Structural and Optical Characterization of ZnO Nanofilms Deposited by CBD-AμW

2015 ◽  
Vol 1766 ◽  
pp. 151-158 ◽  
Author(s):  
J. Díaz-Reyes ◽  
R. S. Castillo-Ojeda ◽  
J. E. Flores-Mena ◽  
J. Martínez-Juárez
Keyword(s):  
Room Temperature ◽  
Optical Characterization ◽  
Xrd Analysis ◽  
Photoluminescence Spectra ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Room Temperature Photoluminescence ◽  
Glass Substrates ◽  
Corning Glass

ABSTRACTZnO was grown by Chemical Bath Deposition technique activated by microwaves (CBD-AμW) on corning glass substrates. The ZnO structural and optical properties are studied as a function of the urea concentration in the growth solution. ZnO chemical stoichiometry was determined by Energy-dispersive X-ray spectroscopy (EDS). The XRD analysis and Raman scattering reveal that ZnO deposited thin films showed hexagonal polycrystalline phase wurtzite type. The Raman spectra present four main peaks associated to the modes E2high, (E2high-E2low), E2low and an unidentified vibrational band observed at 444, 338, 104 and 78 cm-1. The E2low mode involves mainly Zn atoms motion in the unit cell and the E2high mode is associated to oxygen motion. The observed emission peaks in the room temperature photoluminescence spectra are associated at vacancies of zinc and oxygen in the lattice.

Growth mechanism and characterization of ZnO nano-tubes synthesized using the hydrothermal-etching method

2009 ◽  
Vol 63 (6) ◽  
Author(s):  
Yan Li ◽  
Chuan-Sheng Liu ◽  
Yun-Ling Zou
Keyword(s):  
Room Temperature ◽  
Morphological Analysis ◽  
Diffraction Field ◽  
X Ray Diffraction ◽  
X Ray ◽  
Room Temperature Photoluminescence ◽  
Etching Method ◽  
Nano Rods ◽  
Two Stages

AbstractZnO nano-tubes (ZNTs) have been successfully synthesized via a simple hydrothermal-etching method, and characterized by X-ray diffraction, field emission scanning electron microscopy and room temperature photoluminescence measurement. The as-synthesized ZNTs have a diameter of 500 nm, wall thickness of 20–30 nm, and length of 5 µm. Intensity of the plane (0002) diffraction peak, compared with that of plane (10$$ \bar 1 $$0) of ZNTs, is obviously lower than that of ZnO nano-rods. This phenomenon can be caused by the smaller cross section of plane (0002) of the nano-tubes compared with that of other morphologies. On basis of the morphological analysis, the formation process of nano-tubes can be proposed in two stages: hydrothermal growth and reaction etching process.

In2O3 Thin Films Prepared on TiAlN Substrates Using a Triethylindium and Oxygen Mixture

2007 ◽  
Vol 124-126 ◽  
pp. 1597-1600
Author(s):  
Hyoun Woo Kim ◽  
Sun Keun Hwang ◽  
Won Seung Cho ◽  
Tae Gyung Ko ◽  
Seung Yong Choi ◽  
...  
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Room Temperature ◽  
Light Emission ◽  
Xrd Analysis ◽  
Oxygen Mixture ◽  
Photoluminescence Spectra ◽  
Sem Images ◽  
Room Temperature Photoluminescence ◽  
Visible Light Emission

This paper reports the fabrication of indium oxide (In2O3) films using a triethylindium and oxygen mixture. The deposition has been carried out on TiAlN substrates (200-350°C). We have established the correlation between the substrate temperature and the structural properties. The films deposited at 300-350°C were polycrystalline, whereas those deposited at 200°C was close to amorphous. XRD analysis and SEM images indicated that the films grown at 350°C had grained structures with the (222) preferred orientation. The room-temperature photoluminescence spectra of the In2O3 films exhibited a visible light emission.

