scholarly journals Optical characterization of thin Al2O3 layers deposited by magnetron sputtering technique at industrial conditions for applications in glazing

2020 ◽  
Vol 38 (1) ◽  
pp. 108-115
Author(s):  
Piotr Dywel ◽  
Łukasz Skowroński
Keyword(s):  
Magnetron Sputtering ◽  
Optical Constants ◽  
Specific Growth ◽  
Gas Injection ◽  
Growth Conditions ◽  
Light Transmittance ◽  
Force Microscopy ◽  
Alumina Films ◽  
Atomic Force

AbstractIn this study, thin Al2O3 films (11 nm – 82 nm) were deposited by means of a recently developed pulse gas injection magnetron sputtering method and investigated by means of atomic force microscopy, spectroscopic ellipsometry and spectrophotometry. Quite low values of optical constants (1.581 to 1.648 at λ = 550 nm) of the alumina films are directly associated with specific growth conditions (pulse injection of the reactive or reactive + inert gas) in the pulse gas injection magnetron sputtering process. The light transmittance of Al2O3/glass systems (86 % to 90 %) is only a few percent lower than that calculated for glass (93 %).

Characterization of epitaxial CVD graphene on Ir(111)/α-Al2O3(0001) by photoelectron momentum microscopy

2022 ◽  
Author(s):  
Eri Hashimoto ◽  
Keigo Tamura ◽  
Hayato Yamaguchi ◽  
Takeshi Watanabe ◽  
Fumihiko Matsui ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Growth Conditions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cvd Growth ◽  
Grown Graphene ◽  
Α Al2o3 ◽  
The Relationship ◽  
X Ray Absorption

Abstract We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/α-Al2O3(0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray absorption spectroscopy, is a complementary characterization tool to conventional methods, such as Raman spectroscopy and atomic force microscopy, for comprehensive and quantitative characterization of graphene/Ir(111). Using PMM, we characterized the properties of CVD-grown graphene including the single-crystallinity, number of layers, crystal orientation, and degree of interaction between graphene and Ir(111) and clarified the relationship between these properties and the CVD growth conditions.

InN Nanostructures: Strain and Morphology

2003 ◽  
Vol 798 ◽  
Author(s):  
Francois Demangeot ◽  
Jean Frandon ◽  
Claire Pinquier ◽  
Michel Caumont ◽  
Olivier Briot ◽  
...  
Keyword(s):  
Specific Growth ◽  
Careful Analysis ◽  
Growth Conditions ◽  
Force Microscopy ◽  
Organic Vapor ◽  
Atomic Force ◽  
Metal Organic ◽  
Raman Study ◽  
Gan Buffer Layer ◽  
Key Parameter

ABSTRACTWe presented an experimental work on InN nanostructures grown on a GaN buffer layer deposited on sapphire (0001) by Metal Organic Vapor Phase Epitaxy. InN islands of controlled sizes were fabricated by using specific growth conditions and taking advantage of self-organization that results from Stranski-Krastanov growth mode. Then nanometric islands as small as 25 nm were characterized by using atomic force microscopy (AFM) and micro-Raman spectroscopy. AFM measurements revealed that the current shape of islands correspond to truncated hexagons. In-plane residual strain field was deduced from the E2 phonon frequency shift in micro-Raman spectra recorded on islands of various sizes. Careful analysis of these data made clear that the key parameter in determining the strain magnitude was the height of the islands: this was not surprising, keeping in mind that the shape was roughly independent of the size. Nevertheless, the dislocation density was believed to increase as function of the island thickness, leading to various degrees of strained relaxation, as probed by the present micro-Raman study. This conclusion was reinforced by the strain variation on the facets of single islands with respect to its value at the centre.

scholarly journals Morphological features in aluminum nitride epilayers prepared by magnetron sputtering

2015 ◽  
Vol 33 (1) ◽  
pp. 175-184 ◽  
Author(s):  
Sebastian Stach ◽  
Dinara Dallaeva ◽  
Ştefan Ţălu ◽  
Pavel Kaspar ◽  
Pavel Tománek ◽  
...  
Keyword(s):  
Aluminum Nitride ◽  
Magnetron Sputtering ◽  
Surface Topography ◽  
Surface Characteristics ◽  
Growth Conditions ◽  
Effect Of Temperature ◽  
Statistical Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
Interfacial Separation

AbstractThe aim of this study is to characterize the surface topography of aluminum nitride (AlN) epilayers prepared by magnetron sputtering using the surface statistical parameters, according to ISO 25178-2:2012. To understand the effect of temperature on the epilayer structure, the surface topography was investigated through atomic force microscopy (AFM). AFM data and analysis of surface statistical parameters indicated the dependence of morphology of the epilayers on their growth conditions. The surface statistical parameters provide important information about surface texture and are useful for manufacturers in developing AlN thin films with improved surface characteristics. These results are also important for understanding the nanoscale phenomena at the contacts between rough surfaces, such as the area of contact, the interfacial separation, and the adhesive and frictional properties.

