scholarly journals Machine Learning-Based Multidomain Processing for Texture-Based Image Segmentation and Analysis

Author(s):  
Nikolay Borodinov ◽  
Wan-Yu Tsai ◽  
Vladimir V. Korolkov ◽  
Nina Balke ◽  
Sergei Kalinin ◽  
...  

<a>Atomic and molecular resolved atomic force microscopy (AFM) images </a>offer unique insights into materials properties such as local ordering, molecular orientation and topological defects, which can be used to pinpoint physical and chemical interactions occurring at the surface. Utilizing machine learning for extracting underlying physical parameters increases the throughput of AFM data processing and eliminates inconsistencies intrinsic to manual image analysis thus enabling the creation of reliable frameworks for qualitative and quantitative evaluation of experimental data. Here, we present a robust and scalable approach to the segmentation of AFM images based on flexible pre-selected classification criteria. Usage of supervised learning and feature extraction allows to retain the consideration of specific problem-dependent features (such as types of periodical structure observed in the images and the associated numerical parameters: spacing, orientation, etc.). We highlight the applicability of this approach for segmentation of molecular resolved AFM images based on crystal orientation of observed domains, automated selection of boundaries and collection of relevant statistics. Overall, we outline a general strategy for machine learning-enabled analysis of nanoscale systems exhibiting periodic order that could be applied to any analytical imaging technique.

2020 ◽  
Author(s):  
Nikolay Borodinov ◽  
Wan-Yu Tsai ◽  
Vladimir V. Korolkov ◽  
Nina Balke ◽  
Sergei Kalinin ◽  
...  

<a>Atomic and molecular resolved atomic force microscopy (AFM) images </a>offer unique insights into materials properties such as local ordering, molecular orientation and topological defects, which can be used to pinpoint physical and chemical interactions occurring at the surface. Utilizing machine learning for extracting underlying physical parameters increases the throughput of AFM data processing and eliminates inconsistencies intrinsic to manual image analysis thus enabling the creation of reliable frameworks for qualitative and quantitative evaluation of experimental data. Here, we present a robust and scalable approach to the segmentation of AFM images based on flexible pre-selected classification criteria. Usage of supervised learning and feature extraction allows to retain the consideration of specific problem-dependent features (such as types of periodical structure observed in the images and the associated numerical parameters: spacing, orientation, etc.). We highlight the applicability of this approach for segmentation of molecular resolved AFM images based on crystal orientation of observed domains, automated selection of boundaries and collection of relevant statistics. Overall, we outline a general strategy for machine learning-enabled analysis of nanoscale systems exhibiting periodic order that could be applied to any analytical imaging technique.


2012 ◽  
Vol 76 (1) ◽  
pp. 227-253 ◽  
Author(s):  
E. Ruiz -Agudo ◽  
C. V. Putnis

AbstractAtomic force microscopy (AFM) enables in situ observations of mineral fluid reactions to be made at a nanoscale. During the past 20 years, the direct observation of mineral surfaces at molecular resolution during dissolution and growth has made significant contributions toward improvements in our understanding of the dynamics of mineral fluid reactions at the atomic scale. Observations and kinetic measurements of dissolution and growth from AFM experiments give valuable evidence for crystal dissolution and growth mechanisms, either confirming existing models or revealing their limitations. Modifications to theories can be made in the light of experimental evidence generated by AFM. Significant changes in the kinetics and mechanisms of crystallization and dissolution processes occur when the chemical and physical parameters of solutions, including the presence of impurity molecules or background electrolytes, are altered. Calcite has received considerable attention in AFM studies due to its central role in geochemical and biomineralization processes. This review summarizes the extensive literature on the dissolution and growth of calcite that has been generated by AFM studies, including the influence of fluid characteristics such as supersaturation, solution stoichiometry, pH, temperature and the presence of impurities.


2015 ◽  
Vol 60 (3) ◽  
pp. 2173-2182 ◽  
Author(s):  
J. Kusiński ◽  
A. Kopia ◽  
Ł. Cieniek ◽  
S. Kąc ◽  
A. Radziszewska

Abstract In this work the pulsed laser deposition (PLD) and the pulsed electron beam deposition (PED) techniques were used for fabrication of Mo-Bi2O3, La1−xSrxCoO3, La1−xCaxCoO3 and Al-Mg thin films. An influence of ablation process basic parameters on the coatings structure and properties was discussed. Two types of laser ablation systems were applied: one equipped with a KrF excimer and second with a Q-switched Nd:YAG. Films were deposited on Si and MgO substrates. Scanning (SEM) and transmission (TEM) electron microscopy, atomic force microscopy (AFM) as well as X-ray diffraction (XRD) were used for structural analysis. Investigations focused on structure and chemical composition showed that smooth and dense thin films with nanocrystalline structure, preserving the composition of the bulk target, could be obtained by the both PLD and PED techniques. Research study showed that by a proper selection of PLD and PED process parameters it was possible to deposit films with significantly decreased amount and size of undesirably nanoparticulates.