Electrical Resistivity Improvement by Precipitation and Strain in Al-Cu Thin Films

2010 ◽  
Vol 305-306 ◽  
pp. 33-37 ◽  
Author(s):  
S. Lallouche ◽  
M.Y. Debili
Keyword(s):  
Thin Films ◽  
Copper Content ◽  
Room Temperature ◽  
Structural Features ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Transmission Electron ◽  
Hall Method

This work deals with Al-Cu thin films, deposited onto glass substrates by RF (13.56MHz) magnetron sputtering, and annealed at 773K. The film thickness was approximately the same 3-4µm. They are characterized with respect to microstructure, grain size, microstrain, dislocation density and resistivity versus copper content. Al (Cu) deposits containing 1.8, 7.21, 86.17 and 92.5at%Cu have been investigated. The use of X-ray diffraction analysis and transmission electron microscopy lead to the characterization of different structural features of films deposited at room temperature (< 400K) and after annealing (773K). The resistivity of the films was measured using the four-point probe method. The microstrain profile obtained from XRD thanks to the Williamson-Hall method shows an increase with increasing copper content.

Structural and Optical Properties of Thermally Evaporated CdTe Film

2013 ◽  
Vol 678 ◽  
pp. 131-135 ◽  
Author(s):  
D. Geethalakshmi ◽  
N. Muthukumarasamy ◽  
R. Balasundaraprabhu
Keyword(s):  
Optical Properties ◽  
Film Thickness ◽  
Room Temperature ◽  
Cdte Film ◽  
Annealing Duration ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Cooling Cycle ◽  
X Ray ◽  
Glass Substrates

Abstract. Cadmium Telluride (CdTe) films were thermally evaporated on to glass substrates at room temperature. By varying the amount of source material, thin films of thickness ranging from 90 nm – 635 nm have been prepared. Film of thickness 200 nm was annealed to 400°C for different durations of time and also subjected to alternate heating - cooling cycle. X-ray diffraction study was carried out to study the effect of film thickness, annealing duration and alternate heating-cooling cycle on the structural properties of the films. The transmittance spectra recorded using a UV-Vis-NIR spectrophotometer was used to study the change in optical properties of the films with respect to film thickness, annealing duration and alternate heating-cooling cycle.

Photoluminescence and Structural Characteristics of SnO2 Nanopetals Synthesized by Thermal Evaporation

2010 ◽  
Vol 152-153 ◽  
pp. 697-701
Author(s):  
Bing Wang ◽  
Ling Li
Keyword(s):  
Room Temperature ◽  
Thermal Evaporation ◽  
Structural Characteristics ◽  
The Self ◽  
Silicon Substrates ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Room Temperature Photoluminescence ◽  
Sno2 Nanostructure

A new nanostructure, (2D) nanopetal of SnO2, has been grown on single silicon substrates by Au-Ag alloying catalyst assisted carbothermal evaporation of SnO2. Field emission scanning electron microscopy (FESEM), x-ray diffraction (XRD) and Raman are employed to identify the morphology and structure of the synthesized productions. Room-temperature photoluminescence (PL) is used to characterize the luminescence of SnO2 nanostructure. Three new peaks at 356, 450 and 489 nm in the measured photoluminescence spectra are observed, implying that more luminescence centers exist in SnO2 nanopetals due to nanocrystals and defects. The growth of the SnO2 nanopetals is discussed on the basis of the self-catalyst mechanism.

Morphology-Controlled Synthesis of 1D ZnO Nanostructures by Hydrothermal Technique

2011 ◽  
Vol 266 ◽  
pp. 17-21
Author(s):  
Zhi Duan Cai ◽  
Lin Dong ◽  
Guo Xi Cao ◽  
Xing Yan Zhang ◽  
Shao Kang Guan
Keyword(s):  
Room Temperature ◽  
Controlled Synthesis ◽  
Curing Process ◽  
Zno Nanostructures ◽  
Curing Time ◽  
Photoluminescence Spectra ◽  
Structural And Optical Properties ◽  
Hydrothermal Technique ◽  
Room Temperature Photoluminescence

A two-step hydrothermal synthesis technique has been developed to obtained 1D ZnO nanostructures with adjustable aspect ratio and size distribution. The pre-curing process has important influence on the morphological, structural and optical properties. The LO phonons of the nanowires obtained by pre-curing for 24 h exhibit slight batho-shift in comparison with nanorods. The increase of the intensity ratio of ultraviolet to visible emissions in room-temperature photoluminescence spectra show the improvement in the quality of ZnO nanostructures as the pre-curing time prolonged. The fitting result of EX energy at T=0 is 3.382 and 3.370 eV for ZnO nanowires and nanorods, respectively.

