Growth of Bi2Se3 Films by Chemical Bath Deposition at Room Temperature

2014 ◽  
Vol 1630 ◽  
Author(s):  
Sovannary Phok ◽  
Fatima Subait Al Wahshi ◽  
Shifaa Mohsen Al Baity ◽  
Saeed Ali Abdulla Yalyali
Keyword(s):  
Chemical Bath Deposition ◽  
Deposition Rate ◽  
Room Temperature ◽  
Ammonium Hydroxide ◽  
X Ray Diffraction ◽  
Atomic Force ◽  
Sodium Selenosulfate ◽  
Typical Composition ◽  
Film Roughness ◽  
Xrd Patterns

ABSTRACTBismuth selenide (BixSey) films are deposited onto glass substrate using chemical bath deposition at room temperature. The reacting bath contained bismuth nitrate, triethanolamine and sodium selenosulfate as selenium (Se) source. Ammonium hydroxide is used to adjust the pH of the bath. The films deposited in solutions containing Se source solution of 10 ml and 15 ml are characterized by surface morphological, compositional and structural, properties. The optimum deposition time is about 3 hours for both solutions. Films deposited up to 24 hours in bath with 10 ml Se source solution had thickness ranging up to 232 nm. The deposition rate is found to increase up to 61 nm/h for 3-hour deposition. In the case of bath with 15 ml Se source solution, the film thickness ranged from 45 nm to 632 nm for 1-hour to 24-hour deposition, respectively; with a deposition rate increasing up to 123 nm/h for 3-hour deposition. Film roughness of about 6.6 nm to 22.8 nm is measured by atomic force microscope for films deposited in bath containing 10 mL Se source and 15 ml of Se source, respectively. Crack free layers are observed with randomly large plate-like particles on top of the layer for some films. The films with typical composition of Bi21.8Se78.2 are found to be rich in Se when deposited for 6 hours, whereas the composition of a film deposited in the same bath (10 mL Se source) for 3 hours is found at Bi60.3Se39.6. Additionally, structural analysis performed by x-ray diffraction (XRD) did not reveal well-defined XRD patterns, which indicates that BixSey films were constituted mostly of nanocrystalline grains.

STRUCTURE AND MAGNETIC PROPERTIES OF MECHANICAL ALLOYED Mn-15at.%Al

2013 ◽  
Vol 12 (01) ◽  
pp. 1350006
Author(s):  
AHMED E. HANNORA ◽  
FARIED F. HANNA ◽  
LOTFY K. MAREI
Keyword(s):  
Thermal Analysis ◽  
Room Temperature ◽  
Average Crystallite Size ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Milled Sample ◽  
Powder Samples ◽  
Xrd Patterns ◽  
Method Analysis

Mechanical alloying (MA) method has been used to produce nanocrystallite Mn -15at.% Al alloy. X-ray diffraction (XRD) patterns for the as-milled elemental α- Mn and aluminum powder samples show a mixture of α + β- MnAl phases after 20 h of milling and changes to a dominant β- MnAl phase structure after 50 h. An average crystallite size of 40 nm was determined from Hall–Williamson method analysis after 5 h of milling. Moreover, the thermal analysis results using differential thermal analysis (DTA), suggested a possible phase transformation after 20 h of milling. Isothermal treatments are carried in the temperature range of 450°C to 1000°C. Room-temperature vibrating sample magnetometer (VSM) measurements of the hysteretic response revealed that the saturation magnetization Bs and coercivity Hc for 10 h ball milled sample are ~ 2.1 emu/g and ~ 92 Oe, respectively.

Effect of ultra-thin Cu underlayer on the magnetic properties of Ni80Fe50 / Fe50Mn50 films

1999 ◽  
Vol 562 ◽  
Author(s):  
C. Liu ◽  
L. Shen ◽  
H. Jiang ◽  
D. Yang ◽  
G. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Exchange Bias ◽  
Film Material ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Maximum Value ◽  
Film Roughness

ABSTRACTThe Ni80Fe20/Fe50Mn50,thin film system exhibits exchange bias behavior. Here a systematic study of the effect of atomic-scale thin film roughness on coercivity and exchange bias is presented. Cu (t) / Ta (100 Å) / Ni80Fe20 (100 Å) / Fe50Mno50 (200 Å) / Ta (200 Å) with variable thickness, t, of the Cu underlayer were DC sputtered on Si (100) substrates. The Cu underlayer defines the initial roughness that is transferred to the film material since the film grows conformal to the initial morphology. Atomic Force Microscopy and X-ray diffraction were used to study the morphology and texture of the films. Morphological characterization is then correlated with magnetometer measurements. Atomic Force Microscopy shows that the root mean square value of the film roughness exhibits a maximum of 2.5 Å at t = 2.4 Å. X-ray diffraction spectra show the films are polycrystalline with fcc (111) texture and the Fe50Mn50 (111) peak intensity decreases monotonically with increasing Cu thickness, t. Without a Cu underlayer, the values of the coercivity and loop shift are, Hc = 12 Oe and Hp = 56 Oe, respectively. Both the coercivity and loop shift change with Cu underlayer thickness. The coercivity reaches a maximum value of Hc= 36 Oe at t = 4 Å. The loop shift exhibits an initial increase with t, reaches a maximum value of HP = 107 Oe at t = 2.4 Å, followed by a decrease with greater Cu thickness. These results show that a tiny increase in the film roughness has a huge effect on the exchange bias magnitude.

