scholarly journals The Effect of Thickness on Some Optical Properties of Sb2S3 Thin Films Prepared by Chemical Bath Deposition

2010 ◽  
Vol 7 (1) ◽  
pp. 168-173
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Chemical Bath Deposition ◽  
Wavelength Range ◽  
Imaginary Part ◽  
Extinction Coefficient ◽  
Dielectric Constant Increase

Sb2S3 thin films have been prepared by chemical bath deposition on a glas sub Absorbance and transmittance spectra were recorded in the wavelength range (30-900) nm. The effects of thickness on absorption coefficient, reflectance, refractive index, extinction coefficient, real and imaginary parts of dielectric constant were estimated. It was found that the reflectivity, absorption coefficient , extinction coefficient, real part of dielectric constant and refractive index, all these parameters decrease as the thickness increased, while the imaginary part of the dielectric constant increase as the thickness increased.

scholarly journals Preparation and Studying the Optical Properties of (Sb2o3) Thin Films

2018 ◽  
Vol 26 (10) ◽  
pp. 249-256
Author(s):  
Waleed Khalid Kadhim
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Thermal Evaporation ◽  
Glass Slide ◽  
Antimony Trioxide ◽  
Hot Plate ◽  
Different Thickness

In this paper I present the preparation of (Sb2o3) thin films using thermal evaporation in vacuum, procedure with different thickness  (100 ,150 ,200 ,and 250) nm, by using ( hot plate) from Molybdenum matter at temperature in ( 9000c) and the period of time (15mint) ,the prepared in a manner thermal evaporation in a vacuum and precipitated on glass bases, pure Antimony Trioxide (sb2o3 ) thin films with various condition have been successfully deposited by (T.E.V) on glass slide substrates. The substrates temperature of about 100oC and the vacuum of about 10-6 torr, to investigated oxidation of evaporated, measure spectra for prepared films in arrange of wavelength (250 – 1100 nm). The following optical properties have been calculated: the absorption coefficient, the forbidden (Eg) for direct and indirect transitions "absorbance, refractive index,  extinction coefficient, real and imaginary parts" of the dielectric constant.

scholarly journals Annealing Effect on Some Optical Properties of Cr2O3 Thin Films Prepared by Spray Pyrolysis Technique

2011 ◽  
Vol 8 (2) ◽  
pp. 561-565
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Spray Pyrolysis ◽  
Annealing Temperature ◽  
Spray Pyrolysis Technique ◽  
Annealing Effect ◽  
Before And After

Cr2O3 thin films have been prepared by spray pyrolysis on a glass substrate. Absorbance and transmittance spectra were recorded in the wavelength range (300-900) nm before and after annealing. The effects of annealing temperature on absorption coefficient, refractive index, extinction coefficient, real and imaginary parts of dielectric constant and optical conductivity were expected. It was found that all these parameters increase as the annealing temperature increased to 550°C.

scholarly journals Effects of Non-Thermal Argon Plasma Produced at Atmospheric Pressure on the Optical Properties of CdO Thin Films

2018 ◽  
Vol 15 (2) ◽  
pp. 221-226
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Extinction Coefficient ◽  
Energy Gap ◽  
Cadmium Oxide ◽  
Argon Plasma ◽  
Chemical Spray Pyrolysis ◽  
Cdo Thin Films

In this paper the effect of nonthermal atmospheric argon plasma on the optical properties of the cadmium oxide CdO thin films prepared by chemical spray pyrolysis was studied. The prepared films were exposed to different time intervals (0, 5, 10, 15, 20) min. For every sample, the transmittance, Absorbance, absorption coefficient, energy gap, extinction coefficient and dielectric constant were studied. It is found that the transmittance and the energy gap increased with exposure time, and absorption. Absorption coefficient, extinction coefficient, dielectric constant decreased with time of exposure to the argon plasma

scholarly journals Effect of Manganese Contain on the Optical Properties of CuO Thin Films

2016 ◽  
Vol 65 ◽  
pp. 37-42
Author(s):  
Wasmaa Abdulsattar Jabbar
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Copper Oxide ◽  
Extinction Coefficient ◽  
Energy Gap ◽  
Chemical Spray Pyrolysis ◽  
Chemical Spray ◽  
Uv Visible

Copper oxide prepared with various contains of Manganese by chemical spray pyrolysis. Some optical properties are studied from recording the absorption spectra via UV-Visible spectrophotometer in the range of 460-900 nm. The absorbance increased with increasing Mn-contain in the CuO thin films, and the absorption coefficient. Extinction coefficient and refractive index are decreased with increasing Mn-contain in the CuO thin films, also the energy gap shifted from 2 eV to 1.91 eV after 4%Mn additive.