Analysis of the Ash from One Shanghai Plant Using XRD (X-Ray Diffraction)

2013 ◽  
Vol 664 ◽  
pp. 232-235
Author(s):  
Guo Xian Ma ◽  
Hai Ying Zhang
Keyword(s):  
Fly Ash ◽  
Pollution Control ◽  
Room Temperature ◽  
Thermal Characterization ◽  
Xrd Analysis ◽  
Air Pollution Control ◽  
X Ray Diffraction ◽  
X Ray ◽  
Calcium Silicates

This study aims to develop a methodology for thermal characterization of APC (air pollution control)fly ash using XRD (X-ray diffraction). It performed XRD analysis as a function of temperature between room temperature and 1200 °C. It is found that major mineralogical components of fly ash involve SiO2, CaCl2, Ca3Si2O7, Ca2SiO4–0.35H2O, Ca9Si6O21–H2O, K2Al2Si2O8–3.8H2O and AlCl3–4Al(OH)3–4H2O. Glass phases account for around 57%, which is conducive to reduction of energy in recycling of the ash. Salts decompose firstly with increase of temperature and then oxides derived from the decomposition process react with SiO2, forming silicates, calcium-silicates and aluminosilicates.

Characterization of Nd:Y3Al5O12 Thin Films Prepared by Electron Beam Evaporation Deposition

2013 ◽  
Vol 320 ◽  
pp. 150-154
Author(s):  
Hao Ren ◽  
Qun Zeng ◽  
Xi Hui Liang
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Room Temperature ◽  
Electron Beam Evaporation ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Morphologies ◽  
Ingaas Detector

Nd:YAG thin films have been prepared on Si (100) substrates by electron beam evaporation deposition. The surface morphologies, crystalline phases and optical properties of the Nd:YAG thin films were characterized by x-ray diffraction, scanning electron microscopy, photoluminescence spectroscopy, and spectrophotometer. The crystallization of Nd:YAG thin films was improved after annealing at 1100 °C for 1 hour in vacuum. Excited by a Ti:sapphire laser at 808 nm, photoluminescence spectra of Nd:YAG thin films were measured at room temperature, and the transition of4F3/24I11/2of Nd3+in YAG in the region of 1064 nm were detected by a liquid nitrogen cooled InGaAs detector array.

Structural and Optical Properties of Mn-Doped ZnO Thin Films Prepared by SILAR Method

2017 ◽  
Vol 73 ◽  
pp. 22-30
Author(s):  
Marimuthu Karunakaran ◽  
S. Maheswari ◽  
Kasinathan Kasirajan ◽  
Sivaji Dinesh Raj ◽  
Rathinam Chandramohan
Keyword(s):  
Thin Films ◽  
Xrd Analysis ◽  
Layer Growth ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Silar Method ◽  
X Ray ◽  
Glass Substrates ◽  
Mn Doped

The growth of highly textured Mn doped Zinc oxide (ZnO) thin films with a preferred (002) orientation has been reported by employing successive ionic layer growth by adsorption reaction (SILAR) using a sodium zincate bath on glass substrates has been reported. The prepared films were characterized by X-ray diffraction (XRD), optical spectroscopy and scanning electron microscopy (SEM) measurement. The XRD analysis reveals that the films were polycrystalline. Morphology of the films was found to be uniform with smaller grains and exhibits a structure with porous. The calculated Band gap value was found to be 3.21 eV prepared at 15 mM MnSO4 concentration.

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