Effect of DC Power on Structural and Hydrophilic Activity of TiO2 Films

2008 ◽  
Vol 55-57 ◽  
pp. 925-928 ◽  
Author(s):  
C. Salawan ◽  
A. Muakngam ◽  
B. Sukbot ◽  
K. Aiempanakit ◽  
Supattanapong Dumrongrattana
Keyword(s):  
Surface Roughness ◽  
Contact Angle ◽  
Tio2 Films ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Water Contact ◽  
X Ray ◽  
Dc Power ◽  
Atomic Force ◽  
Xrd Patterns

In this work, we present the effect of DC power from 100 W to 500 W on the structural and hydrophilic activity of TiO2 films. The TiO2 films were prepared by DC magnetron sputtering on the glass substrate without any external heating. The structure of TiO2 films were analyzed by atomic force microscope and X-ray diffraction. XRD patterns indicated the films were amorphous. The surface roughness and grain size were enlarged by the increasing of the DC power while the substrate temperature was climbed up with the increasing of the DC power. From the point of energetic ion bombardment, it was related with DC power between sputtering processes. The hydrophilic activity of TiO2 films were analyzed by the contact angle meter. The water contact angle decrease with increasing of the DC power.

The Study of Al-N Codoped ZnO Thin Films Prepared by DC Magnetron Sputtering

2015 ◽  
Vol 754-755 ◽  
pp. 591-594
Author(s):  
Haslinda Abdul Hamid ◽  
M.N. Abdul Hadi
Keyword(s):  
Magnetron Sputtering ◽  
Structural Investigation ◽  
Annealing Treatment ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oxygen Gas ◽  
Film Roughness

The codoped ZnO thin film were deposited by DC magnetron sputtering on silicon (111) followed by annealing treatment at 200 °C and 600 °C for 1 hour in nitrogen and oxygen gas mixture. Structural investigation was carried out by scanning electron microscopy (SEM), atomic force microscopy and x-ray diffraction (XRD). Film roughness and grain shape were found to be correlated with the annealing temperatures.

Reactive Sputtering Growth and Characterizations of InN Thin Films on Si Substrates

2012 ◽  
Vol 545 ◽  
pp. 290-293
Author(s):  
Maryam Amirhoseiny ◽  
Hassan Zainuriah ◽  
Ng Shashiong ◽  
Mohd Anas Ahmad
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Rf Magnetron Sputtering ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Nitrogen Gas ◽  
X Ray ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force

We have studied the effects of deposition conditions on the crystal structure of InN films deposited on Si substrate. InN thin films have been deposited on Si(100) substrates by reactive radio frequency (RF) magnetron sputtering method with pure In target at room temperature. The nitrogen gas pressure, applied RF power and the distance between target and substrate were 2×10-2 Torr, 60 W and 8 cm, respectively. The effects of the Ar–N2 sputtering gas mixture on the structural properties of the films were investigated by using scanning electron microscope, energy-dispersive X-ray spectroscopy, atomic force microscopy and X-ray diffraction techniques.

Phase formation and composition of Mn–Zn ferrite powders prepared by hydrothermal method

1999 ◽  
Vol 14 (1) ◽  
pp. 204-208 ◽  
Author(s):  
Wen-Hao Lin ◽  
Shiuh-Ke Jang Jean ◽  
Chii-Shyang Hwang
Keyword(s):  
Inductively Coupled Plasma ◽  
Hydrothermal Process ◽  
Ammonium Hydroxide ◽  
Significant Loss ◽  
Degree Of Crystallinity ◽  
Hydrothermal Time ◽  
X Ray Diffraction ◽  
Inductively Coupled ◽  
Zn Ferrite ◽  
Xrd Patterns

Mn–Zn ferrite powders were prepared by hydrothermally aging the coprecipitates of compositional metal ions using ammonium hydroxide as a precipitant. R value (alkalinity) = (moles of added OH−)/[(moles of added Zn2+) × 2 + (moles of added Mn2+) × 2 + (moles of added Fe3+) × 3] was introduced to adjust the amount of added ammonia. The results show that the R value of starting suspension and hydrothermal time have similar and dominant effects on the composition, spinel ratio, and crystallite size of synthesized powders. From the analyses of x-ray diffraction (XRD) and inductively-coupled plasma (ICP), it notes that no α–Fe2O3 peak in the XRD patterns of powders synthesized at R = 2–3, 150 °C × 2 h, may be due to lower degree of crystallinity and less amount of α–Fe2O3 existing in these powders. Both the increase of hydrothermal time and of R value can promote the crystallinity of powders and also cause a significant loss of zinc, hinting that in the hydrothermal process, the loss of zinc may play a crucial role in the crystallinity of hydrothermally synthesized powders.