Study the Effect of Heat Treatment and Pressure on some the Optical Properties of the Pure PVA Nano Polymer

2021 ◽  
Vol 900 ◽  
pp. 16-25
Author(s):  
Tabarak Mohammed Awad ◽  
May A.S. Mohammed
Keyword(s):  
Heat Treatment ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Polyvinyl Alcohol ◽  
Complex Dielectric Constant ◽  
Different Temperatures ◽  
German Origin ◽  
Increasing Temperature

In this study, some optical properties were studied of the pure vinyl polyvinyl alcohol (PVA) nanopolymer (German origin). Under the influence of different temperatures and pressures of PVA. Where 25 samples were prepared for the purpose of conducting the research. Which studied the study of these samples was done by recording the absorbance and transmittance spectra of the wavelengths (200-900) nm. From them, absorbance, transmittance, reflectivity, absorption coefficient, refractive index, extinction coefficient, complex dielectric constant were calculated. At different temperatures (25,40, 80, 120, 160)°C. And with different pressures within the range (7.5,8,8.5,9,9.5) MPa. The results are that the permeability of the polymer (PVA) at different temperatures for each pressure decreases with increasing temperature, and that all other calculated optical properties increase with increasing temperature.

scholarly journals Deposition Time induced Structural and Optical Properties of Lead Tin Sulphide Thin Films

2021 ◽  
pp. 455-458
Author(s):  
J. Damisa ◽  
J. O. Emegha ◽  
I. L. Ikhioya
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Tin Oxide ◽  
Deposition Time ◽  
Deposition Process ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Prepared Material

Lead tin sulphide (Pb-Sn-S) thin films (TFs) were deposited on fluorine-doped tin oxide (FTO) substrates via the electrochemical deposition process using lead (II) nitrate [Pb(NO3)2], tin (II) chloride dehydrate [SnCl2.2H2O] and thiacetamide [C2H5NS] precursors as sources of lead (Pb), tin (Sn) and sulphur (S). The solution of all the compounds was harmonized with a stirrer (magnetic) at 300k. In this study, we reported on the improvements in the properties (structural and optical) of Pb-Sn-S TFs by varying the deposition time. We observed from X-ray diffractometer (XRD) that the prepared material is polycrystalline in nature. UV-Vis measurements were done for the optical characterizations and the band gap values were seen to be increasing from 1.52 to 1.54 eV with deposition time. In addition to this, the absorption coefficient and refractive index were also estimated and discussed.

Optical Nonlinearity of Sputtered Co3O4-SiO2-TiO2 Thin Films

2001 ◽  
Vol 703 ◽  
Author(s):  
Hiroki Yamamoto ◽  
Takashi Naito ◽  
Kazuyuki Hirao
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Excited State ◽  
Absorption Coefficient ◽  
Extinction Coefficient ◽  
Ground State ◽  
Optical Nonlinearity ◽  
Tio2 Thin Films ◽  
Change Mechanism ◽  
Band Filling

ABSTRACTOptical non-linearity of cobalt oxide with SiO2-TiO2 additives was investigated, and the change mechanism of the refractive index (n) and extinction coefficient (k), based on the relation between band structure and optical non-linearity of the thin films, was discussed. Refractive index and extinction coefficient of Co3O4 thin films in the ground state were 3.17 and 0.42, respectively. Both n and k decreased by irradiation from a pulse laser with 650 nm of wavelength (1.91eV). These values in the excited state were 2.91 and 0.41, respectively. n2 estimated from the change of n and k was −2.8 ×10−11 m2/W. The film had a band gap corresponding to 2.06eV, indicating that it was widened by the band filling effect during the laser irradiation at 1.91eV, and this led to the decrease in absorption coefficient and refractive index.

scholarly journals Effect of gamma irradiation on structural, morphological and optical properties of p-quaterphenyl thin films

2018 ◽  
Vol 14 (2) ◽  
pp. 5624-5637
Author(s):  
A.A. Attia ◽  
M.M. Saadeldin ◽  
K. Sawaby
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Surface Morphology ◽  
Absorption Coefficient ◽  
Gamma Irradiation ◽  
Band Gap ◽  
Optical Band Gap ◽  
Thermal Evaporation Method ◽  
Single Oscillator Model