Optical Constants of Al-Doped Er2O3 Films Prepared by Radio Frequency Reactive Magnetron Sputtering

2010 ◽  
Vol 663-665 ◽  
pp. 361-364
Author(s):  
Yan Yan Zhu ◽  
Ze Bo Fang
Keyword(s):  
Atomic Force Microscopy ◽  
Refractive Index ◽  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Optical Constants ◽  
Reactive Magnetron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Al doped Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron technique. X-ray diffraction and atomic force microscopy show the Al doped Er2O3 films obtained are amorphous and uniform. The optical constants are studied which shows a proper value of refractive index and a lower reflectivity, indicating it could be a usefully material for solar cells.

Rapid, Refined, and Robust Method for Expression, Purification, and Characterization of Recombinant Human Amyloid-beta M1-42

2019 ◽  
Author(s):  
Priya Prakash ◽  
Travis Lantz ◽  
Krupal P. Jethava ◽  
Gaurav Chopra
Keyword(s):  
Amyloid Beta ◽  
Western Blots ◽  
Force Microscopy ◽  
E Coli ◽  
Atomic Force ◽  
Set Up ◽  
Short Time

Amyloid plaques found in the brains of Alzheimer’s disease (AD) patients primarily consists of amyloid beta 1-42 (Ab42). Commercially, Ab42 is synthetized using peptide synthesizers. We describe a robust methodology for expression of recombinant human Ab(M1-42) in Rosetta(DE3)pLysS and BL21(DE3)pLysS competent E. coli with refined and rapid analytical purification techniques. The peptide is isolated and purified from the transformed cells using an optimized set-up for reverse-phase HPLC protocol, using commonly available C18 columns, yielding high amounts of peptide (~15-20 mg per 1 L culture) in a short time. The recombinant Ab(M1-42) forms characteristic aggregates similar to synthetic Ab42 aggregates as verified by western blots and atomic force microscopy to warrant future biological use. Our rapid, refined, and robust technique to purify human Ab(M1-42) can be used to synthesize chemical probes for several downstream in vitro and in vivo assays to facilitate AD research.

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

scholarly journals A Universal Model for the Log-Normal Distribution of Elasticity in Polymeric Gels and Its Relevance to Mechanical Signature of Biological Tissues

Biology ◽  
2021 ◽  
Vol 10 (1) ◽  
pp. 64
Author(s):  
Arnaud Millet
Keyword(s):  
Elastic Modulus ◽  
Normal Distribution ◽  
Biological Tissues ◽  
Force Microscopy ◽  
Polymeric Gels ◽  
Atomic Force ◽  
Clear Explanation ◽  
Log Normal ◽  
Log Normal Distribution

The mechanosensitivity of cells has recently been identified as a process that could greatly influence a cell’s fate. To understand the interaction between cells and their surrounding extracellular matrix, the characterization of the mechanical properties of natural polymeric gels is needed. Atomic force microscopy (AFM) is one of the leading tools used to characterize mechanically biological tissues. It appears that the elasticity (elastic modulus) values obtained by AFM presents a log-normal distribution. Despite its ubiquity, the log-normal distribution concerning the elastic modulus of biological tissues does not have a clear explanation. In this paper, we propose a physical mechanism based on the weak universality of critical exponents in the percolation process leading to gelation. Following this, we discuss the relevance of this model for mechanical signatures of biological tissues.

In Situ Characterization of the Mechanical Behavior of Gecko's Spatulae by Atomic Force Microscopy

2013 ◽  
Vol 22 ◽  
pp. 85-93
Author(s):  
Shuang Yi Liu ◽  
Min Min Tang ◽  
Ai Kah Soh ◽  
Liang Hong
Keyword(s):  
Mechanical Behavior ◽  
Hierarchical Level ◽  
Intrinsic Properties ◽  
In Situ Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Theoretical Predictions ◽  
Multi Mode

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.

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