scholarly journals Optimal Attitude Maneuvering Analyses for Imaging at Squint Staring and Sliding Spotlight Modes of SAR Satellite

Aerospace ◽  
2021 ◽  
Vol 8 (10) ◽  
pp. 277
Author(s):  
Hongrae Kim ◽  
Joonil Park ◽  
Young-Keun Chang ◽  
Soo-Ho Lee
Keyword(s):  
High Resolution ◽  
Incidence Angle ◽  
Phase 1 ◽  
Ground Surface ◽  
Synthetic Aperture ◽  
Multiple Target ◽  
Populated Area ◽  
Single Pass ◽  
Optimal Analysis ◽  
High Resolution Images

In this study, we analyzed the imaging maneuver time, retargeting maneuver time, and attitude maneuvering characteristics in the imaging section (Phase 1) and retargeting maneuver section (Phase 2) when taking multiple-target images in squint spotlight mode in a single pass of a passive SAR satellite. In particular, the synthetic aperture time and attitude maneuvering characteristics in the staring and sliding spotlight modes that can image the wider swath width while maintaining high resolution were compared and analyzed. In the sliding spotlight mode, the rotation center was located below the ground surface when the satellite was maneuvering towards the target. Steering and sliding maneuvers were performed when targeting, and the synthetic aperture time of the sliding spotlight was longer than that of the staring spotlight because overlapping imaging was performed on the point target. The satellite maneuvering during imaging can be considered as a time-fixed problem, because it was performed within synthetic aperture time according to resolution, incidence angle, swath width, etc., by minimizing the Doppler centroid variation. In order to optimize the retargeting maneuver time, an optimal analysis of the attitude maneuvering was carried out and the validity of the optimal analysis algorithm was confirmed. Finally, the scenario was analyzed by assuming a problem of imaging four targets with 5 × 5 km swath width in a 20 km × 20 km densely populated area. It was confirmed that if a squint angle of ±12 degrees is provided in a single pass, four high resolution images of 5 km × 5 km can be imaged in the sliding spotlight mode.

Principle and practice of high-resolution imaging with a field-emission TEM

1992 ◽  
Vol 50 (1) ◽  
pp. 138-139
Author(s):  
Max T. Otten ◽  
Wim M.J. Coene
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Incidence Angle ◽  
Temporal Coherence ◽  
Energy Spread ◽  
High Resolution Imaging ◽  
Major Improvement ◽  
High Resolution Images ◽  
Resolution Imaging

High-resolution imaging with a LaB6 instrument is limited by the spatial and temporal coherence, with little contrast remaining beyond the point resolution. A Field Emission Gun (FEG) reduces the incidence angle by a factor 5 to 10 and the energy spread by 2 to 3. Since the incidence angle is the dominant limitation for LaB6 the FEG provides a major improvement in contrast transfer, reducing the information limit to roughly one half of the point resolution. The strong improvement, predicted from high-resolution theory, can be seen readily in diffractograms (Fig. 1) and high-resolution images (Fig. 2). Even if the information in the image is limited deliberately to the point resolution by using an objective aperture, the improved contrast transfer close to the point resolution (Fig. 1) is already worthwhile.

scholarly journals Study of Digital Elevation Model (DEM) Extraction using Stereo Radargrammetry TerraSAR-X in Madiun Area – Elevation Accuracy Improvement

2019 ◽  
Vol 94 ◽  
pp. 04003 ◽  
Author(s):  
Inggit L. Sari ◽  
Rachmat Maulana ◽  
Haris S. Dyatmika ◽  
Agus Suprijanto ◽  
Rahmat Arief ◽  
...  
Keyword(s):  
High Resolution ◽  
Digital Elevation Model ◽  
Field Observation ◽  
Incidence Angle ◽  
Accuracy Assessment ◽  
Surface Elevation ◽  
Accuracy Improvement ◽  
Digital Elevation ◽  
High Resolution Images ◽  
Elevation Model

High resolution images data from Terrasar-X are used to extract digital elevation model (DEM) using stereo radargrammetry in the attempt to achieve better resolution of terrain surface in Indonesia. As sample in this study, stereo pairs images from TerraSAR-X StripMap mode (~3m resolution) on Madiun city is used with difference of incidence angle around ~18.88 degree to extract the elevation of the area. Furthermore, field observation on the selected area will be used on elevation accuracy assessment. The digital surface elevation (DSM) generated by stereo radargrammetry in this study shows us high resolution with spatial pixel spacing 5.57 meter and elevation accuracy around ~4 meter.

scholarly journals Image Enhancement by Histogram Specification Using Multiple Target Images

2011 ◽  
pp. 29-37
Author(s):  
Pavithra P ◽  
Ramyashree N ◽  
Shruthi T.V ◽  
Dr. Jharna Majumdar
Keyword(s):  
High Resolution ◽  
Image Enhancement ◽  
Input Image ◽  
Multiple Target ◽  
Target Image ◽  
Image Histogram ◽  
Histogram Specification ◽  
High Resolution Images

Shape and characteristics of the histogram plays a major role in finding the quality of an image. Histogram Specification is an image enhancement technique, where the histogram of the input image is transformed to a pre-specified histogram derived from a high resolution image, called target image. In this paper, the classical histogram specification technique is extended by using a target image which is obtained by fusing multiple high resolution images. A set of Quality Metrics were identified to assess the quality of the output enhanced image. The paper addresses the following issues: a) Effect of varying the number of target images on the quality of the output enhanced image b) Role of using different methods of fusion on the quality of the output enhanced image c) Category of the target image on the quality of the output enhanced image. If the input image is from a forest, whether in order to obtain an enhanced image, all target images has to be selected from the forest category d) Effect of preprocessing of target image on the quality of the output enhanced image.