Para-quaterphenyl thin films were deposited onto glass and quartz substrates by thermal evaporation method. p-quaterphenyl thin films wereexposed to gamma radiation of Cobat-60 radioactive source at room temperature with a dose of 50 kGy to study the effect of ?-irradiation onthe structure and the surface morphology as well as the optical properties of the prepared films. The crystalline structure and the surface morphology of the as-deposited and ?-irradiated films were examined using the X-ray diffraction and the field emission scanning electron microscope. The optical constants (n & k) of the as-deposited and ?-irradiated films were obtained using the transmittance and reflectance measurements, in the wavelength range starting from 250 up to 2500 nm. The analysis of the absorption coefficient data revealed an allowed direct transition with optical band gap of 2.2 eV for the as-deposited films, which decreased to 2.06 eV after exposing film to gamma irradiation. It was observed that the Urbach energy values change inversely with the values of the optical band gap. The dispersion of the refractive index was interpreted using the single oscillator model. The nonlinear absorption coefficient spectra for the as-deposited and ?-irradiated p-quaterphenyl thin films were obtained using the linear refractive index.

scholarly journals Polystyrene Microsphere Optical Properties by Kubelka–Munk and Diffusion Approximation with a Single Integrating Sphere System: A Comparative Study

2019 ◽  
Vol 2019 ◽  
pp. 1-8 ◽  
Author(s):  
Ali Shahin ◽  
Wesam Bachir ◽  
Moustafa Sayem El-Daher
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Absorption Coefficient ◽  
Wavelength Range ◽  
Diffusion Approximation ◽  
Analytical Methods ◽  
Diffusion Theory ◽  
Integrating Sphere ◽  
Absorption Property ◽  
Relative Errors

The optical properties of 1 μm polystyrene in the wavelength range of 500–750 nm were estimated by using a white light spectrophotometric transmittance spectroscopy and a single integrating sphere system. To retrieve the optical characteristics, two analytical methods, namely, diffusion approximation and Kubelka–Munk were used, and then their results were compared with Mie theory calculations. The correspondence of the Kubelka–Munk scattering coefficient with Mie was obvious, and relative errors varied between 6.73% and 2.66% whereas errors varied between 6.87% and 3.62% for diffusion theory. Both analytical methods demonstrated the absorption property of polystyrene over the abovementioned wavelength range. Although absorption coefficient turned out to be much lower than scattering, constructing a realistic optical phantom requires taking into account absorption property of polystyrene. Complex refractive index of polystyrene based on these two methods was determined. Inverse Mie algorithm with scattering coefficient was also used to retrieve the real part of refractive index and absorption coefficient for calculating the imaginary part of refractive index. The relative errors of the real part did not exceed 2.6%, and the imaginary part was in consistence with the prior works. Finally, the presented results confirm the validity of diffusion theory with a single integrating sphere system.

EFFECT OF DEPOSITION TEMPERATURE ON THE PROPERTIES OF TIO2 THIN FILMS DEPOSITED BY MOCVD

2016 ◽  
Vol 23 (02) ◽  
pp. 1650001 ◽  
Author(s):  
ZAKI S. KHALIFA
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Optical Properties ◽  
Deposition Temperature ◽  
Energy Gap ◽  
Organic Chemical ◽  
Tio2 Thin Films ◽  
Optical Energy Gap

Crystal structure, microstructure, and optical properties of TiO2 thin films deposited on quartz substrates by metal-organic chemical vapor deposition (MOCVD) in the temperature range from 250[Formula: see text]C to 450[Formula: see text]C have been studied. The crystal structure, thickness, microstructure, and optical properties have been carried out using X-ray diffraction (XRD), field emission scanning electron microscope (FESEM), atomic force microscope (AFM), and UV-visible transmittance spectroscopy, respectively. XRD patterns show that the obtained films are pure anatase. Simultaneously, the crystal size calculated using XRD peaks, and the grain size measured by AFM decrease with the increase in deposition temperature. Moreover, the texture of the films change and roughness decrease with the increase in deposition temperature. The spectrophotometric transmittance spectra have been used to calculate the refractive index, extinction coefficient, dielectric constant, optical energy gap, and porosity of the deposited films. While the refractive index and dielectric constant decrease with the increase of deposition temperature, the porosity shows the opposite.

Sign in / Sign up

Export Citation Format

Share Document