2021 ◽  
Author(s):  
Berkin Uluutku ◽  
Enrique A López-Guerra ◽  
Santiago D Solares

Viscoelastic characterization of materials at the micro- and nanoscales is commonly performed with the aid of force-distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the observed material behavior to specific viscoelastic models, such as generalized viscoelastic models or power-law rheology models, among others.  Here we propose a new method to invert and obtain the viscoelastic properties of a material through the use of the Z-transform, without using a model.  We present the rheological viscoelastic relations in their classical derivation and their Z-domain correspondence.  We illustrate the proposed technique on a model experiment involving a traditional ramp-shaped force-distance AFM curve, demonstrating good agreement between the viscoelastic characteristics extracted from the simulated experiment and the theoretical expectations. We also provide a path for calculating standard viscoelastic responses from the extracted material characteristics.  The new technique based on the Z-transform is complementary to previous model-based viscoelastic analyses and can be advantageous with respect to Fourier techniques due to its generality.  Additionally, it can handle the unbounded inputs traditionally used to acquire force-distance relationships in AFM, such as “ramp” functions, in which the cantilever position is displaced linearly with time for a finite period of time.


2021 ◽  
Vol 134 (14) ◽  

ABSTRACT First Person is a series of interviews with the first authors of a selection of papers published in Journal of Cell Science, helping early-career researchers promote themselves alongside their papers. Shigetaka Nishiguchi is first author on ‘ Structural variability and dynamics in the ectodomain of an ancestral-type classical cadherin revealed by AFM imaging’, published in JCS. Shigetaka conducted the research described in this article while an assistant manager at Olympus Corporation and a graduate student in Hiroki Oda's lab at the JT Biohistory Research Hall and Osaka University, Osaka, Japan. He is now a postdoc in the lab of Takayuki Uchihashi at the Exploratory Research Center on Life and Living Systems, National Institutes of Natural Sciences, Okazaki, Japan, investigating cadherin using atomic force microscopy.


2000 ◽  
Vol 6 (S2) ◽  
pp. 992-993
Author(s):  
Russell J. Composto ◽  
Paul Ducheyne ◽  
Elsie Effah Kaufman

Microscopy and microanalysis techniques have played an important role in our understanding of how biomaterials interact with their environment. In first part of this study, we will focus on the behavior of bioactive glass, whereas in the second a model surface will be investigated. Upon implantation bioactive glass undergoes a series of reactions that leads to the formation of a calcium phosphate-rich layer. Most in vitro studies of the changes that occur on the surface of bioactive glass have employed the use of buffer solutions with compositions reflecting the ionic composition of interstitial fluid. Although these studies have documented the physical and chemical changes associated with bioactive glass immersed in aqueous media, they do not reveal the effect of serum proteins and cells which are present at the implantation site. In the present study, we document, using atomic force microscopy (AFM) and Rutherford backscattering spectrometry (RBS), significant differences in reaction layer composition, thickness, morphology and kinetics of formation arising from the presence of serum proteins.


2019 ◽  
Vol 2019 ◽  
pp. 1-16 ◽  
Author(s):  
Joanna Rydz ◽  
Alena Šišková ◽  
Anita Andicsová Eckstein

Microscopic techniques are often used in material science, enabling the assessment of the morphology, composition, physical properties, and dynamic behaviour of materials. The review focuses on the topographic and dynamical surface studies of (bio)degradable polymers, in particular aliphatic polyesters, the most promising ones. The (bio)degradation process promotes physical and chemical changes in material properties that can be characterised by microscopic techniques. These changes occurring both under controlled conditions as well as in the processing stage or during use indicate morphological and structural transformations resulting from the deterioration of the material and have a significant impact on the characteristic of materials used in many applications, for example, for use as packaging.


2020 ◽  
Vol 6 (37) ◽  
pp. eabb7986
Author(s):  
N. Kawakami ◽  
K. Iwata ◽  
A. Shiotari ◽  
Y. Sugimoto

Understanding the precise atomic structure of ice surfaces is critical for revealing the mechanisms of physical and chemical phenomena at the surfaces, such as ice growth, melting, and chemical reactions. Nevertheless, no conclusive structure has been established. In this study, noncontact atomic force microscopy was used to address the characterization of the atomic structures of ice Ih(0001) and Ic(111) surfaces. The topmost hydrogen atoms are arranged with a short-range (2 × 2) order, independent of the ice thickness and growth substrates used. The electrostatic repulsion between non–hydrogen-bonded water molecules at the surface causes a reduction in the number of the topmost hydrogen atoms together with a distortion of the ideal honeycomb arrangement of water molecules, leading to a short-range–ordered surface reconstruction.


1992 ◽  
Vol 259 ◽  
Author(s):  
C J Sofield ◽  
M P Murrell ◽  
S Sugden ◽  
M Heyns ◽  
S Verhaverbeke ◽  
...  

ABSTRACTWe have investigated the effect on a silicon surface of both wet chemical and cluster-tool UV/ozone cleaning, prior to UHV processing to fabricate MOS test structures. The physical and chemical condition of the Si surface has been examined by Scanning Tunnelling and Atomic Force Microscopy (STM, AFM) and Medium Energy Ion Scattering (MEIS). After MOS fabrication some of the structures were examined by Cross-sectional Transmission Electron Microscopy (TEM). The electrical performance of the MOS test sets were characterized by breakdown voltage measurements.We have found correlations between the electrical performance of the MOS devices, the structure of the Si surface prior to oxidation, and the details of the UHV fabrication technique. In particular any MOS device fabricated on a Si surface thermally cleaned in UHV prior to oxidation has a poor breakdown strength. We have found that this is the result of the formation of silicon carbide on the Si surface at high temperature and the subsequent local disruption of the oxidation step of MOS fabrication by the SiC. A UHV cleaning procedure has been developed to avoid this C contamination problem.


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