On the refinement of boundary conditions for the beam model of the cantilever of the atomic force microscope and their influence on the interpretation of the measurement results

2008 ◽  
Vol 43 (3) ◽  
pp. 470-476 ◽  
Author(s):  
K. B. Ustinov
Keyword(s):  
Boundary Conditions ◽  
Atomic Force Microscope ◽  
Beam Model ◽  
Atomic Force ◽  
Measurement Results

Period-Doubling Bifurcations in Atomic Force Microscopy

2009 ◽  
Author(s):  
Andrew J. Dick ◽  
Wei Huang
Keyword(s):  
Dynamic Response ◽  
Atomic Force Microscope ◽  
Period Doubling ◽  
Surface Force ◽  
Resonance Excitation ◽  
Force Model ◽  
Beam Model ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

The dynamic response of an atomic force microscope cantilever probe is studied for off-resonance excitation and interactions with a soft silicone rubber material. The dynamic response of the probe is simulated using a three-mode approximation of the Euler-Bernoulli beam model for excitation at two-and-a-half times the probe’s fundamental frequency. These simulations are conducted in order to reproduce the period-doubling bifurcation experimentally observed in the response of the probe of a commercial atomic force microscope. In order to duplicate this behavior, parameters within the surface force model are tuned to account for variations in the characteristics of the sample material. Through this work, the relationship between the sample material’s effective stiffness and the response behavior of the probe are studied in an effort to develop the means to identify the local material properties of a sample by characterize the nonlinear response of the probe.

Dynamic analysis of AFM by applying Timoshenko beam theory in tapping mode and considering the impact of interaction forces in a liquid environment

2014 ◽  
Vol 92 (6) ◽  
pp. 472-483 ◽  
Author(s):  
M. Damircheli ◽  
M.H. Korayem
Keyword(s):  
Dynamic Response ◽  
Atomic Force Microscope ◽  
Timoshenko Beam ◽  
Ambient Air ◽  
Beam Model ◽  
Timoshenko Beam Model ◽  
Interaction Forces ◽  
Liquid Environment ◽  
Atomic Force ◽  
Simulation Results

In an atomic force microscope (AFM), the cantilever vibrates by excitation at a frequency near the fundamental frequency, and the changes in vibration parameters, which result from the nonlinear forces of interaction between sample and cantilever tip, can be used as a tool to reveal the properties of the sample. To properly describe the images acquired by the AFM and to approximate the properties of the investigated sample, it is essential to use analytical and numerical models that can accurately simulate the dynamics of the cantilever and sample. For short beams, the Timoshenko model seems to be very accurate. Considering the fact that short beams (cantilevers) have many applications including the imaging of biological samples in liquid environments, the use of this theory seems to be necessary. In this paper, by employing the Timoshenko beam model, the effect of rotational inertia and shear deformation has been taken into consideration. The interaction forces between sample and cantilever in liquid, ambient air, and vacuum environments are quite different in terms of magnitude and formulation, and they play a significant role in the system’s dynamic response. These forces include hydrodynamic forces, electrostatic double layer force, etc. Using an accurate model for the interaction forces will improve the simulation results significantly. In this paper, the frequency response of the atomic force microscope has been investigated by applying the Timoshenko beam model and considering the forces of interaction between sample and tip in the air and liquid environments. The results indicate that the resonant frequency changes and cantilever vibration amplitude diminishes in a liquid environment compared to the air environment. The simulation results have good agreement with the experimental ones. The frequency responses for the attractive and repulsive regions in the two environments are compared and it is demonstrated that the dynamic response is highly dependent on the hydrodynamic and interaction forces in the liquid medium.

scholarly journals An Investigation of the Adsorption of Xanthate on Bornite in Aqueous Solutions using an Atomic Force Microscope

Minerals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 906
Author(s):  
Jinhong Zhang
Keyword(s):  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Force Measurement ◽  
Attenuated Total Reflection ◽  
Solution Ph ◽  
Substrate Adhesion ◽  
Atomic Force ◽  
Measurement Results ◽  
Industry Practice

An atomic force microscope (AFM) was applied to study of the adsorption of xanthate on bornite surfaces in situ in aqueous solutions. AFM images showed that xanthate, i.e., potassium ethyl xanthate (KEX) and potassium amyl xanthate (PAX), adsorbed strongly on bornite, and the adsorbate bound strongly with the mineral surface without being removed by flushing with ethanol alcohol. The AFM images also showed that the adsorption increased with the increased collector concentration and contact time. Xanthate adsorbed on bornite in a similar manner when the solution pH changed to pH 10. The AFM force measurement results showed that the probe–substrate adhesion increased due to the adsorption of xanthate on bornite. The sharp “jump-in” and “jump-off” points on force curve suggest that the adsorbate is not “soft” in nature, ruling out the existence of dixanthogen, an oily substance. Finally, the ATR-FTIR (attenuated total reflection-Fourier-transform infrared) result confirms that the adsorbate on bornite in xanthate solutions is mainly in the form of insoluble cuprous xanthate (CuX) instead of dixanthogen. This xanthate/bornite adsorption mechanism is very similar to what is obtained with the xanthate/chalcocite system, while it is different from the xanthate/chalcopyrite system, for which oily dixanthogen is the main adsorption product on the chalcopyrite surface. The present study helps clarify the flotation mechanism of bornite in industry practice using xanthate as a collector.

Buckling Instability of Carbon Nanotube Atomic Force Microscope Probe Clamped in an Elastic Medium

2012 ◽  
Vol 3 (2) ◽  
Author(s):  
Jin-Xing Shi ◽  
Toshiaki Natsuki ◽  
Xiao-Wen Lei ◽  
Qing-Qing Ni
Keyword(s):  
Atomic Force Microscope ◽  
Elastic Medium ◽  
Small Diameter ◽  
Beam Model ◽  
Buckling Mode ◽  
Buckling Instability ◽  
Atomic Force ◽  
Buckling Stability ◽  
Afm Probe ◽  
The Stability

Carbon nanotubes (CNTs) can be used as atomic force microscope (AFM) probes due to their robust mechanical properties, high aspect ratio and small diameter. In this study, a model of CNTs clamped in an elastic medium is proposed as CNT AFM probes. The buckling instability of the CNT probe clamped in elastic medium is analyzed based on the nonlocal Euler–Bernoulli beam model and the Whitney–Riley model. The clamped length of CNTs, and the stiffness of elastic medium affect largely on the stability of CNT AFM probe, especially at high buckling mode. The result shows that the buckling stability of the CNT AFM probe can be largely enhanced by increasing the stiffness of elastic medium. Moreover, the nonlocal effects of buckling instability are investigated and found to be lager for high buckling mode. The theoretical investigation on the buckling stability would give a useful reference for designing CNT as AFM probes.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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