface, which is also dependent on the plan-view shape. In this work, we also derive a simple expression for the torque for triangular plan-view shaped cantilevers and show that for the current generation of trapezoidal plan-view shaped AFM cantilevers, this will be a good approximation. We shall apply both these correction factors to determine Young’s modulus for a range of trapezoidal-shaped AFM cantilevers, which are specially designed for fast-scanning. These types of AFM probes are much smaller in size when compared to standard AFM probes. In the process of analysing the mechanical properties of these cantilevers, important insights are also gained into their spring constant calibration and dimensional factors that contribute to the variability in their spring constant.

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