An X-ray diffraction system with controlled relative humidity and temperature

1996 ◽  
Vol 11 (4) ◽  
pp. 288-289 ◽  
Author(s):  
H. Hashizume ◽  
S. Shimomura ◽  
H. Yamada ◽  
T. Fujita ◽  
H. Nakazawa ◽  
...  
Keyword(s):  
Relative Humidity ◽  
Room Temperature ◽  
Control Unit ◽  
Saturated Water Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Saturated Water ◽  
Sample Chamber ◽  
Diffraction Patterns ◽  
Xrd Patterns

A system enabling X-ray diffraction patterns under controlled conditions of relative humidity and temperature has been devised and combined with an X-ray powder diffractometer. Relative humidity in the sample space is controlled by mixing dry N2 gas with saturated water vapor. Temperatures of the sample and inner wall of the sample chamber are monitored by two attached thermocouples and the information was fed back to the control unit. Relative humidity between 0% and the 95%, and temperature between room temperature and 60 °C can be controlled. All parameters including those for XRD are programmable and the system runs automatically. The function of the system was checked by recording the XRD patterns of montmorillonite (a clay mineral) and NaCl under increasing and decreasing relative humidity.

scholarly journals Structural, magnetic and electrical properties of a new double-perovskite LaNaMnMoO 6 material

2017 ◽  
Vol 4 (11) ◽  
pp. 170920 ◽  
Author(s):  
Sameh Megdiche Borchani ◽  
Wissem Cheikh-Rouhou Koubaa ◽  
Makrem Megdiche
Keyword(s):  
Applied Field ◽  
Room Temperature ◽  
Double Perovskite ◽  
Entropy Change ◽  
Cooling Power ◽  
Room Temperature Resistivity ◽  
Ferromagnetic Transition ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Xrd Patterns

Structural, magnetic, magnetocaloric, electrical and magnetoresistance properties of an LaNaMnMoO 6 powder sample have been investigated by X-ray diffraction (XRD), magnetic and electrical measurements. Our sample has been synthesized using the ceramic method. Rietveld refinements of the XRD patterns show that our sample is single phase and it crystallizes in the orthorhombic structure with Pnma space group. Magnetization versus temperature in a magnetic applied field of 0.05 T shows that our sample exhibits a paramagnetic–ferromagnetic transition with decreasing temperature. The Curie temperature T C is found to be 320 K. Arrott plots show that all our double-perovskite oxides exhibit a second-order magnetic phase transition. From the measured magnetization data of an LaNaMnMoO 6 sample as a function of the magnetic applied field, the associated magnetic entropy change |−ΔSM| and the relative cooling power (RCP) have been determined. In the vicinity of T C , |−ΔSM| reached, in a magnetic applied field of 8 T, a maximum value of ∼4 J kg −1  K −1 . Our sample undergoes a large magnetocaloric effect at near-room temperature. Resistivity measurements reveal the presence of an insulating-metal transition at Tρ = 180 K. A magnetoresistance of 30% has been observed at room temperature for 6 T, significantly larger than that reported for the A 2 FeMoO 6 (A = Sr, Ba) double-perovskite system.

scholarly journals Substrate Rotation Chemical Bath Deposition of Cadmium Sulfide Buffer Layers for Thin Film Solar Cell Application

2013 ◽  
Vol 2013 ◽  
pp. 1-4 ◽  
Author(s):  
Kshitij Taneja ◽  
Alekhya Venkata Madiraju ◽  
Manoj Kumar ◽  
Raghunandan Seelaboyina ◽  
Anup Kumar Keshri ◽  
...  
Keyword(s):  
Cadmium Sulfide ◽  
Chemical Bath Deposition ◽  
Nir Spectroscopy ◽  
Buffer Layers ◽  
X Ray Diffraction ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Substrate Rotation ◽  
Atomic Force ◽  
20 Nm

A method for deposition of cadmium sulfide (CdS) buffer layer thin films on fluorine-doped tin oxide (FTO) glass, by chemical bath deposition (CBD), has been modified. For achieving relatively uniform and pin-hole-free CdS films, substrate rotation, concentration of CdS salts, and deposition time were optimized. The deposited films were characterized by UV-Vis-NIR spectroscopy, scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM). Band gap of ~2.4 eV was measured by UV-Vis-NIR spectroscopy, CdS phase was confirmed by XRD, and film uniformity and roughness (~15–20 nm) were measured by SEM and AFM, respectively.

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