FeXIV Line Emission Polarization of the July 11, 1991 Solar Corona

1994 ◽  
Vol 144 ◽  
pp. 541-547
Author(s):  
J. Sýkora ◽  
J. Rybák ◽  
P. Ambrož
Keyword(s):  
High Resolution ◽  
Solar Corona ◽  
Emission Line ◽  
Solar Eclipse ◽  
White Light ◽  
Preliminary Analysis ◽  
Line Emission ◽  
Total Solar Eclipse ◽  
Degree Of Polarization ◽  
High Resolution Images

AbstractHigh resolution images, obtained during July 11, 1991 total solar eclipse, allowed us to estimate the degree of solar corona polarization in the light of FeXIV 530.3 nm emission line and in the white light, as well. Very preliminary analysis reveals remarkable differences in the degree of polarization for both sets of data, particularly as for level of polarization and its distribution around the Sun’s limb.

Remarks on the application of backscattered electron imaging (BEI) to the scanning electron microscopy (SEM) of biological structures

1983 ◽  
Vol 41 ◽  
pp. 484-487
Author(s):  
Etienne de Harven
Keyword(s):  
High Resolution ◽  
Incident Beam ◽  
Spot Size ◽  
Primary Electron ◽  
Critical Point Drying ◽  
Cell Shapes ◽  
High Resolution Images ◽  
Backscattered Electron ◽  
Electron Imaging ◽  
Scanning Electron

Biological ultrastructures have been extensively studied with the scanning electron microscope (SEM) for the past 12 years mainly because this instrument offers accurate and reproducible high resolution images of cell shapes, provided the cells are dried in ways which will spare them the damage which would be caused by air drying. This can be achieved by several techniques among which the critical point drying technique of T. Anderson has been, by far, the most reproducibly successful. Many biologists, however, have been interpreting SEM micrographs in terms of an exclusive secondary electron imaging (SEI) process in which the resolution is primarily limited by the spot size of the primary incident beam. in fact, this is not the case since it appears that high resolution, even on uncoated samples, is probably compromised by the emission of secondary electrons of much more complex origin.When an incident primary electron beam interacts with the surface of most biological samples, a large percentage of the electrons penetrate below the surface of the exposed cells.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

Effect of strain on ADF-STEM high-resolution images

1991 ◽  
Vol 49 ◽  
pp. 666-667
Author(s):  
M. Kelly ◽  
D.M. Bird
Keyword(s):  
High Resolution ◽  
Strong Influence ◽  
Intensity Variation ◽  
Dark Field ◽  
Atomic Resolution ◽  
Strain Fields ◽  
High Resolution Image ◽  
Annular Dark Field ◽  
High Resolution Images ◽  
Interesting Alternative

It is well known that strain fields can have a strong influence on the details of HREM images. This, for example, can cause problems in the analysis of edge-on interfaces between lattice mismatched materials. An interesting alternative to conventional HREM imaging has recently been advanced by Pennycook and co-workers where the intensity variation in the annular dark field (ADF) detector is monitored as a STEM probe is scanned across the specimen. It is believed that the observed atomic-resolution contrast is correlated with the intensity of the STEM probe at the atomic sites and the way in which this varies as the probe moves from cell to cell. As well as providing a directly interpretable high-resolution image, there are reasons for believing that ADF-STEM images may be less suseptible to strain than conventional HREM. This is because HREM images arise from the interference of several diffracted beams, each of which is governed by all the excited Bloch waves in the crystal.

Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

1991 ◽  
Vol 49 ◽  
pp. 540-541
Author(s):  
Kenneth H. Downing ◽  
Hu Meisheng ◽  
Hans-Rudolf Went ◽  
Michael A. O'Keefe
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
High Resolution Electron Microscopy ◽  
Atomic Resolution ◽  
Dimensional Structure ◽  
Structure Information ◽  
Resolution Electron ◽  
Scattering Effects ◽  
High Resolution Images ◽  
Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

Computer processing of high-resolution images of periodic specimens

1986 ◽  
Vol 44 ◽  
pp. 2-5
Author(s):  
W. Chiu ◽  
M.F. Schmid ◽  
T.-W. Jeng
Keyword(s):  
High Resolution ◽  
Fourier Transforms ◽  
Complex Structure ◽  
Distribution Functions ◽  
Multiple Image ◽  
Cryo Electron Microscopy ◽  
Structure Factors ◽  
Unit Cells ◽  
High Resolution Images ◽  
Phase Probability Distribution

Cryo-electron microscopy has been developed to the point where one can image thin protein crystals to 3.5 Å resolution. In our study of the crotoxin complex crystal, we can confirm this structural resolution from optical diffractograms of the low dose images. To retrieve high resolution phases from images, we have to include as many unit cells as possible in order to detect the weak signals in the Fourier transforms of the image. Hayward and Stroud proposed to superimpose multiple image areas by combining phase probability distribution functions for each reflection. The reliability of their phase determination was evaluated in terms of a crystallographic “figure of merit”. Grant and co-workers used a different procedure to enhance the signals from multiple image areas by vector summation of the complex structure factors in reciprocal space.

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